{"id":"https://openalex.org/W2170198196","doi":"https://doi.org/10.1109/tce.2006.1706467","title":"OFDM performance analysis in the phase noise arising from the hot-carrier effect","display_name":"OFDM performance analysis in the phase noise arising from the hot-carrier effect","publication_year":2006,"publication_date":"2006-08-01","ids":{"openalex":"https://openalex.org/W2170198196","doi":"https://doi.org/10.1109/tce.2006.1706467","mag":"2170198196"},"language":"en","primary_location":{"id":"doi:10.1109/tce.2006.1706467","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2006.1706467","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036007735","display_name":"S.R. Herlekar","orcid":null},"institutions":[{"id":"https://openalex.org/I121820613","display_name":"Louisiana State University","ror":"https://ror.org/05ect4e57","country_code":"US","type":"education","lineage":["https://openalex.org/I121820613"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S.R. Herlekar","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA, USA","institution_ids":["https://openalex.org/I121820613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100458200","display_name":"Chi Zhang","orcid":"https://orcid.org/0000-0002-7511-805X"},"institutions":[{"id":"https://openalex.org/I121820613","display_name":"Louisiana State University","ror":"https://ror.org/05ect4e57","country_code":"US","type":"education","lineage":["https://openalex.org/I121820613"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chi Zhang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA, USA","institution_ids":["https://openalex.org/I121820613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040614086","display_name":"Hsiao\u2010Chun Wu","orcid":"https://orcid.org/0000-0002-0178-1246"},"institutions":[{"id":"https://openalex.org/I121820613","display_name":"Louisiana State University","ror":"https://ror.org/05ect4e57","country_code":"US","type":"education","lineage":["https://openalex.org/I121820613"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hsiao-Chun Wu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA, USA","institution_ids":["https://openalex.org/I121820613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101810717","display_name":"Ashok Srivastava","orcid":"https://orcid.org/0000-0002-0357-2130"},"institutions":[{"id":"https://openalex.org/I121820613","display_name":"Louisiana State University","ror":"https://ror.org/05ect4e57","country_code":"US","type":"education","lineage":["https://openalex.org/I121820613"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Srivastava","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA, USA","institution_ids":["https://openalex.org/I121820613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084103888","display_name":"Yiyan Wu","orcid":"https://orcid.org/0000-0001-8890-5389"},"institutions":[{"id":"https://openalex.org/I121820613","display_name":"Louisiana State University","ror":"https://ror.org/05ect4e57","country_code":"US","type":"education","lineage":["https://openalex.org/I121820613"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yiyan Wu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA, USA","institution_ids":["https://openalex.org/I121820613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5036007735"],"corresponding_institution_ids":["https://openalex.org/I121820613"],"apc_list":null,"apc_paid":null,"fwci":0.3761,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.6845337,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"52","issue":"3","first_page":"757","last_page":"765"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/orthogonal-frequency-division-multiplexing","display_name":"Orthogonal frequency-division multiplexing","score":0.7407016754150391},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.6799042820930481},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.6744356751441956},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6119967699050903},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6104522943496704},{"id":"https://openalex.org/keywords/noise-margin","display_name":"Noise margin","score":0.5316042900085449},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4633619785308838},{"id":"https://openalex.org/keywords/synchronization","display_name":"Synchronization (alternating current)","score":0.4505003094673157},{"id":"https://openalex.org/keywords/oscillator-phase-noise","display_name":"Oscillator phase noise","score":0.4342010021209717},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.4286423325538635},{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.4265315532684326},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4190414249897003},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.41469722986221313},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3796481192111969},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.37182313203811646},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3615899384021759},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.25930124521255493},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.24490070343017578},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.2035638689994812}],"concepts":[{"id":"https://openalex.org/C40409654","wikidata":"https://www.wikidata.org/wiki/Q375889","display_name":"Orthogonal frequency-division multiplexing","level":3,"score":0.7407016754150391},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.6799042820930481},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.6744356751441956},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6119967699050903},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6104522943496704},{"id":"https://openalex.org/C179499742","wikidata":"https://www.wikidata.org/wiki/Q1324892","display_name":"Noise margin","level":4,"score":0.5316042900085449},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4633619785308838},{"id":"https://openalex.org/C2778562939","wikidata":"https://www.wikidata.org/wiki/Q1298791","display_name":"Synchronization (alternating current)","level":3,"score":0.4505003094673157},{"id":"https://openalex.org/C26571440","wikidata":"https://www.wikidata.org/wiki/Q7106415","display_name":"Oscillator phase noise","level":5,"score":0.4342010021209717},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4286423325538635},{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.4265315532684326},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4190414249897003},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.41469722986221313},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3796481192111969},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.37182313203811646},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3615899384021759},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.25930124521255493},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.24490070343017578},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2035638689994812},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tce.2006.1706467","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tce.2006.1706467","pdf_url":null,"source":{"id":"https://openalex.org/S126824455","display_name":"IEEE Transactions on Consumer Electronics","issn_l":"0098-3063","issn":["0098-3063","1558-4127"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Consumer Electronics","raw_type":"journal-article"},{"id":"pmh:oai:repository.lsu.edu:eecs_pubs-3205","is_oa":false,"landing_page_url":"https://repository.lsu.edu/eecs_pubs/2203","pdf_url":null,"source":{"id":"https://openalex.org/S4210169993","display_name":"Civil War Book Review","issn_l":"1528-6592","issn":["1528-6592"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310315936","host_organization_name":"Louisiana State University","host_organization_lineage":["https://openalex.org/P4310315936"],"host_organization_lineage_names":["Louisiana State University"],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Faculty Publications","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8600000143051147,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1514652980","https://openalex.org/W1516996557","https://openalex.org/W2073407619","https://openalex.org/W2102266428","https://openalex.org/W2111213652","https://openalex.org/W2112357057","https://openalex.org/W2118565267","https://openalex.org/W2120631655","https://openalex.org/W2123988735","https://openalex.org/W2124376235","https://openalex.org/W2124779362","https://openalex.org/W2130455704","https://openalex.org/W2131415211","https://openalex.org/W2131909533","https://openalex.org/W2135895052","https://openalex.org/W2136484843","https://openalex.org/W2136738965","https://openalex.org/W2138528631","https://openalex.org/W2145695275","https://openalex.org/W2150817728","https://openalex.org/W2156470945","https://openalex.org/W2158979030","https://openalex.org/W2170454879","https://openalex.org/W2485002209","https://openalex.org/W3215596796","https://openalex.org/W4229899424"],"related_works":["https://openalex.org/W2160723942","https://openalex.org/W2289200218","https://openalex.org/W2426970183","https://openalex.org/W2081047325","https://openalex.org/W2155457917","https://openalex.org/W2225810880","https://openalex.org/W2096658259","https://openalex.org/W2074341954","https://openalex.org/W2158353032","https://openalex.org/W2148181347"],"abstract_inverted_index":{"Phase":[0],"noise":[1,59,159,177,195],"can":[2,204],"be":[3,205],"regarded":[4],"as":[5,56],"the":[6,14,26,31,37,43,49,57,64,71,75,81,84,91,96,105,115,119,126,131,134,139,148,162,167,187,198,201,211,216],"most":[7],"severe":[8],"cause":[9],"of":[10,74,121,144,200,215],"performance":[11,40,72,108,117,137],"degradation":[12,73],"in":[13,25,70,90,118,142,197,207],"orthogonal":[15],"frequency":[16],"multiplexing":[17],"division":[18],"(OFDM)":[19],"systems.":[20],"The":[21,51],"hot-carriers":[22],"(HCs),":[23],"found":[24],"CMOS":[27],"synchronization":[28,122],"circuits,":[29],"are":[30],"high-energy":[32],"charge":[33],"carriers":[34],"that":[35,186],"degrade":[36],"MOSFET":[38,66,93,97,149],"devices":[39],"by":[41,125,166],"increasing":[42],"threshold":[44,150],"voltage":[45],"required":[46],"to":[47,100,104,181],"operate":[48],"MOSFETs.":[50,82],"HC":[52,85,202,217],"effect":[53,86,102,141,203],"manifests":[54],"itself":[55],"phase":[58,158,176,194],"whose":[60],"level":[61],"increases":[62],"with":[63],"continued":[65],"operation":[67],"and":[68,138],"results":[69],"voltage-controlled":[76],"oscillator":[77],"(VCO)":[78],"built":[79],"on":[80,173],"Nowadays,":[83],"is":[87,171],"particularly":[88],"evident":[89],"short-channel":[92],"devices.":[94],"Consequently,":[95],"instability":[98],"due":[99],"this":[101,111],"leads":[103],"OFDM":[106,116,135,163,188],"system":[107,136],"degradation.":[109],"In":[110],"paper,":[112],"we":[113,184],"analyze":[114],"presence":[120,199],"errors":[123],"induced":[124],"hot-carrier":[127,140,168],"effect.":[128],"We":[129,152],"derive":[130],"relationship":[132],"between":[133],"terms":[143],"a":[145,155],"crucial":[146],"parameter,":[147],"voltage.":[151],"also":[153],"present":[154],"new":[156,175,193],"general":[157],"model":[160,196],"for":[161],"systems":[164],"influenced":[165],"effect,":[169],"which":[170],"based":[172],"our":[174,182,192],"mask":[178],"function.":[179],"According":[180],"simulations,":[183],"show":[185],"bit-error-rate":[189],"evaluation":[190],"using":[191],"different":[206],"three":[208],"orders-of-magnitude":[209],"from":[210],"existing":[212],"models":[213],"independent":[214]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}