{"id":"https://openalex.org/W4403391450","doi":"https://doi.org/10.1109/tce.2024.3480518","title":"A 20-kHz 106.1-dB SNDR \u03a3\u2013\u0394 DAC Using FIA With Dynamic-Body-Biasing-Assisted CLS Technique","display_name":"A 20-kHz 106.1-dB SNDR \u03a3\u2013\u0394 DAC Using FIA With Dynamic-Body-Biasing-Assisted CLS Technique","publication_year":2024,"publication_date":"2024-10-14","ids":{"openalex":"https://openalex.org/W4403391450","doi":"https://doi.org/10.1109/tce.2024.3480518"},"language":"en","primary_location":{"id":"doi:10.1109/tce.2024.3480518","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2024.3480518","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001685886","display_name":"Yuhua Liang","orcid":"https://orcid.org/0000-0003-1240-2878"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhua Liang","raw_affiliation_strings":["Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi’an, China","Ministry of Education, School of Integrated Circuits, Key Laboratory of Analog Integrated Circuits and Systems, Xidian University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0003-1240-2878","affiliations":[{"raw_affiliation_string":"Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Ministry of Education, School of Integrated Circuits, Key Laboratory of Analog Integrated Circuits and Systems, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108595796","display_name":"Yichen Duan","orcid":null},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yichen Duan","raw_affiliation_strings":["Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi’an, China","Ministry of Education, School of Integrated Circuits, Key Laboratory of Analog Integrated Circuits and Systems, Xidian University, Xi’an, China"],"raw_orcid":"https://orcid.org/0009-0009-6274-7410","affiliations":[{"raw_affiliation_string":"Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Ministry of Education, School of Integrated Circuits, Key Laboratory of Analog Integrated Circuits and Systems, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039575274","display_name":"Zhangming Zhu","orcid":"https://orcid.org/0000-0002-7764-1928"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhangming Zhu","raw_affiliation_strings":["Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi’an, China","Ministry of Education, School of Integrated Circuits, Key Laboratory of Analog Integrated Circuits and Systems, Xidian University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-7764-1928","affiliations":[{"raw_affiliation_string":"Key Laboratory of Analog Integrated Circuits and Systems (Ministry of Education), School of Integrated Circuits, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Ministry of Education, School of Integrated Circuits, Key Laboratory of Analog Integrated Circuits and Systems, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I149594827"],"apc_list":null,"apc_paid":null,"fwci":0.4978,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.58863878,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"71","issue":"2","first_page":"5457","last_page":"5464"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9794999957084656,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.569121241569519},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45854735374450684},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.413921982049942},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4043618142604828},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3840319812297821},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3755340278148651},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3345367908477783},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22747686505317688}],"concepts":[{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.569121241569519},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45854735374450684},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.413921982049942},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4043618142604828},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3840319812297821},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3755340278148651},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3345367908477783},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22747686505317688}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tce.2024.3480518","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2024.3480518","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.49000000953674316,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G4782999852","display_name":null,"funder_award_id":"U2341219","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1482602105","https://openalex.org/W1507783347","https://openalex.org/W1586803141","https://openalex.org/W1980541241","https://openalex.org/W1984886993","https://openalex.org/W2018657325","https://openalex.org/W2043596240","https://openalex.org/W2048407380","https://openalex.org/W2057632502","https://openalex.org/W2070219656","https://openalex.org/W2071848335","https://openalex.org/W2089736791","https://openalex.org/W2090757515","https://openalex.org/W2100427892","https://openalex.org/W2107876553","https://openalex.org/W2112273064","https://openalex.org/W2122940741","https://openalex.org/W2126219570","https://openalex.org/W2135072771","https://openalex.org/W2148966527","https://openalex.org/W2163802031","https://openalex.org/W2170427144","https://openalex.org/W2203307091","https://openalex.org/W2216658321","https://openalex.org/W2291027772","https://openalex.org/W2601497249","https://openalex.org/W2743957810","https://openalex.org/W2912443168","https://openalex.org/W2913970064","https://openalex.org/W2970007648","https://openalex.org/W3086509224","https://openalex.org/W3115125159","https://openalex.org/W4200040673","https://openalex.org/W4220676654","https://openalex.org/W4243489604","https://openalex.org/W4360605811","https://openalex.org/W4376134021","https://openalex.org/W4386470334","https://openalex.org/W4388520238"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036"],"abstract_inverted_index":{"This":[0],"article":[1],"proposes":[2],"a":[3,11,48,82,96,103,113],"low-power":[4],"noise-shaping":[5],"digital-to-analog":[6],"converter":[7],"(DAC)":[8],"that":[9],"utilizes":[10],"floating":[12],"inverter":[13],"amplifier":[14],"(FIA)":[15],"and":[16,33,59,107],"dynamic-body-biasing":[17],"assisted":[18],"correlated":[19],"level":[20],"shifting":[21],"(CLS)":[22],"technology":[23,161],"in":[24,81],"the":[25,75,86,118,136,166,170],"switched":[26,62,92],"capacitor":[27,63,78,93],"DAC":[28,43,94],"to":[29,73,124,129,142,156,164],"reduce":[30],"power":[31,138,150],"consumption":[32,139,151],"enhance":[34,157],"gain.":[35],"Based":[36],"on":[37],"the$\\Sigma":[38],"$-$\\Delta":[39],"$DAC":[40],"structure,":[41],"this":[42,132],"consists":[44],"of":[45,51,77,99,169],"interpolation":[46],"filters,":[47],"4th-order":[49],"cascade":[50],"integrators":[52],"feed-forward":[53],"(CIFB)":[54],"modulator":[55],"with":[56],"4-bit":[57],"quantization,":[58],"an":[60],"improved":[61],"DAC.":[64],"The":[65,91],"data-weighted":[66],"averaging":[67],"(DWA)":[68],"algorithm":[69],"circuit":[70,137],"is":[71,122,162],"employed":[72,163],"minimize":[74],"impact":[76],"mismatch.":[79],"Fabricated":[80],"180nm":[83],"CMOS":[84],"process,":[85],"layout":[87],"occupies":[88],"0.45":[89],"mm2.":[90],"achieves":[95],"maximum":[97],"SNDR":[98],"106.1":[100],"dB":[101],"over":[102],"20":[104],"kHz":[105],"bandwidth":[106],"consumes":[108],"only":[109],"1.82":[110],"mW":[111],"from":[112,140],"3.3":[114],"V":[115],"supply":[116],"when":[117],"sampling":[119],"frequency":[120],"(fs)":[121],"set":[123],"be":[125],"12.288":[126],"MS/s.":[127],"Compared":[128],"traditional":[130],"architectures,":[131],"structure":[133],"successfully":[134],"reduces":[135],"3.87mW":[141],"1.82mW":[143],"by":[144,152,173],"using":[145],"FIA":[146,171],"dynamic":[147],"amplifiers,":[148],"optimizing":[149],"approximately":[153],"53%.":[154],"Additionally,":[155],"integration":[158],"accuracy,":[159],"CLS":[160],"increase":[165],"equivalent":[167],"gain":[168],"amplifiers":[172],"at":[174],"least":[175],"30dB.":[176]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}