{"id":"https://openalex.org/W4387146024","doi":"https://doi.org/10.1109/tce.2023.3320632","title":"Single-Phase 15-Level Inverters for Uninterruptible Power Supply Applications: Fault-Tolerant Strategies","display_name":"Single-Phase 15-Level Inverters for Uninterruptible Power Supply Applications: Fault-Tolerant Strategies","publication_year":2023,"publication_date":"2023-09-28","ids":{"openalex":"https://openalex.org/W4387146024","doi":"https://doi.org/10.1109/tce.2023.3320632"},"language":"en","primary_location":{"id":"doi:10.1109/tce.2023.3320632","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2023.3320632","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010017080","display_name":"Tohid Rahimi","orcid":"https://orcid.org/0000-0002-5444-4139"},"institutions":[{"id":"https://openalex.org/I67031392","display_name":"Carleton University","ror":"https://ror.org/02qtvee93","country_code":"CA","type":"education","lineage":["https://openalex.org/I67031392"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Tohid Rahimi","raw_affiliation_strings":["Department of Electronics, Carleton University, Ottawa, Canada"],"raw_orcid":"https://orcid.org/0000-0002-5444-4139","affiliations":[{"raw_affiliation_string":"Department of Electronics, Carleton University, Ottawa, Canada","institution_ids":["https://openalex.org/I67031392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013752666","display_name":"Mehdi Abedinpour Fallah","orcid":"https://orcid.org/0000-0002-3267-7564"},"institutions":[{"id":"https://openalex.org/I107853901","display_name":"Sahand University of Technology","ror":"https://ror.org/03wdrmh81","country_code":"IR","type":"education","lineage":["https://openalex.org/I107853901"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mehdi Fallah","raw_affiliation_strings":["Department of Electrical Engineering, Sahand University of Technology, Tabriz, Iran"],"raw_orcid":"https://orcid.org/0000-0002-3267-7564","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sahand University of Technology, Tabriz, Iran","institution_ids":["https://openalex.org/I107853901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007509492","display_name":"Ehsan Pashajavid","orcid":"https://orcid.org/0000-0002-1426-5451"},"institutions":[{"id":"https://openalex.org/I205640436","display_name":"Curtin University","ror":"https://ror.org/02n415q13","country_code":"AU","type":"education","lineage":["https://openalex.org/I205640436"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Ehsan Pashajavid","raw_affiliation_strings":["School of Electrical Engineering, Computing and Mathematical Sciences, Curtin University, Bentley, WA, Australia"],"raw_orcid":"https://orcid.org/0000-0002-1426-5451","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Computing and Mathematical Sciences, Curtin University, Bentley, WA, Australia","institution_ids":["https://openalex.org/I205640436"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002357319","display_name":"Josep Pou","orcid":"https://orcid.org/0000-0002-3114-781X"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Josep Pou","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore"],"raw_orcid":"https://orcid.org/0000-0002-3114-781X","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034600653","display_name":"Ali Arefi","orcid":"https://orcid.org/0000-0001-9642-7639"},"institutions":[{"id":"https://openalex.org/I176790772","display_name":"Murdoch University","ror":"https://ror.org/00r4sry34","country_code":"AU","type":"education","lineage":["https://openalex.org/I176790772"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Ali Arefi","raw_affiliation_strings":["Discipline of Engineering and Energy, College of SHEE, Murdoch University, Perth, WA, Australia"],"raw_orcid":"https://orcid.org/0000-0001-9642-7639","affiliations":[{"raw_affiliation_string":"Discipline of Engineering and Energy, College of SHEE, Murdoch University, Perth, WA, Australia","institution_ids":["https://openalex.org/I176790772"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012329682","display_name":"K. H. Loo","orcid":"https://orcid.org/0000-0003-0111-6665"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Ka Hong Loo","raw_affiliation_strings":["Department of Electronic and Information Engineering, The Hong Kong Polytechnic University, Hung Hom, Hong Kong"],"raw_orcid":"https://orcid.org/0000-0003-0111-6665","affiliations":[{"raw_affiliation_string":"Department of Electronic and Information Engineering, The Hong Kong Polytechnic University, Hung Hom, Hong Kong","institution_ids":["https://openalex.org/I14243506"]}]}],"institutions":[],"countries_distinct_count":5,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5010017080"],"corresponding_institution_ids":["https://openalex.org/I67031392"],"apc_list":null,"apc_paid":null,"fwci":2.5551,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.90056461,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"69","issue":"4","first_page":"1055","last_page":"1067"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10223","display_name":"Microgrid Control and Optimization","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/uninterruptible-power-supply","display_name":"Uninterruptible power supply","score":0.9069466590881348},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6443962454795837},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.5988868474960327},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5718380212783813},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5543771386146545},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5264992117881775},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5183302164077759},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49452611804008484},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.47972455620765686},{"id":"https://openalex.org/keywords/economic-shortage","display_name":"Economic shortage","score":0.47461429238319397},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46208450198173523},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4587985873222351},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44642117619514465},{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.4396761655807495},{"id":"https://openalex.org/keywords/realization","display_name":"Realization (probability)","score":0.41915470361709595},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41670045256614685},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3661666512489319},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.06666341423988342}],"concepts":[{"id":"https://openalex.org/C2988808934","wikidata":"https://www.wikidata.org/wiki/Q207696","display_name":"Uninterruptible power supply","level":3,"score":0.9069466590881348},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6443962454795837},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.5988868474960327},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5718380212783813},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5543771386146545},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5264992117881775},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5183302164077759},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49452611804008484},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.47972455620765686},{"id":"https://openalex.org/C194051981","wikidata":"https://www.wikidata.org/wiki/Q1337691","display_name":"Economic shortage","level":3,"score":0.47461429238319397},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46208450198173523},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4587985873222351},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44642117619514465},{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.4396761655807495},{"id":"https://openalex.org/C2781089630","wikidata":"https://www.wikidata.org/wiki/Q21856745","display_name":"Realization (probability)","level":2,"score":0.41915470361709595},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41670045256614685},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3661666512489319},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.06666341423988342},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C2778137410","wikidata":"https://www.wikidata.org/wiki/Q2732820","display_name":"Government (linguistics)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tce.2023.3320632","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2023.3320632","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.4399999976158142}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":52,"referenced_works":["https://openalex.org/W1980357812","https://openalex.org/W2002646831","https://openalex.org/W2014190781","https://openalex.org/W2050869149","https://openalex.org/W2077625103","https://openalex.org/W2095639323","https://openalex.org/W2128380680","https://openalex.org/W2144134335","https://openalex.org/W2148980654","https://openalex.org/W2158503578","https://openalex.org/W2198137294","https://openalex.org/W2304463668","https://openalex.org/W2313276518","https://openalex.org/W2322647736","https://openalex.org/W2460950560","https://openalex.org/W2485157506","https://openalex.org/W2514659007","https://openalex.org/W2553261477","https://openalex.org/W2555337301","https://openalex.org/W2592517717","https://openalex.org/W2600446325","https://openalex.org/W2806783924","https://openalex.org/W2809258611","https://openalex.org/W2886913810","https://openalex.org/W2890452937","https://openalex.org/W2902263626","https://openalex.org/W2905594389","https://openalex.org/W2943563034","https://openalex.org/W2945599056","https://openalex.org/W2982299489","https://openalex.org/W3000357534","https://openalex.org/W3005990415","https://openalex.org/W3008062562","https://openalex.org/W3027789617","https://openalex.org/W3035908741","https://openalex.org/W3082690515","https://openalex.org/W3087860425","https://openalex.org/W3094450968","https://openalex.org/W3101967035","https://openalex.org/W3129821835","https://openalex.org/W3134533720","https://openalex.org/W3134784052","https://openalex.org/W3140642350","https://openalex.org/W3142558828","https://openalex.org/W3162027885","https://openalex.org/W3167579240","https://openalex.org/W3178470325","https://openalex.org/W3212321180","https://openalex.org/W3215462265","https://openalex.org/W4206478521","https://openalex.org/W4210858385","https://openalex.org/W4292466897"],"related_works":["https://openalex.org/W4361989019","https://openalex.org/W2318746575","https://openalex.org/W3164416905","https://openalex.org/W2394855236","https://openalex.org/W2385832380","https://openalex.org/W2060044332","https://openalex.org/W2380046073","https://openalex.org/W2320548181","https://openalex.org/W2146642246","https://openalex.org/W4318262126"],"abstract_inverted_index":{"An":[0],"uninterruptible":[1],"power":[2,26],"supply":[3],"(UPS)":[4],"is":[5,96,148],"commended":[6],"unit":[7],"or":[8],"even":[9],"necessary":[10],"for":[11,28,38,139],"consumers\u2019":[12],"electronic":[13],"devices":[14],"in":[15,108],"the":[16,67,87,93,104,128,133,145],"individual,":[17],"industry,":[18],"and":[19,55,80],"critical":[20,140],"categories":[21],"to":[22,60,113,131],"protect":[23],"them":[24],"against":[25],"shortage":[27],"loads.":[29],"This":[30,117],"article":[31,118],"proposes":[32],"a":[33,62,101],"family":[34],"of":[35,76,92,110,135,144],"single-phase":[36],"inverters":[37,107],"UPS":[39,137],"applications":[40],"requiring":[41],"significant":[42],"fault":[43],"tolerance.":[44],"The":[45,70,89,142],"main":[46],"inverter":[47,95],"comprises":[48],"two":[49],"unidirectional":[50],"switches,":[51,54],"eight":[52],"bidirectional":[53],"six":[56],"DC":[57],"voltage":[58,64,81,84],"sources":[59],"produce":[61],"fifteen-level":[63,106],"waveform":[65],"across":[66],"load":[68],"terminals.":[69],"proposed":[71,94,129],"topology":[72,130],"can":[73,124],"tolerate":[74],"failures":[75],"various":[77,154],"semiconductor":[78],"switches":[79],"sources,":[82],"preserving":[83],"levels":[85],"at":[86],"output.":[88],"core":[90],"structure":[91],"first":[97],"explained,":[98],"followed":[99],"by":[100],"comparison":[102],"with":[103],"existing":[105],"terms":[109],"several":[111,120],"parameters":[112],"demonstrate":[114],"its":[115],"superiorities.":[116],"presents":[119],"fault-tolerant":[121],"strategies":[122],"that":[123],"be":[125],"implemented":[126],"using":[127],"facilitate":[132],"realization":[134],"reliable":[136],"systems":[138],"applications.":[141],"effectiveness":[143],"suggested":[146],"schemes":[147],"verified":[149],"through":[150],"experimental":[151],"evaluations":[152],"under":[153],"conditions.":[155]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}