{"id":"https://openalex.org/W4412871821","doi":"https://doi.org/10.1109/tcad.2025.3590660","title":"Parallel Simulation of Radiation-Electrothermal Synergistic Effect in LDMOSFET and FinFET Devices","display_name":"Parallel Simulation of Radiation-Electrothermal Synergistic Effect in LDMOSFET and FinFET Devices","publication_year":2025,"publication_date":"2025-07-18","ids":{"openalex":"https://openalex.org/W4412871821","doi":"https://doi.org/10.1109/tcad.2025.3590660"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2025.3590660","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2025.3590660","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045883163","display_name":"Tan-Yi Li","orcid":"https://orcid.org/0000-0003-1852-098X"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tan-Yi Li","raw_affiliation_strings":["Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","College of Information Science and Electronic Engineering, Key Lab of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-1852-098X","affiliations":[{"raw_affiliation_string":"Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]},{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Key Lab of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5119011782","display_name":"Dongyan Zhao","orcid":"https://orcid.org/0000-0002-2543-1814"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongyan Zhao","raw_affiliation_strings":["Beijing Smart-Chip Microelectronics Technology Company Ltd., Beijing, China","Beijing Smart-Chip Microelectronics Technology Co. Ltd, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-2543-1814","affiliations":[{"raw_affiliation_string":"Beijing Smart-Chip Microelectronics Technology Company Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Smart-Chip Microelectronics Technology Co. Ltd, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085041756","display_name":"Nian-En Zhang","orcid":"https://orcid.org/0009-0008-8732-6164"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nian-En Zhang","raw_affiliation_strings":["Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","College of Information Science and Electronic Engineering, Key Lab of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0009-0008-8732-6164","affiliations":[{"raw_affiliation_string":"Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]},{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Key Lab of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039515108","display_name":"Hao-Xuan Zhang","orcid":"https://orcid.org/0000-0002-9844-1415"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao-Xuan Zhang","raw_affiliation_strings":["Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","College of Information Science and Electronic Engineering, Key Lab of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-9844-1415","affiliations":[{"raw_affiliation_string":"Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]},{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Key Lab of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034083498","display_name":"Yin-Da Wang","orcid":"https://orcid.org/0000-0002-9687-7303"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yin-Da Wang","raw_affiliation_strings":["Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-9687-7303","affiliations":[{"raw_affiliation_string":"Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090128261","display_name":"Guangrong Li","orcid":"https://orcid.org/0000-0001-6104-0207"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guang-Rong Li","raw_affiliation_strings":["School of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-6104-0207","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074710777","display_name":"Fang Liu","orcid":"https://orcid.org/0000-0002-0272-1181"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fang Liu","raw_affiliation_strings":["Beijing Smart-Chip Microelectronics Technology Company Ltd., Beijing, China","Beijing Smart-Chip Microelectronics Technology Co. Ltd, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Smart-Chip Microelectronics Technology Company Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Smart-Chip Microelectronics Technology Co. Ltd, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051992051","display_name":"Yingzong Liang","orcid":"https://orcid.org/0000-0003-1943-8750"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingzong Liang","raw_affiliation_strings":["Beijing Smart-Chip Microelectronics Technology Company Ltd., Beijing, China","Beijing Smart-Chip Microelectronics Technology Co. Ltd, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Smart-Chip Microelectronics Technology Company Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Smart-Chip Microelectronics Technology Co. Ltd, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082878108","display_name":"Yali Shao","orcid":"https://orcid.org/0009-0005-6287-5536"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yali Shao","raw_affiliation_strings":["Beijing Smart-Chip Microelectronics Technology Company Ltd., Beijing, China","Beijing Smart-Chip Microelectronics Technology Co. Ltd, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Smart-Chip Microelectronics Technology Company Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Smart-Chip Microelectronics Technology Co. Ltd, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017679314","display_name":"Yaxing Zhu","orcid":"https://orcid.org/0000-0002-1264-3965"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaxing Zhu","raw_affiliation_strings":["Beijing Smart-Chip Microelectronics Technology Company Ltd., Beijing, China","Beijing Smart-Chip Microelectronics Technology Co. Ltd, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Smart-Chip Microelectronics Technology Company Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Beijing Smart-Chip Microelectronics Technology Co. Ltd, Beijing, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023619721","display_name":"Hao Xie","orcid":"https://orcid.org/0000-0002-1183-8090"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Xie","raw_affiliation_strings":["Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","College of Information Science and Electronic Engineering, Key Lab of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-1183-8090","affiliations":[{"raw_affiliation_string":"Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]},{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Key Lab of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100445414","display_name":"Da\u2010Wei Wang","orcid":"https://orcid.org/0000-0001-5612-6313"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Da-Wei Wang","raw_affiliation_strings":["Innovation Center for Electronic Design Automation Technology, School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China","School of Electronics and Information, Innovation Center for Electronic Design Automation Technology, Hangzhou Dianzi University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-5612-6313","affiliations":[{"raw_affiliation_string":"Innovation Center for Electronic Design Automation Technology, School of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]},{"raw_affiliation_string":"School of Electronics and Information, Innovation Center for Electronic Design Automation Technology, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083082377","display_name":"Qiwei Zhan","orcid":"https://orcid.org/0000-0001-7500-6157"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi-Wei Zhan","raw_affiliation_strings":["Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","College of Information Science and Electronic Engineering, Key Lab of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-7500-6157","affiliations":[{"raw_affiliation_string":"Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]},{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Key Lab of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100330972","display_name":"Wen\u2010Yan Yin","orcid":"https://orcid.org/0000-0002-3714-1232"},"institutions":[{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wen-Yan Yin","raw_affiliation_strings":["Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","College of Information Science and Electronic Engineering, Key Lab of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-3714-1232","affiliations":[{"raw_affiliation_string":"Key Laboratory of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, Innovative Institute of Electromagnetic Information and Electronic Integration, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]},{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Key Lab of Electromagnetic Sensing and Control and Electronic Integration of Zhejiang Province, the Innovative Institute of Electromagnetic Information and Electronic Integration (EIEI), Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I4210124847"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":14,"corresponding_author_ids":["https://openalex.org/A5045883163"],"corresponding_institution_ids":["https://openalex.org/I4210124847"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1649714,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"45","issue":"2","first_page":"806","last_page":"817"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9828000068664551,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9765999913215637,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.6233515739440918},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4319375157356262},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3907630145549774},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38591399788856506},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37400421500205994},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3310731053352356},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.32811179757118225},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23849079012870789},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2347424328327179},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.155116468667984}],"concepts":[{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.6233515739440918},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4319375157356262},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3907630145549774},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38591399788856506},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37400421500205994},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3310731053352356},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.32811179757118225},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23849079012870789},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2347424328327179},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.155116468667984}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2025.3590660","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2025.3590660","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.49000000953674316,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G5784389425","display_name":null,"funder_award_id":"U23A20350","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1975651772","https://openalex.org/W2025211948","https://openalex.org/W2065725998","https://openalex.org/W2095148633","https://openalex.org/W2097727868","https://openalex.org/W2104288705","https://openalex.org/W2117998432","https://openalex.org/W2120172564","https://openalex.org/W2124316822","https://openalex.org/W2135686668","https://openalex.org/W2156268891","https://openalex.org/W2167188388","https://openalex.org/W2170232721","https://openalex.org/W2532981702","https://openalex.org/W2579160170","https://openalex.org/W2736029656","https://openalex.org/W2884764242","https://openalex.org/W2906583004","https://openalex.org/W2922293607","https://openalex.org/W2973418522","https://openalex.org/W2999102102","https://openalex.org/W3004135681","https://openalex.org/W3005263051","https://openalex.org/W3166995780","https://openalex.org/W3199915252","https://openalex.org/W3213679451","https://openalex.org/W4205565664","https://openalex.org/W4226494592","https://openalex.org/W4285291154","https://openalex.org/W4362563513","https://openalex.org/W4381327617","https://openalex.org/W4396831585"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2058040533","https://openalex.org/W4206001843","https://openalex.org/W4391090262","https://openalex.org/W1969282119","https://openalex.org/W2040813737","https://openalex.org/W2325576574","https://openalex.org/W2543163108","https://openalex.org/W2061040333","https://openalex.org/W2728768942"],"abstract_inverted_index":{"The":[0,69],"reliability":[1],"of":[2,17,32,61,152,172],"LDMOSFET":[3],"as":[4,6],"well":[5],"FinFET":[7],"devices":[8,174],"has":[9],"been":[10],"gaining":[11],"much":[12],"interest":[13],"in":[14,35,39,66,118],"the":[15,80,98,111,150,170],"development":[16],"various":[18],"space":[19],"electronic":[20],"systems.":[21],"There":[22],"are":[23],"high":[24],"requirements":[25],"for":[26,57,146],"nonlinear":[27,62],"computation":[28],"and":[29,84,126,137,177],"efficient":[30,181],"simulation":[31,60],"radiation-multiphysics":[33],"effects":[34,117],"these":[36,49,173],"devices,":[37],"especially":[38],"large-scale":[40],"3D":[41],"scenarios,":[42],"which":[43,88],"pose":[44],"significant":[45],"challenges.":[46],"To":[47],"address":[48],"issues,":[50],"we":[51],"propose":[52],"a":[53,133],"hybrid":[54],"numerical":[55,91,182],"method":[56,74],"massively":[58],"parallel":[59,139,147,154],"drift-diffusion":[63],"transport":[64],"processes":[65],"semiconductor":[67],"devices.":[68],"control":[70],"volume":[71],"finite":[72],"element":[73],"(CV-FEM)":[75],"is":[76,107,156],"employed":[77,108],"to":[78,109,184],"solve":[79],"Poisson,":[81],"current":[82],"continuity,":[83],"heat":[85],"conduction":[86],"equations,":[87],"shows":[89],"strong":[90],"stability":[92],"on":[93],"unstructured":[94],"meshes":[95],"compared":[96],"with":[97],"commercial":[99],"COMSOL":[100],"Multiphysics":[101],"software.":[102],"Further,":[103],"our":[104,153],"self-developed":[105],"solver":[106],"explore":[110],"total":[112],"ionizing":[113],"dose":[114],"(TID)-electrothermal":[115],"synergistic":[116,188],"step-doped":[119],"LDMOSFETs":[120],"(SD-LDMOSFETs),":[121],"high-K":[122],"dielectric":[123],"SD-LDMOSFETs":[124],"(HKSD-LDMOSFETs),":[125],"multi-fin":[127],"FinFETs":[128],"(M-FinFETs).":[129],"We":[130],"also":[131],"implement":[132],"combined":[134],"domain":[135],"decomposition":[136],"J":[138],"Adaptive":[140],"Unstructured":[141],"Mesh":[142],"applications":[143],"Infrastructure":[144],"scheme":[145],"computation,":[148],"where":[149],"scalability":[151],"algorithm":[155],"examined.":[157],"It":[158],"it":[159],"believed":[160],"that":[161],"this":[162],"study":[163],"can":[164],"offer":[165],"some":[166],"new":[167],"insights":[168],"into":[169],"behavior":[171],"under":[175],"radiation":[176],"electrothermal":[178],"coupling,":[179],"advancing":[180],"methods":[183],"simulate":[185],"diverse":[186],"radiation-electrothermal":[187],"effects.":[189]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}