{"id":"https://openalex.org/W4407247452","doi":"https://doi.org/10.1109/tce.2025.3539675","title":"Series Arc Fault Detection by Modeling and Integral Regulated Residual Analysis","display_name":"Series Arc Fault Detection by Modeling and Integral Regulated Residual Analysis","publication_year":2025,"publication_date":"2025-02-01","ids":{"openalex":"https://openalex.org/W4407247452","doi":"https://doi.org/10.1109/tce.2025.3539675"},"language":"en","primary_location":{"id":"doi:10.1109/tce.2025.3539675","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2025.3539675","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073731245","display_name":"Wenchao Miao","orcid":"https://orcid.org/0000-0002-7775-8309"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wenchao Miao","raw_affiliation_strings":["School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064433886","display_name":"Fengyun Zhi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210118977","display_name":"Shanghai Tunnel Engineering Rail Transit Design & Research Institute","ror":"https://ror.org/02zznv955","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210118977"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fengyun Zhi","raw_affiliation_strings":["Human Resources Department, Shanghai Power Transmission and Transformation Engineering Company, Shanghai, China","Shanghai Power Transmission and Transformation Engineering Co, China"],"affiliations":[{"raw_affiliation_string":"Human Resources Department, Shanghai Power Transmission and Transformation Engineering Company, Shanghai, China","institution_ids":["https://openalex.org/I4210118977"]},{"raw_affiliation_string":"Shanghai Power Transmission and Transformation Engineering Co, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"Qiqi Chen","orcid":"https://orcid.org/0009-0000-5307-8176"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiqi Chen","raw_affiliation_strings":["School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048824107","display_name":"Tianling Shi","orcid":"https://orcid.org/0000-0002-6211-7429"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianling Shi","raw_affiliation_strings":["School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100455721","display_name":"Fei Wang","orcid":"https://orcid.org/0000-0001-6567-0265"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fei Wang","raw_affiliation_strings":["School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5073731245"],"corresponding_institution_ids":["https://openalex.org/I113940042"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.02498763,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"71","issue":"1","first_page":"1125","last_page":"1135"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9855999946594238,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9855999946594238,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9829000234603882,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9725000262260437,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.6807360053062439},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.5605176687240601},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4878726005554199},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4347425103187561},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3556920886039734},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3019030690193176},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2546606659889221},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.25350385904312134},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.11332988739013672}],"concepts":[{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.6807360053062439},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.5605176687240601},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4878726005554199},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4347425103187561},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3556920886039734},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3019030690193176},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2546606659889221},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.25350385904312134},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.11332988739013672},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tce.2025.3539675","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2025.3539675","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-149625","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-149625","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.6899999976158142}],"awards":[{"id":"https://openalex.org/G2759902729","display_name":null,"funder_award_id":"51977126","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G946673714","display_name":null,"funder_award_id":"51977126","funder_id":"https://openalex.org/F4320309612","funder_display_name":"Natural Science Foundation of Shanghai"}],"funders":[{"id":"https://openalex.org/F4320309612","display_name":"Natural Science Foundation of Shanghai","ror":null},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W2039629833","https://openalex.org/W2082553827","https://openalex.org/W2296747478","https://openalex.org/W2471618076","https://openalex.org/W2617063127","https://openalex.org/W2805756546","https://openalex.org/W2808036458","https://openalex.org/W2914798213","https://openalex.org/W2926172260","https://openalex.org/W2941763154","https://openalex.org/W2971829218","https://openalex.org/W2998636431","https://openalex.org/W3003864893","https://openalex.org/W3011148068","https://openalex.org/W3015771859","https://openalex.org/W3016688120","https://openalex.org/W3109321937","https://openalex.org/W3144184193","https://openalex.org/W3190171433","https://openalex.org/W3204138030","https://openalex.org/W3211371333","https://openalex.org/W3211808354","https://openalex.org/W3215533741","https://openalex.org/W4226068325","https://openalex.org/W4226394996","https://openalex.org/W4226462879","https://openalex.org/W4256324951","https://openalex.org/W4285049345","https://openalex.org/W4285124902","https://openalex.org/W4285198919","https://openalex.org/W4293145945","https://openalex.org/W4313061062","https://openalex.org/W4320001260","https://openalex.org/W4380882112","https://openalex.org/W4387146009","https://openalex.org/W4387241087"],"related_works":["https://openalex.org/W2560215812","https://openalex.org/W2949601986","https://openalex.org/W2788972299","https://openalex.org/W2521347458","https://openalex.org/W2498789492","https://openalex.org/W2729981612","https://openalex.org/W4385301753","https://openalex.org/W3186428265","https://openalex.org/W2171501125","https://openalex.org/W2617234683"],"abstract_inverted_index":{"With":[0],"the":[1,28,33,58,77,83,87,94,101,115,119,124,132,148,151,155,161,172,187,210],"rapid":[2],"development":[3],"of":[4,32,57,86,103,131,150,180,183,204,212],"renewable":[5],"energy,":[6],"photovoltaic":[7],"systems,":[8,11],"energy":[9],"storage":[10],"and":[12,25,30,40,66,79,97,123,163,171,192,217],"DC":[13,49,59],"microgrids":[14],"are":[15,74],"widely":[16],"used.":[17],"However,":[18],"arc":[19,42,67,95,121,126,142,173,194,198],"faults":[20,195],"can":[21,92,98,135,144,189],"cause":[22],"electrical":[23],"fires":[24],"even":[26],"compromise":[27],"safety":[29],"reliability":[31],"system.":[34,88],"In":[35,158],"this":[36,159],"paper,":[37],"a":[38],"modeling":[39,78,162],"integral-regulated-residual-analysis-based":[41],"fault":[43,68,143],"detection":[44],"technique":[45,188],"is":[46,61,111,169,175],"developed":[47,62,90],"for":[48],"systems.":[50],"The":[51,70,89,105,128,177],"generalized":[52],"state":[53,84],"space":[54],"average":[55],"model":[56,91],"system":[60],"under":[63],"normal":[64],"operation":[65],"conditions.":[69],"power":[71,218],"electronic":[72],"harmonics":[73],"considered":[75],"in":[76],"analyzed":[80],"to":[81,113],"estimate":[82],"variation":[85],"predict":[93],"current":[96,122],"preliminarily":[99],"determine":[100],"causes":[102],"variation.":[104],"integral":[106,164],"regulated":[107,165],"residual":[108,166],"analysis":[109,167],"method":[110],"proposed":[112],"calculate":[114],"intersection":[116,133,152],"area":[117,134,153],"between":[118],"model-predicted":[120],"actual":[125],"current.":[127],"nominal":[129,156],"values":[130],"be":[136,145],"determined":[137],"by":[138],"experiments.":[139],"Thus,":[140],"an":[141,202],"identified":[146],"when":[147],"value":[149],"reaches":[154],"value.":[157],"way,":[160],"algorithm":[168],"established":[170],"detector":[174],"developed.":[176],"experimental":[178],"results":[179],"600":[181],"groups":[182],"tests":[184],"verified":[185],"that":[186],"detect":[190],"sustained":[191],"intermittent":[193],"at":[196],"different":[197],"formation":[199],"conditions":[200],"with":[201],"accuracy":[203],"99.5%":[205],"within":[206],"80":[207],"ms":[208],"despite":[209],"effects":[211],"line":[213],"impedance,":[214],"load":[215],"transient":[216],"electronics":[219],"noise.":[220]},"counts_by_year":[],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}