{"id":"https://openalex.org/W4411019936","doi":"https://doi.org/10.1109/tcad.2025.3576314","title":"CLAPS: A Graph Clustering-Based Approach for Partial Scan Design","display_name":"CLAPS: A Graph Clustering-Based Approach for Partial Scan Design","publication_year":2025,"publication_date":"2025-06-04","ids":{"openalex":"https://openalex.org/W4411019936","doi":"https://doi.org/10.1109/tcad.2025.3576314"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2025.3576314","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2025.3576314","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113377532","display_name":"Jaeyoung Joung","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaeyoung Joung","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0000-1386-7592","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100712406","display_name":"Sangjun Lee","orcid":"https://orcid.org/0000-0002-8687-8329"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangjun Lee","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044141196","display_name":"Jongho Park","orcid":"https://orcid.org/0000-0003-3718-4352"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jongho Park","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-3718-4352","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022894814","display_name":"J Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehyun Kim","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0007-2040-8889","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112627875","display_name":"L Jung","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Laesang Jung","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068528309","display_name":"Sungho Kang","orcid":"https://orcid.org/0000-0002-7093-2095"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-7093-2095","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.7777,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.73604493,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"45","issue":"1","first_page":"396","last_page":"406"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.8158000111579895,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.8158000111579895,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.78329998254776,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12535","display_name":"Machine Learning and Data Classification","score":0.7092999815940857,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.5773217678070068},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5055480003356934},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.5037848353385925},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.33548352122306824},{"id":"https://openalex.org/keywords/information-retrieval","display_name":"Information retrieval","score":0.3306601047515869},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2643025517463684},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.19825252890586853}],"concepts":[{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.5773217678070068},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5055480003356934},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.5037848353385925},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.33548352122306824},{"id":"https://openalex.org/C23123220","wikidata":"https://www.wikidata.org/wiki/Q816826","display_name":"Information retrieval","level":1,"score":0.3306601047515869},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2643025517463684},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.19825252890586853}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2025.3576314","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2025.3576314","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G617143367","display_name":null,"funder_award_id":"IO240301-09144-01","funder_id":"https://openalex.org/F4320332195","funder_display_name":"Samsung"}],"funders":[{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1598818557","https://openalex.org/W1873259207","https://openalex.org/W1910876692","https://openalex.org/W1972173228","https://openalex.org/W1977294468","https://openalex.org/W1983621102","https://openalex.org/W2002850151","https://openalex.org/W2004007251","https://openalex.org/W2080818541","https://openalex.org/W2098300587","https://openalex.org/W2106669085","https://openalex.org/W2114962199","https://openalex.org/W2116254096","https://openalex.org/W2124618076","https://openalex.org/W2134283834","https://openalex.org/W2135129887","https://openalex.org/W2135665388","https://openalex.org/W2136647665","https://openalex.org/W2140826730","https://openalex.org/W2147517890","https://openalex.org/W2152406824","https://openalex.org/W2156643581","https://openalex.org/W2160162958","https://openalex.org/W2738780584","https://openalex.org/W3014325818","https://openalex.org/W4231945611","https://openalex.org/W4312343488"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W4391375266","https://openalex.org/W1979597421","https://openalex.org/W2007980826","https://openalex.org/W2061531152","https://openalex.org/W3002753104","https://openalex.org/W2077600819","https://openalex.org/W2142036596","https://openalex.org/W2072657027"],"abstract_inverted_index":{"Scan":[0,116],"is":[1,86],"one":[2],"of":[3,62,74,101,146,159,165,192],"the":[4,17,43,60,72,91,99,108,135,137,143,163,172],"representative":[5],"Design":[6],"for":[7],"Testability":[8],"(DFT)":[9],"techniques":[10],"designed":[11],"to":[12,42,45,88,123,199],"test":[13,126,193],"sequential":[14,125],"circuits.":[15,76],"However,":[16,49],"additional":[18],"hardware":[19],"overhead":[20],"and":[21,67,97,129,182],"performance":[22],"degradation":[23],"caused":[24,93],"by":[25,94,186],"scan":[26,35,44,84,95,184,201],"insertion":[27,96],"can":[28,154],"be":[29,155],"unacceptable":[30],"in":[31,149,180],"specific":[32],"designs.":[33],"Partial":[34],"has":[36],"been":[37],"applied":[38,157],"as":[39],"an":[40],"alternative":[41],"balance":[46],"these":[47],"issues.":[48],"previous":[50],"cell":[51],"selection":[52],"algorithms":[53],"accompany":[54],"high":[55],"computational":[56],"complexity":[57,128,144],"depending":[58],"on":[59,196],"number":[61,164],"circuit":[63,109,160],"components":[64],"including":[65],"flip-flops,":[66],"do":[68],"not":[69,140],"sufficiently":[70],"consider":[71],"analysis":[73,148],"large-scale":[75,150],"In":[77],"this":[78],"paper,":[79],"a":[80],"graph":[81,114],"theory-based":[82],"partial":[83],"approach":[85,139],"proposed":[87,105,138,173],"effectively":[89],"address":[90],"issues":[92],"reduce":[98,124],"load":[100],"structural":[102,147],"analysis.":[103],"The":[104,167],"algorithm":[106,174],"partitions":[107],"into":[110],"multiple":[111],"portions":[112],"using":[113],"clustering.":[115],"cells":[117,185],"are":[118],"selected":[119],"from":[120],"each":[121],"subgraph":[122],"generation":[127],"improve":[130],"testability.":[131],"By":[132],"partially":[133],"analyzing":[134],"circuit,":[136],"only":[141,190],"addresses":[142],"problem":[145],"circuits":[151],"but":[152],"also":[153],"generally":[156],"regardless":[158],"size":[161],"or":[162],"components.":[166],"experimental":[168],"results":[169],"show":[170],"that":[171],"achieves":[175],"significantly":[176],"reduced":[177],"processing":[178],"time":[179],"seconds":[181],"reduces":[183],"approximately":[187],"11.47%":[188],"with":[189],"0.21%":[191],"coverage":[194],"loss":[195],"average":[197],"compared":[198],"full":[200],"design.":[202]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-01-08T20:05:33.558190","created_date":"2025-10-10T00:00:00"}