{"id":"https://openalex.org/W4416750110","doi":"https://doi.org/10.1109/tce.2025.3637896","title":"Background-Adaptive Neural Networks for Surface Mount Device Defect Segmentation by Comparing With Positive Samples","display_name":"Background-Adaptive Neural Networks for Surface Mount Device Defect Segmentation by Comparing With Positive Samples","publication_year":2025,"publication_date":"2025-11-27","ids":{"openalex":"https://openalex.org/W4416750110","doi":"https://doi.org/10.1109/tce.2025.3637896"},"language":null,"primary_location":{"id":"doi:10.1109/tce.2025.3637896","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2025.3637896","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060454852","display_name":"Tongzhi Niu","orcid":"https://orcid.org/0000-0003-3921-5853"},"institutions":[{"id":"https://openalex.org/I4210121405","display_name":"Centre for Artificial Intelligence and Robotics","ror":"https://ror.org/01xnbq218","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1340206300","https://openalex.org/I4210121405","https://openalex.org/I4210150591"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Tongzhi Niu","raw_affiliation_strings":["School of Artificial Intelligence and Robotics, Hunan University, Changsha, China"],"affiliations":[{"raw_affiliation_string":"School of Artificial Intelligence and Robotics, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I4210121405"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100425556","display_name":"Biao Chen","orcid":"https://orcid.org/0000-0002-3794-4203"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Biao Chen","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078265544","display_name":"Y. H. Fan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210121405","display_name":"Centre for Artificial Intelligence and Robotics","ror":"https://ror.org/01xnbq218","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1340206300","https://openalex.org/I4210121405","https://openalex.org/I4210150591"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Yexin Fan","raw_affiliation_strings":["School of Artificial Intelligence and Robotics, Hunan University, Changsha, China"],"affiliations":[{"raw_affiliation_string":"School of Artificial Intelligence and Robotics, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I4210121405"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100723843","display_name":"Kai Li","orcid":"https://orcid.org/0000-0002-1290-1450"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Li","raw_affiliation_strings":["College of Mechanical and Electrical Engineering, Central South University, Changsha, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Central South University, Changsha, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078007640","display_name":"Fuqiang Zhong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210121405","display_name":"Centre for Artificial Intelligence and Robotics","ror":"https://ror.org/01xnbq218","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1340206300","https://openalex.org/I4210121405","https://openalex.org/I4210150591"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Fuqiang Zhong","raw_affiliation_strings":["School of Artificial Intelligence and Robotics, Hunan University, Changsha, China"],"affiliations":[{"raw_affiliation_string":"School of Artificial Intelligence and Robotics, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I4210121405"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100365136","display_name":"Bin Li","orcid":"https://orcid.org/0000-0002-0197-3248"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Li","raw_affiliation_strings":["School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100323420","display_name":"Hui Zhang","orcid":"https://orcid.org/0000-0002-1803-3148"},"institutions":[{"id":"https://openalex.org/I4210121405","display_name":"Centre for Artificial Intelligence and Robotics","ror":"https://ror.org/01xnbq218","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1340206300","https://openalex.org/I4210121405","https://openalex.org/I4210150591"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Hui Zhang","raw_affiliation_strings":["School of Artificial Intelligence and Robotics, Hunan University, Changsha, China"],"affiliations":[{"raw_affiliation_string":"School of Artificial Intelligence and Robotics, Hunan University, Changsha, China","institution_ids":["https://openalex.org/I4210121405"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5060454852"],"corresponding_institution_ids":["https://openalex.org/I4210121405"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.49230523,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"72","issue":"1","first_page":"825","last_page":"837"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.7721999883651733,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.7721999883651733,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.12049999833106995,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.0066999997943639755,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7386000156402588},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6327999830245972},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.628000020980835},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5898000001907349},{"id":"https://openalex.org/keywords/affine-transformation","display_name":"Affine transformation","score":0.5802000164985657},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.5034000277519226},{"id":"https://openalex.org/keywords/surface-mount-technology","display_name":"Surface-mount technology","score":0.4745999872684479},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4693000018596649},{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.41499999165534973}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7487999796867371},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7386000156402588},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6327999830245972},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.628000020980835},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5898000001907349},{"id":"https://openalex.org/C92757383","wikidata":"https://www.wikidata.org/wiki/Q382497","display_name":"Affine transformation","level":2,"score":0.5802000164985657},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5534999966621399},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5063999891281128},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.5034000277519226},{"id":"https://openalex.org/C2776584680","wikidata":"https://www.wikidata.org/wiki/Q191042","display_name":"Surface-mount technology","level":3,"score":0.4745999872684479},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4693000018596649},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.41499999165534973},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.39410001039505005},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.3783999979496002},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.3659000098705292},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.33570000529289246},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.32899999618530273},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.3151000142097473},{"id":"https://openalex.org/C63099799","wikidata":"https://www.wikidata.org/wiki/Q17147001","display_name":"Image texture","level":4,"score":0.3068000078201294},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.3059999942779541},{"id":"https://openalex.org/C65885262","wikidata":"https://www.wikidata.org/wiki/Q7429708","display_name":"Scale-space segmentation","level":4,"score":0.26820001006126404},{"id":"https://openalex.org/C3018391215","wikidata":"https://www.wikidata.org/wiki/Q2449377","display_name":"Flat surface","level":2,"score":0.2676999866962433},{"id":"https://openalex.org/C2781020372","wikidata":"https://www.wikidata.org/wiki/Q533093","display_name":"On the fly","level":2,"score":0.26600000262260437},{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.26190000772476196},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.25209999084472656}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tce.2025.3637896","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2025.3637896","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1901129140","https://openalex.org/W1903029394","https://openalex.org/W2752782242","https://openalex.org/W2787091153","https://openalex.org/W2799166040","https://openalex.org/W2898910301","https://openalex.org/W2948982773","https://openalex.org/W2955058313","https://openalex.org/W2962793481","https://openalex.org/W2963091558","https://openalex.org/W2963351448","https://openalex.org/W2963881378","https://openalex.org/W2980148955","https://openalex.org/W2994615081","https://openalex.org/W2998115938","https://openalex.org/W3040304705","https://openalex.org/W3108566774","https://openalex.org/W3129082918","https://openalex.org/W3138516171","https://openalex.org/W3164289800","https://openalex.org/W4214719356","https://openalex.org/W4313270795","https://openalex.org/W4313413180","https://openalex.org/W4321232185","https://openalex.org/W4381853870","https://openalex.org/W4388726292","https://openalex.org/W4392904763","https://openalex.org/W4393241388","https://openalex.org/W4407129098"],"related_works":[],"abstract_inverted_index":{"Surface":[0,4],"defect":[1,110],"detection":[2,46,111],"in":[3,18,29],"Mount":[5],"Device":[6],"(SMD)":[7],"manufacturing":[8],"is":[9],"challenged":[10],"by":[11,16,48],"frequent":[12],"distribution":[13],"shifts":[14],"caused":[15],"variations":[17],"component":[19],"placement\u2014such":[20],"as":[21,26],"translation":[22],"and":[23,55,74,105,114],"rotation\u2014as":[24],"well":[25],"batch-specific":[27],"differences":[28],"bonding":[30],"wire":[31],"configurations.":[32],"To":[33],"address":[34],"these":[35],"issues,":[36],"we":[37],"propose":[38],"a":[39,60,75],"Background-Adaptive":[40],"Neural":[41],"Network":[42],"(BANet)":[43],"that":[44,94],"enhances":[45],"robustness":[47],"learning":[49],"comparative":[50],"representations":[51],"between":[52],"test":[53],"samples":[54],"positive":[56],"references.":[57],"BANet":[58,95],"incorporates":[59],"Foreground":[61],"Attention":[62],"Mechanism":[63],"(FAM)":[64],"to":[65,80],"suppress":[66],"texture":[67],"variation":[68],"noise":[69],"through":[70],"improved":[71],"foreground-background":[72],"discrimination,":[73],"Spatial":[76],"Transformer":[77],"Module":[78],"(STM)":[79],"correct":[81],"geometric":[82],"distortions":[83],"via":[84],"affine":[85],"transformations.":[86],"Extensive":[87],"experiments":[88],"on":[89],"three":[90],"benchmark":[91],"datasets":[92],"demonstrate":[93],"consistently":[96],"outperforms":[97],"state-of-the-art":[98],"methods,":[99],"confirming":[100],"its":[101],"strong":[102],"generalization":[103],"ability":[104],"practical":[106],"potential":[107],"for":[108],"robust":[109],"under":[112],"diverse":[113],"variable":[115],"production":[116],"scenarios.":[117]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-11-28T00:00:00"}