{"id":"https://openalex.org/W2090959852","doi":"https://doi.org/10.1109/tce.2014.7027347","title":"A novel depth image enhancement method based on the linear surface model","display_name":"A novel depth image enhancement method based on the linear surface model","publication_year":2014,"publication_date":"2014-11-01","ids":{"openalex":"https://openalex.org/W2090959852","doi":"https://doi.org/10.1109/tce.2014.7027347","mag":"2090959852"},"language":"en","primary_location":{"id":"doi:10.1109/tce.2014.7027347","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2014.7027347","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109920094","display_name":"Seok-Jae Kang","orcid":null},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seok-Jae Kang","raw_affiliation_strings":["Korea University, Seoul, Rep. of Korea","School of Electrical Engineering Department, Korea University, Anam-dong, Sungbuk-gu, Seoul, 136-713, Rep. of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea University, Seoul, Rep. of Korea","institution_ids":["https://openalex.org/I197347611"]},{"raw_affiliation_string":"School of Electrical Engineering Department, Korea University, Anam-dong, Sungbuk-gu, Seoul, 136-713, Rep. of Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089888701","display_name":"Mun-Cheon Kang","orcid":"https://orcid.org/0000-0002-0839-9402"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Mun-Cheon Kang","raw_affiliation_strings":["Korea University, Seoul, Rep. of Korea","School of Electrical Engineering Department, Korea University, Anam-dong, Sungbuk-gu, Seoul, 136-713, Rep. of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea University, Seoul, Rep. of Korea","institution_ids":["https://openalex.org/I197347611"]},{"raw_affiliation_string":"School of Electrical Engineering Department, Korea University, Anam-dong, Sungbuk-gu, Seoul, 136-713, Rep. of Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100321042","display_name":"Dae-Hwan Kim","orcid":"https://orcid.org/0000-0001-8400-6167"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dae-Hwan Kim","raw_affiliation_strings":["Korea University, Seoul, Rep. of Korea","School of Electrical Engineering Department, Korea University, Anam-dong, Sungbuk-gu, Seoul, 136-713, Rep. of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea University, Seoul, Rep. of Korea","institution_ids":["https://openalex.org/I197347611"]},{"raw_affiliation_string":"School of Electrical Engineering Department, Korea University, Anam-dong, Sungbuk-gu, Seoul, 136-713, Rep. of Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020023785","display_name":"Sung-Jea Ko","orcid":"https://orcid.org/0000-0002-4875-7091"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sung-Jea Ko","raw_affiliation_strings":["Korea University, Seoul, Rep. of Korea","School of Electrical Engineering Department, Korea University, Anam-dong, Sungbuk-gu, Seoul, 136-713, Rep. of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea University, Seoul, Rep. of Korea","institution_ids":["https://openalex.org/I197347611"]},{"raw_affiliation_string":"School of Electrical Engineering Department, Korea University, Anam-dong, Sungbuk-gu, Seoul, 136-713, Rep. of Korea","institution_ids":["https://openalex.org/I197347611"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I197347611"],"apc_list":null,"apc_paid":null,"fwci":0.4852,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.70590507,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"60","issue":"4","first_page":"710","last_page":"718"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7209565043449402},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.665536642074585},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6407754421234131},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5869092345237732},{"id":"https://openalex.org/keywords/rgb-color-model","display_name":"RGB color model","score":0.5703757405281067},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.5407123565673828},{"id":"https://openalex.org/keywords/depth-map","display_name":"Depth map","score":0.5367523431777954},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.49175360798835754},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4446827471256256},{"id":"https://openalex.org/keywords/image-restoration","display_name":"Image restoration","score":0.44456547498703003},{"id":"https://openalex.org/keywords/boundary","display_name":"Boundary (topology)","score":0.430730938911438},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.35257720947265625},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3070860505104065},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.2563190162181854},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08159366250038147}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7209565043449402},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.665536642074585},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6407754421234131},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5869092345237732},{"id":"https://openalex.org/C82990744","wikidata":"https://www.wikidata.org/wiki/Q166194","display_name":"RGB color model","level":2,"score":0.5703757405281067},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.5407123565673828},{"id":"https://openalex.org/C141268832","wikidata":"https://www.wikidata.org/wiki/Q2940499","display_name":"Depth map","level":3,"score":0.5367523431777954},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.49175360798835754},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4446827471256256},{"id":"https://openalex.org/C106430172","wikidata":"https://www.wikidata.org/wiki/Q6002272","display_name":"Image restoration","level":4,"score":0.44456547498703003},{"id":"https://openalex.org/C62354387","wikidata":"https://www.wikidata.org/wiki/Q875399","display_name":"Boundary (topology)","level":2,"score":0.430730938911438},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.35257720947265625},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3070860505104065},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.2563190162181854},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08159366250038147},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tce.2014.7027347","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2014.7027347","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1495534451","https://openalex.org/W1508960934","https://openalex.org/W1509167548","https://openalex.org/W1596749866","https://openalex.org/W2005564112","https://openalex.org/W2008199225","https://openalex.org/W2019371513","https://openalex.org/W2082253268","https://openalex.org/W2104600947","https://openalex.org/W2118246710","https://openalex.org/W2126358139","https://openalex.org/W2133665775","https://openalex.org/W2137094687","https://openalex.org/W2139034512","https://openalex.org/W2143291846","https://openalex.org/W2157332353","https://openalex.org/W3140672266","https://openalex.org/W4241716071","https://openalex.org/W4289257366","https://openalex.org/W6629787384","https://openalex.org/W6630621609"],"related_works":["https://openalex.org/W2085033728","https://openalex.org/W4285411112","https://openalex.org/W2171299904","https://openalex.org/W1647606319","https://openalex.org/W4390494008","https://openalex.org/W2053596378","https://openalex.org/W2922442631","https://openalex.org/W2168523118","https://openalex.org/W2073639911","https://openalex.org/W2043988397"],"abstract_inverted_index":{"In":[0,52,70],"three-dimensional":[1],"(3D)":[2],"video":[3],"applications,":[4],"structured-light":[5],"RGB-D":[6],"cameras":[7,26],"are":[8],"commonly":[9],"used":[10],"to":[11,37,116],"capture":[12],"depth":[13,19,45,50,57,64,92,119,147],"images":[14],"that":[15,61,131],"convey":[16],"the":[17,48,71,74,78,91,107,118,126,132,140],"per-pixel":[18],"information":[20,46],"in":[21,125],"a":[22,55,101,113,122],"scene.":[23],"However,":[24],"these":[25],"often":[27],"produce":[28],"regions":[29],"with":[30,144],"missing":[31],"pixels":[32],"(MPs).":[33],"These":[34],"regions,":[35],"referred":[36],"as":[38,100],"holes,":[39],"will":[40],"not":[41],"contain":[42],"no":[43],"any":[44],"for":[47],"captured":[49],"image.":[51],"this":[53],"paper,":[54],"novel":[56],"image":[58,148],"enhancement":[59,149],"method":[60,134],"accurately":[62],"estimates":[63],"values":[65],"of":[66,95,106,121],"MPs":[67],"is":[68,80,98,110],"presented.":[69],"proposed":[72,114,133],"method,":[73],"neighboring":[75],"region":[76],"outside":[77],"hole":[79],"first":[81],"segmented":[82],"into":[83],"superpixels":[84],"using":[85,112],"simple":[86],"linear":[87,102,108],"iterative":[88],"clustering.":[89],"Subsequently,":[90],"value":[93,120],"trend":[94],"each":[96],"superpixel":[97],"modeled":[99],"surface.":[103],"Finally,":[104],"one":[105],"surfaces":[109],"selected":[111],"metric,":[115],"estimate":[117],"particular":[123],"MP":[124],"hole.":[127],"Experimental":[128],"results":[129],"demonstrate":[130],"provides":[135],"superior":[136],"performance,":[137],"especially":[138],"around":[139],"object":[141],"boundary,":[142],"compared":[143],"other":[145],"state-of-theart":[146],"methods.":[150]},"counts_by_year":[{"year":2021,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}