{"id":"https://openalex.org/W4388692581","doi":"https://doi.org/10.1109/tce.2023.3332888","title":"Exploiting Feature Layer for Read Reference Voltage Optimization on 3-D NAND Flash Memory","display_name":"Exploiting Feature Layer for Read Reference Voltage Optimization on 3-D NAND Flash Memory","publication_year":2023,"publication_date":"2023-11-15","ids":{"openalex":"https://openalex.org/W4388692581","doi":"https://doi.org/10.1109/tce.2023.3332888"},"language":"en","primary_location":{"id":"doi:10.1109/tce.2023.3332888","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2023.3332888","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008010888","display_name":"Debao Wei","orcid":"https://orcid.org/0000-0001-6353-1384"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Debao Wei","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0001-6353-1384","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084691685","display_name":"Zhelong Piao","orcid":"https://orcid.org/0009-0008-4241-3504"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhelong Piao","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0009-0008-4241-3504","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100347800","display_name":"Ming Liu","orcid":"https://orcid.org/0000-0002-6509-9449"},"institutions":[{"id":"https://openalex.org/I4210095084","display_name":"Zhongji Test Equipment (China)","ror":"https://ror.org/00p24re17","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210095084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Liu","raw_affiliation_strings":["Test Center, Chinese Flight Test Establishment, Xi’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Test Center, Chinese Flight Test Establishment, Xi’an, China","institution_ids":["https://openalex.org/I4210095084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102565625","display_name":"Yanlong Zeng","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanlong Zeng","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024099631","display_name":"Hua Feng","orcid":"https://orcid.org/0000-0002-8364-2062"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hua Feng","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-8364-2062","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101440139","display_name":"Liyan Qiao","orcid":"https://orcid.org/0000-0002-8220-7990"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyan Qiao","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-8220-7990","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019735827","display_name":"Xiyuan Peng","orcid":"https://orcid.org/0000-0001-7424-1008"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiyuan Peng","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0001-7424-1008","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5008010888"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":0.9838,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.77914015,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"70","issue":"1","first_page":"433","last_page":"444"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11321","display_name":"Error Correcting Code Techniques","score":0.9868999719619751,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10741","display_name":"Video Coding and Compression Technologies","score":0.9860000014305115,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.7213517427444458},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7130923867225647},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.6323342323303223},{"id":"https://openalex.org/keywords/granularity","display_name":"Granularity","score":0.5596635341644287},{"id":"https://openalex.org/keywords/voltage-reduction","display_name":"Voltage reduction","score":0.5291935205459595},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5120275616645813},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.48881956934928894},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4871918559074402},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.4824717342853546},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4448539614677429},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.442721426486969},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4413219392299652},{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.4190948009490967},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.4188269078731537},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19819629192352295},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.17888346314430237},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16530343890190125},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1545582413673401},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.08584576845169067}],"concepts":[{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.7213517427444458},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7130923867225647},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.6323342323303223},{"id":"https://openalex.org/C177774035","wikidata":"https://www.wikidata.org/wiki/Q1246948","display_name":"Granularity","level":2,"score":0.5596635341644287},{"id":"https://openalex.org/C2780745134","wikidata":"https://www.wikidata.org/wiki/Q7940751","display_name":"Voltage reduction","level":3,"score":0.5291935205459595},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5120275616645813},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.48881956934928894},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4871918559074402},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.4824717342853546},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4448539614677429},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.442721426486969},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4413219392299652},{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.4190948009490967},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.4188269078731537},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19819629192352295},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.17888346314430237},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16530343890190125},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1545582413673401},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.08584576845169067},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tce.2023.3332888","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2023.3332888","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7099999785423279,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G168478657","display_name":null,"funder_award_id":"LH-2023F015","funder_id":"https://openalex.org/F4320323085","funder_display_name":"Natural Science Foundation of Heilongjiang Province"},{"id":"https://openalex.org/G6298602342","display_name":null,"funder_award_id":"JZJJX20210009","funder_id":"https://openalex.org/F4320322857","funder_display_name":"Aeronautical Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320322857","display_name":"Aeronautical Science Foundation of China","ror":"https://ror.org/02wq41p38"},{"id":"https://openalex.org/F4320323085","display_name":"Natural Science Foundation of Heilongjiang Province","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W2014536047","https://openalex.org/W2028359318","https://openalex.org/W2033506689","https://openalex.org/W2291299389","https://openalex.org/W2509084108","https://openalex.org/W2620952442","https://openalex.org/W2685880320","https://openalex.org/W2750492276","https://openalex.org/W2784173578","https://openalex.org/W2938812810","https://openalex.org/W2941417945","https://openalex.org/W2949251802","https://openalex.org/W2962844766","https://openalex.org/W2994616148","https://openalex.org/W3008744334","https://openalex.org/W3023374103","https://openalex.org/W3091042070","https://openalex.org/W3097338261","https://openalex.org/W3106304288","https://openalex.org/W3137628287","https://openalex.org/W3138669060","https://openalex.org/W3164133037","https://openalex.org/W4220661181","https://openalex.org/W4225300703","https://openalex.org/W4236170267","https://openalex.org/W4285130767","https://openalex.org/W4312381018","https://openalex.org/W4312734762","https://openalex.org/W4362683610","https://openalex.org/W4379799042","https://openalex.org/W4383960604","https://openalex.org/W4387092718","https://openalex.org/W6633130854"],"related_works":["https://openalex.org/W2054139911","https://openalex.org/W1577524679","https://openalex.org/W2162027152","https://openalex.org/W2489439822","https://openalex.org/W2116397085","https://openalex.org/W2535372975","https://openalex.org/W4237143391","https://openalex.org/W4281555628","https://openalex.org/W2537636062","https://openalex.org/W2017101954"],"abstract_inverted_index":{"Three-dimensional":[0],"(3D)":[1],"NAND":[2],"flash":[3,29,63,144],"memories":[4],"have":[5],"been":[6],"widely":[7],"employed":[8],"as":[9,38],"non-volatile":[10],"memory":[11],"mediums":[12],"in":[13,28,72,134],"modern":[14],"consumer":[15],"electronics.":[16],"However,":[17],"the":[18,41,47,56,61,67,82,88,96,114,130,138,148,153,162,171],"adoption":[19],"of":[20,40,49],"3D":[21],"structures":[22],"also":[23],"induces":[24],"complex":[25],"reliability":[26,48],"issues":[27],"memories.":[30],"Read":[31],"reference":[32],"voltage":[33,124],"(RRV)":[34],"optimization":[35,174],"is":[36],"regarded":[37],"one":[39],"key":[42],"fundamental":[43],"techniques":[44],"to":[45,65,86,128],"enhance":[46],"flash-based":[50],"storage.":[51],"Conventional":[52],"strategies":[53],"generally":[54],"utilize":[55],"samples":[57,111,135],"extracted":[58,112,136],"layer-by-layer":[59],"from":[60,113,137],"target":[62],"block":[64,101],"estimate":[66],"optimal":[68,97,122,154],"read":[69,74,98,123,155,163],"voltage,":[70],"resulting":[71],"significant":[73],"latency.":[75],"In":[76],"this":[77],"work,":[78],"we":[79],"propose":[80],"utilizing":[81],"feature":[83,115,139],"layer":[84,105],"concept":[85],"diminish":[87],"sampling":[89],"overhead":[90],"caused":[91],"by":[92,165],"RRV":[93,173],"optimization,":[94],"where":[95],"voltages":[99,156],"at":[100],"granularity":[102,106],"(BGVI)":[103],"or":[104],"(LGVI)":[107],"are":[108],"inferred":[109],"through":[110],"layer.":[116],"We":[117],"further":[118],"develop":[119],"a":[120],"noise-reduction":[121],"determination":[125],"algorithm":[126],"(NRVD)":[127],"overcome":[129],"measurement":[131],"noise":[132],"existing":[133,172],"layers.":[140],"Experiments":[141],"on":[142],"real":[143],"chips":[145],"demonstrate":[146],"that":[147],"proposed":[149],"design":[150],"can":[151],"infer":[152],"with":[157,170],"considerable":[158],"accuracy":[159],"and":[160],"decrease":[161],"count":[164],"more":[166],"than":[167],"50%":[168],"compared":[169],"designs.":[175]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}