{"id":"https://openalex.org/W4414693298","doi":"https://doi.org/10.1109/tce.2025.3616604","title":"A X-Ray Based Dual-Expert Detection Method for Automatic Welding Defect Inspection","display_name":"A X-Ray Based Dual-Expert Detection Method for Automatic Welding Defect Inspection","publication_year":2025,"publication_date":"2025-10-01","ids":{"openalex":"https://openalex.org/W4414693298","doi":"https://doi.org/10.1109/tce.2025.3616604"},"language":"en","primary_location":{"id":"doi:10.1109/tce.2025.3616604","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2025.3616604","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078286347","display_name":"Fengyuan Zuo","orcid":"https://orcid.org/0000-0001-9642-5705"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Fengyuan Zuo","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0001-9642-5705","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100729536","display_name":"Jinhai Liu","orcid":"https://orcid.org/0000-0002-1256-1337"},"institutions":[{"id":"https://openalex.org/I4391767858","display_name":"State Key Laboratory of Synthetical Automation for Process Industries","ror":"https://ror.org/0380ng272","country_code":null,"type":"facility","lineage":["https://openalex.org/I4391767858","https://openalex.org/I9224756"]},{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinhai Liu","raw_affiliation_strings":["State Key Laboratory of Synthetical Automation for Process Industries and the College of Information Science and Engineering, Northeastern University, Shenyang, China","College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0002-1256-1337","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Synthetical Automation for Process Industries and the College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756","https://openalex.org/I4391767858"]},{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001899987","display_name":"Weiyan Yu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wenshuo Yu","raw_affiliation_strings":["Shenyang Paidelin Technology Company Ltd., Shenyang, China","Shenyang Paidelin Technology Company Ltd, Shenyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shenyang Paidelin Technology Company Ltd., Shenyang, China","institution_ids":[]},{"raw_affiliation_string":"Shenyang Paidelin Technology Company Ltd, Shenyang, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076959560","display_name":"Yifu Ren","orcid":"https://orcid.org/0000-0003-3748-8356"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yifu Ren","raw_affiliation_strings":["Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-3748-8356","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037757404","display_name":"Lei Wang","orcid":"https://orcid.org/0000-0001-9809-3791"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Wang","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0000-0001-9809-3791","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061331693","display_name":"Zhen Zhao","orcid":"https://orcid.org/0009-0001-1103-8341"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Zhao","raw_affiliation_strings":["College of Information Science and Engineering, Northeastern University, Shenyang, China"],"raw_orcid":"https://orcid.org/0009-0001-1103-8341","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5078286347"],"corresponding_institution_ids":["https://openalex.org/I9224756"],"apc_list":null,"apc_paid":null,"fwci":0.6342,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.70644271,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"71","issue":"4","first_page":"9427","last_page":"9438"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9868000149726868,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9659000039100647,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/welding","display_name":"Welding","score":0.7621999979019165},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5527999997138977},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5310999751091003},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5097000002861023},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.4519999921321869},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.438400000333786},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.4113999903202057},{"id":"https://openalex.org/keywords/sensor-fusion","display_name":"Sensor fusion","score":0.38659998774528503},{"id":"https://openalex.org/keywords/expert-system","display_name":"Expert system","score":0.38029998540878296}],"concepts":[{"id":"https://openalex.org/C19474535","wikidata":"https://www.wikidata.org/wiki/Q131172","display_name":"Welding","level":2,"score":0.7621999979019165},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5527999997138977},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5310999751091003},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5097000002861023},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.490200012922287},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.4519999921321869},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.438400000333786},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.4113999903202057},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.38659998774528503},{"id":"https://openalex.org/C58328972","wikidata":"https://www.wikidata.org/wiki/Q184609","display_name":"Expert system","level":2,"score":0.38029998540878296},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37310001254081726},{"id":"https://openalex.org/C118198166","wikidata":"https://www.wikidata.org/wiki/Q2327264","display_name":"Robot welding","level":3,"score":0.37220001220703125},{"id":"https://openalex.org/C90509273","wikidata":"https://www.wikidata.org/wiki/Q11012","display_name":"Robot","level":2,"score":0.36390000581741333},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3337000012397766},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.3122999966144562},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3118000030517578},{"id":"https://openalex.org/C114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","level":2,"score":0.3005000054836273},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.2992999851703644},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.29829999804496765},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.29440000653266907},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.2833999991416931},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.2816999852657318},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2806999981403351},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.2630999982357025},{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.25600001215934753},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.25540000200271606},{"id":"https://openalex.org/C19351080","wikidata":"https://www.wikidata.org/wiki/Q1395034","display_name":"New product development","level":2,"score":0.25099998712539673},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.25040000677108765}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tce.2025.3616604","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2025.3616604","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1642527379","display_name":null,"funder_award_id":"62373085","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2587347264","display_name":null,"funder_award_id":"U21A20481","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4909744686","display_name":null,"funder_award_id":"(U21A20481, 62373085, 61973071)","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W3025156940","https://openalex.org/W3183129439","https://openalex.org/W3196806685","https://openalex.org/W4205151370","https://openalex.org/W4205446205","https://openalex.org/W4281249799","https://openalex.org/W4304693993","https://openalex.org/W4307935528","https://openalex.org/W4313007055","https://openalex.org/W4317438419","https://openalex.org/W4318832642","https://openalex.org/W4322706654","https://openalex.org/W4367663277","https://openalex.org/W4379106369","https://openalex.org/W4385626811","https://openalex.org/W4386076325","https://openalex.org/W4386906254","https://openalex.org/W4387092712","https://openalex.org/W4388469725","https://openalex.org/W4388739186","https://openalex.org/W4390120011","https://openalex.org/W4391907178","https://openalex.org/W4392450469","https://openalex.org/W4392826952","https://openalex.org/W4392930638","https://openalex.org/W4394789223","https://openalex.org/W4399527494","https://openalex.org/W4399602185","https://openalex.org/W4400188138","https://openalex.org/W4406267296","https://openalex.org/W4407129098","https://openalex.org/W4408441831","https://openalex.org/W4408520895","https://openalex.org/W4409796429","https://openalex.org/W4413120604"],"related_works":[],"abstract_inverted_index":{"Automatic":[0],"welding":[1,26,44,68,93,158],"technology":[2],"has":[3,108],"been":[4,109],"widely":[5],"applied":[6,161],"in":[7,32,43,52,85,154,189],"the":[8,20,37,73,86,149,186,200,210],"field":[9],"of":[10,25,157,170,188],"industrial":[11,213],"production.":[12],"In":[13,148,175],"promoting":[14],"high-quality":[15],"intelligent":[16],"manufacturing":[17],"processes":[18],"for":[19,40,66,162,212],"consumer":[21,190],"market,":[22],"precise":[23],"detection":[24,64,114],"defects":[27,159],"is":[28,82,137,160],"a":[29,62,90,129,151],"key":[30],"link":[31],"enhancing":[33],"product":[34,205],"reliability.":[35],"Considering":[36],"high":[38],"demand":[39],"domain":[41],"knowledge":[42],"defect":[45,69,94,192],"inspection":[46,95],"tasks,":[47],"existing":[48],"methods":[49],"have":[50],"shortcomings":[51],"fine-grained":[53],"recognition.":[54],"To":[55],"overcome":[56],"these":[57],"weaknesses,":[58],"this":[59],"article":[60],"proposes":[61],"dual-expert":[63,130],"method":[65,80,202],"automatic":[67],"inspection,":[70],"inspired":[71],"by":[72],"human":[74],"multi-expert":[75],"complementary":[76,119],"evaluation":[77],"process.":[78],"The":[79],"process":[81],"mainly":[83],"reflected":[84],"following":[87],"aspects.":[88],"Firstly,":[89],"high-precision":[91],"robot":[92],"system":[96],"that":[97,199],"integrates":[98],"application":[99,187,196],"platform":[100],"based":[101,133],"data":[102],"collection,":[103],"model":[104],"training,":[105],"and":[106,144,164,167,185,215],"deployment":[107],"effectively":[110,208],"implemented.":[111],"Then,":[112],"diverse":[113,155],"experts":[115],"are":[116,173],"constructed":[117],"using":[118],"regression":[120],"paradigms":[121],"to":[122,139,218],"obtain":[123,145],"predictions":[124],"from":[125],"multiple":[126,168],"perspectives.":[127],"Finally,":[128],"fusion":[131],"scheme":[132],"on":[134],"probabilistic":[135],"ensembling":[136],"designed":[138],"fully":[140],"integrate":[141],"prediction":[142],"information":[143],"refined":[146,171],"results.":[147],"experiment,":[150],"database":[152],"rich":[153],"types":[156],"training":[163],"systematic":[165],"testing,":[166],"sets":[169],"indicators":[172],"evaluated.":[174],"addition,":[176],"we":[177],"also":[178],"discussed":[179],"edge":[180],"deployment,":[181],"failure":[182],"case":[183],"analysis,":[184],"PCB":[191],"detection.":[193],"These":[194],"practical":[195],"results":[197],"indicate":[198],"proposed":[201],"can":[203],"achieve":[204],"level":[206],"implementation,":[207],"reducing":[209],"threshold":[211],"testing":[214],"enabling":[216],"end-users":[217],"gain":[219],"benefits.":[220]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}