{"id":"https://openalex.org/W2071200776","doi":"https://doi.org/10.1109/tce.2012.6311327","title":"PCRAM-assisted ECC management for enhanced data reliability in flash storage systems","display_name":"PCRAM-assisted ECC management for enhanced data reliability in flash storage systems","publication_year":2012,"publication_date":"2012-08-01","ids":{"openalex":"https://openalex.org/W2071200776","doi":"https://doi.org/10.1109/tce.2012.6311327","mag":"2071200776"},"language":"en","primary_location":{"id":"doi:10.1109/tce.2012.6311327","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2012.6311327","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088595451","display_name":"Hak-Yong Lee","orcid":"https://orcid.org/0000-0002-3434-8115"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hakyong Lee","raw_affiliation_strings":["Samsung Electronics Corporation, Hwasung, South Korea","Samsung Electron., Ltd., Hwasung, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Corporation, Hwasung, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electron., Ltd., Hwasung, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064071418","display_name":"Sanghyuk Jung","orcid":"https://orcid.org/0000-0002-3164-0567"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sanghyuk Jung","raw_affiliation_strings":["Department of Electronics and Computer Engineering, Hanyang University, Seoul, South Korea","[Dept. of Electron. & Comput. Eng., Hanyang Univ., Seoul, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Computer Engineering, Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]},{"raw_affiliation_string":"[Dept. of Electron. & Comput. Eng., Hanyang Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100651806","display_name":"Yong Song","orcid":"https://orcid.org/0000-0003-0097-5281"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong Song","raw_affiliation_strings":["Department of Electronics and Computer Engineering, Hanyang University, Seoul, South Korea","[Dept. of Electron. & Comput. Eng., Hanyang Univ., Seoul, South Korea]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Computer Engineering, Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]},{"raw_affiliation_string":"[Dept. of Electron. & Comput. Eng., Hanyang Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I4575257"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3631,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.64880503,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"58","issue":"3","first_page":"849","last_page":"856"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11478","display_name":"Caching and Content Delivery","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.983299970626831,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.771275520324707},{"id":"https://openalex.org/keywords/flash-file-system","display_name":"Flash file system","score":0.696050763130188},{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.623237133026123},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.556521475315094},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.5396985411643982},{"id":"https://openalex.org/keywords/computer-data-storage","display_name":"Computer data storage","score":0.539665162563324},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.519811749458313},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.5037907958030701},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.49836277961730957},{"id":"https://openalex.org/keywords/reading","display_name":"Reading (process)","score":0.4877496361732483},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.48042988777160645},{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.47640836238861084},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.433095246553421},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4273432791233063},{"id":"https://openalex.org/keywords/computer-memory","display_name":"Computer memory","score":0.3188340663909912},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.28457409143447876},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.24317702651023865},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.21891111135482788},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15666931867599487}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.771275520324707},{"id":"https://openalex.org/C27670709","wikidata":"https://www.wikidata.org/wiki/Q5457555","display_name":"Flash file system","level":4,"score":0.696050763130188},{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.623237133026123},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.556521475315094},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.5396985411643982},{"id":"https://openalex.org/C194739806","wikidata":"https://www.wikidata.org/wiki/Q66221","display_name":"Computer data storage","level":2,"score":0.539665162563324},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.519811749458313},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.5037907958030701},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.49836277961730957},{"id":"https://openalex.org/C554936623","wikidata":"https://www.wikidata.org/wiki/Q199657","display_name":"Reading (process)","level":2,"score":0.4877496361732483},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.48042988777160645},{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.47640836238861084},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.433095246553421},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4273432791233063},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.3188340663909912},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.28457409143447876},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.24317702651023865},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.21891111135482788},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15666931867599487},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tce.2012.6311327","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2012.6311327","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4000000059604645,"display_name":"Quality Education","id":"https://metadata.un.org/sdg/4"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W57693835","https://openalex.org/W1522250664","https://openalex.org/W1555915743","https://openalex.org/W1767399337","https://openalex.org/W1972127875","https://openalex.org/W1980035523","https://openalex.org/W1982935918","https://openalex.org/W1995456425","https://openalex.org/W2018338139","https://openalex.org/W2035934766","https://openalex.org/W2052677323","https://openalex.org/W2068539906","https://openalex.org/W2109966220","https://openalex.org/W2114828666","https://openalex.org/W2117748283","https://openalex.org/W2124799219","https://openalex.org/W2129821171","https://openalex.org/W2132824704","https://openalex.org/W2138900633","https://openalex.org/W2141879519","https://openalex.org/W2147407897","https://openalex.org/W2150958198","https://openalex.org/W2165068957","https://openalex.org/W2179360174","https://openalex.org/W2201220957","https://openalex.org/W2489439822","https://openalex.org/W2526202524","https://openalex.org/W2618728591","https://openalex.org/W2725179571","https://openalex.org/W2978655370","https://openalex.org/W6602366969","https://openalex.org/W6631155369","https://openalex.org/W6633127185","https://openalex.org/W6638187221","https://openalex.org/W6658328888","https://openalex.org/W6679248497","https://openalex.org/W6684515133","https://openalex.org/W6768959830"],"related_works":["https://openalex.org/W2085734125","https://openalex.org/W1937038249","https://openalex.org/W1978956369","https://openalex.org/W2104094101","https://openalex.org/W2040690282","https://openalex.org/W2331762408","https://openalex.org/W1908804015","https://openalex.org/W1993260518","https://openalex.org/W1981274188","https://openalex.org/W4251962070"],"abstract_inverted_index":{"Recent":[0],"advance":[1],"in":[2,19,29,78,119,195,201,213,236],"per-cell":[3],"bit":[4,43,93],"density":[5],"and":[6,41,47,76,148,152,231,238],"semiconductor":[7],"technology":[8],"for":[9,71,143,176,192],"NAND":[10,177],"flash":[11,30,64,131,178],"memories":[12],"have":[13,112],"led":[14],"to":[15,39,87,90,106,116,125,140,157,189],"significant":[16],"cost":[17],"reduction":[18],"non-volatile":[20],"storage":[21,179,188],"implementation.":[22],"However,":[23,133],"the":[24,51,72,79,83,101,120,126,130,149,159,193,199,214,221],"reliability":[25],"of":[26,50,82,129],"data":[27,58,73,121,146,194,207],"stored":[28,77],"memory":[31],"has":[32,226],"dramatically":[33],"decreased,":[34],"requiring":[35],"an":[36,66,134,172],"efficient":[37],"mechanism":[38,137,170],"detect":[40],"correct":[42,91],"errors":[44],"during":[45],"read":[46],"write":[48],"operations":[49],"data.":[52],"For":[53],"this":[54,109,162],"purpose,":[55],"when":[56],"user":[57],"are":[59,154,204],"often":[60],"written":[61],"into":[62,206],"a":[63,144,166,186],"page,":[65,147],"Error":[67],"Correction":[68],"Code":[69],"(ECC)":[70],"is":[74,98,138],"generated":[75],"spare":[80,102,127],"area":[81,128],"page.":[84],"ECCs":[85,118,142,191,211],"tend":[86],"become":[88],"longer":[89],"more":[92],"errors,":[94],"sometimes":[95],"beyond":[96],"what":[97],"affordable":[99],"by":[100,229],"area.":[103],"In":[104,161],"order":[105],"cope":[107],"with":[108,171,209],"problem,":[110],"there":[111],"been":[113,227],"many":[114],"attempts":[115,235],"keep":[117],"area,":[122],"as":[123,185],"opposed":[124],"memory.":[132],"additional":[135],"mapping":[136,240],"required":[139],"locate":[141],"given":[145],"program":[150],"time":[151],"cycle":[153],"increased":[155],"due":[156],"reading/storing":[158],"ECCs.":[160],"paper,":[163],"we":[164],"present":[165],"novel":[167],"ECC":[168,224],"management":[169,225],"assist":[173],"from":[174,223],"PCM":[175,184],"systems.":[180],"This":[181],"technique":[182],"uses":[183],"temporal":[187],"store":[190],"log":[196,202],"blocks.":[197],"Later,":[198],"pages":[200],"blocks":[203,208],"merged":[205],"their":[210],"kept":[212],"PCM.":[215],"Our":[216],"experimental":[217],"results":[218],"show":[219],"that":[220],"overhead":[222],"improved":[228],"57%":[230],"69%":[232],"over":[233],"previous":[234],"BAST":[237],"FAST":[239],"schemes,":[241],"respectively.":[242]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}