{"id":"https://openalex.org/W4408223248","doi":"https://doi.org/10.1109/tcad.2025.3549352","title":"Multistage Enhanced Diagnosis With Fault Candidate Reduction","display_name":"Multistage Enhanced Diagnosis With Fault Candidate Reduction","publication_year":2025,"publication_date":"2025-03-07","ids":{"openalex":"https://openalex.org/W4408223248","doi":"https://doi.org/10.1109/tcad.2025.3549352"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2025.3549352","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2025.3549352","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004877843","display_name":"Hyojoon Yun","orcid":"https://orcid.org/0009-0007-6443-5918"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyojun Yun","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0007-6443-5918","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010275772","display_name":"Hyeonchan Lim","orcid":"https://orcid.org/0009-0000-8331-7684"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyeonchan Lim","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0000-8331-7684","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100782289","display_name":"Hayoung Lee","orcid":"https://orcid.org/0000-0002-6868-0829"},"institutions":[{"id":"https://openalex.org/I57664883","display_name":"Ajou University","ror":"https://ror.org/03tzb2h73","country_code":"KR","type":"education","lineage":["https://openalex.org/I57664883"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hayoung Lee","raw_affiliation_strings":["Department of Intelligence Semiconductor Engineering, Ajou University, Suwon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-6868-0829","affiliations":[{"raw_affiliation_string":"Department of Intelligence Semiconductor Engineering, Ajou University, Suwon, South Korea","institution_ids":["https://openalex.org/I57664883"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068528309","display_name":"Sungho Kang","orcid":"https://orcid.org/0000-0002-7093-2095"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-7093-2095","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03762539,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"44","issue":"9","first_page":"3648","last_page":"3652"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9332000017166138,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stage","display_name":"Stage (stratigraphy)","score":0.7545290589332581},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6744689345359802},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4390740692615509},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4251219928264618},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.1827700138092041},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1739971935749054},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.09557253122329712},{"id":"https://openalex.org/keywords/paleontology","display_name":"Paleontology","score":0.056185007095336914}],"concepts":[{"id":"https://openalex.org/C146357865","wikidata":"https://www.wikidata.org/wiki/Q1123245","display_name":"Stage (stratigraphy)","level":2,"score":0.7545290589332581},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6744689345359802},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4390740692615509},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4251219928264618},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.1827700138092041},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1739971935749054},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.09557253122329712},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.056185007095336914},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2025.3549352","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2025.3549352","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.7799999713897705}],"awards":[{"id":"https://openalex.org/G5796395378","display_name":null,"funder_award_id":"1415180306","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"}],"funders":[{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1974422688","https://openalex.org/W2044299352","https://openalex.org/W2146990954","https://openalex.org/W2152489029","https://openalex.org/W2521254966","https://openalex.org/W4236438862","https://openalex.org/W4388966730"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"Logic":[0],"diagnosis":[1,11,30,76,88],"is":[2,68,80,99,107,115],"essential":[3],"for":[4,65,127,138,151],"improving":[5],"reliability":[6],"and":[7,22,113,149],"yield.":[8],"In":[9,101],"conventional":[10],"methods,":[12],"although":[13],"various":[14],"methods":[15],"are":[16,28,38],"proposed":[17,103,124],"to":[18,72],"enhance":[19],"the":[20,33,60,75,102,118,128,135],"accuracy":[21,148],"resolution":[23,150],"of":[24,36,49,62,77,120,130],"logic":[25,42],"diagnosis,":[26],"there":[27],"still":[29],"results":[31],"where":[32],"reported":[34],"locations":[35],"defects":[37],"incorrect.":[39],"Particularly":[40],"in":[41],"circuits,":[43],"which":[44],"contain":[45],"a":[46,86,92],"large":[47],"number":[48,61],"gates,":[50],"multiple":[51,66,78,131],"faults":[52,67,79,132],"can":[53,145],"occur,":[54],"not":[55],"just":[56],"single":[57,73,139],"faults.":[58,153],"Since":[59],"possible":[63],"cases":[64],"significantly":[69],"greater":[70],"compared":[71],"faults,":[74,140],"complicated.":[81],"To":[82],"address":[83],"this":[84,143],"problem,":[85],"new":[87],"method":[89,125,144],"that":[90,142],"uses":[91],"multistage":[93],"process":[94],"with":[95,109],"fault":[96,110],"candidate":[97,111],"reduction":[98],"proposed.":[100],"method,":[104],"machine":[105,121],"learning":[106],"used":[108],"reduction,":[112],"post-processing":[114],"performed":[116],"after":[117],"use":[119],"learning.":[122],"This":[123],"allows":[126],"analysis":[129],"using":[133],"only":[134],"test":[136],"responses":[137],"demonstrating":[141],"maintain":[146],"sufficient":[147],"unexpected":[152]},"counts_by_year":[],"updated_date":"2025-12-22T23:10:17.713674","created_date":"2025-10-10T00:00:00"}