{"id":"https://openalex.org/W2973469867","doi":"https://doi.org/10.1109/tce.2019.2942503","title":"A 20-Gb/s Receiver Bridge Chip With Auto-Skew Calibration for MIPI D-PHY Interface","display_name":"A 20-Gb/s Receiver Bridge Chip With Auto-Skew Calibration for MIPI D-PHY Interface","publication_year":2019,"publication_date":"2019-09-19","ids":{"openalex":"https://openalex.org/W2973469867","doi":"https://doi.org/10.1109/tce.2019.2942503","mag":"2973469867"},"language":"en","primary_location":{"id":"doi:10.1109/tce.2019.2942503","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2019.2942503","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054737317","display_name":"Pil-Ho Lee","orcid":"https://orcid.org/0000-0002-8096-8518"},"institutions":[{"id":"https://openalex.org/I113409471","display_name":"Kumoh National Institute of Technology","ror":"https://ror.org/05dkjfz60","country_code":"KR","type":"education","lineage":["https://openalex.org/I113409471"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Pil-Ho Lee","raw_affiliation_strings":["Department of Electronic Engineering, Kumoh National Institute of Technology, Gumi, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-8096-8518","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kumoh National Institute of Technology, Gumi, South Korea","institution_ids":["https://openalex.org/I113409471"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069858619","display_name":"Young\u2010Chan Jang","orcid":"https://orcid.org/0000-0001-8680-9270"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Young-Chan Jang","raw_affiliation_strings":["Memory Division, Samsung Electronics, Hwaseong, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-8680-9270","affiliations":[{"raw_affiliation_string":"Memory Division, Samsung Electronics, Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3633,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.61799347,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"65","issue":"4","first_page":"484","last_page":"492"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/skew","display_name":"Skew","score":0.7206981778144836},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.6469321846961975},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5597041845321655},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5166369080543518},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4973800480365753},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4894491732120514},{"id":"https://openalex.org/keywords/phy","display_name":"PHY","score":0.4725235104560852},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47098207473754883},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.41858386993408203},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2826788127422333},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12017294764518738},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11628270149230957},{"id":"https://openalex.org/keywords/physical-layer","display_name":"Physical layer","score":0.10515809059143066},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.0993802547454834}],"concepts":[{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.7206981778144836},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.6469321846961975},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5597041845321655},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5166369080543518},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4973800480365753},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4894491732120514},{"id":"https://openalex.org/C41918916","wikidata":"https://www.wikidata.org/wiki/Q192727","display_name":"PHY","level":4,"score":0.4725235104560852},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47098207473754883},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.41858386993408203},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2826788127422333},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12017294764518738},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11628270149230957},{"id":"https://openalex.org/C19247436","wikidata":"https://www.wikidata.org/wiki/Q192727","display_name":"Physical layer","level":3,"score":0.10515809059143066},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0993802547454834},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tce.2019.2942503","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2019.2942503","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G6489798263","display_name":null,"funder_award_id":"2018R1A6A1A03024003","funder_id":"https://openalex.org/F4320311687","funder_display_name":"Ministry of Education"},{"id":"https://openalex.org/G6738679766","display_name":null,"funder_award_id":"N0001883","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"}],"funders":[{"id":"https://openalex.org/F4320311687","display_name":"Ministry of Education","ror":"https://ror.org/03m01yf64"},{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W2003735396","https://openalex.org/W2041072525","https://openalex.org/W2081089490","https://openalex.org/W2107853225","https://openalex.org/W2123892792","https://openalex.org/W2148968920","https://openalex.org/W2149598930","https://openalex.org/W2153765288","https://openalex.org/W2166984288","https://openalex.org/W2175519525","https://openalex.org/W2179481090","https://openalex.org/W2345661102","https://openalex.org/W2770223386","https://openalex.org/W2907222374"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2315668284","https://openalex.org/W2155789024","https://openalex.org/W2109491806","https://openalex.org/W3213608175","https://openalex.org/W2058044441","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W2343144621","https://openalex.org/W2087292010"],"abstract_inverted_index":{"A":[0],"20-Gbps":[1],"receiver":[2,35,110,138],"bridge":[3,36,111],"chip":[4,37,112],"featuring":[5],"auto-skew":[6,59],"calibration":[7,60,161],"and":[8,29,41,65,171],"continuous-time":[9],"linear":[10],"equalization":[11],"is":[12,66,95,113,139],"proposed":[13,34,58,109,137,159],"to":[14,68,72,102,175],"support":[15],"the":[16,73,76,81,87,91,104,132,136,163,167],"mobile":[17],"industry":[18],"processor":[19],"interface":[20],"D-PHY":[21],"version":[22],"2.0":[23],"specification":[24],"with":[25,121],"four":[26,168],"data":[27,144,169],"lanes":[28,170],"one":[30,172],"clock":[31,173],"lane.":[32],"The":[33,57,108,126,158],"performs":[38],"byte":[39],"synchronization":[40],"1-to-8":[42],"deserialization":[43],"for":[44,90],"converting":[45],"high-speed":[46],"scalable":[47],"low-voltage":[48,52],"signals":[49],"into":[50],"low-speed":[51],"complementary":[53],"metal-oxide":[54],"semiconductor":[55],"signals.":[56],"has":[61],"a":[62,84,98,116,122,143,150],"simple":[63],"architecture":[64],"insensitive":[67],"dynamic":[69],"noise":[70],"owing":[71],"use":[74,103],"of":[75,86,131,146],"multiple":[77],"bits":[78],"supplied":[79],"from":[80],"deserializer":[82],"as":[83],"result":[85],"phase":[88],"detector":[89],"skew":[92,160,165],"calibration.":[93],"It":[94],"performed":[96],"via":[97],"four-step":[99],"sequential":[100],"process":[101,120],"minimum":[105],"time":[106,129,164],"delay.":[107],"implemented":[114],"using":[115,135],"0.11":[117],"\u03bcm":[118],"CMOS":[119],"1.2":[123],"V":[124],"supply.":[125],"measured":[127],"peak-to-peak":[128],"jitter":[130],"signal":[133],"recovered":[134],"50":[140],"ps":[141],"at":[142],"rate":[145],"5.0":[147],"Gbps/lane":[148],"on":[149],"printed":[151],"circuit":[152],"board":[153],"FR-4":[154],"10":[155,178],"inch":[156],"channel.":[157],"reduces":[162],"among":[166],"lane":[174],"less":[176],"than":[177],"ps.":[179]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}