{"id":"https://openalex.org/W4406523414","doi":"https://doi.org/10.1109/tcad.2025.3531337","title":"Bayesian Learning-Enhanced Embedded Memory Design With Automated Circuit Variant Generation","display_name":"Bayesian Learning-Enhanced Embedded Memory Design With Automated Circuit Variant Generation","publication_year":2025,"publication_date":"2025-01-17","ids":{"openalex":"https://openalex.org/W4406523414","doi":"https://doi.org/10.1109/tcad.2025.3531337"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2025.3531337","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2025.3531337","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100520759","display_name":"Dong-Ho Kim","orcid":"https://orcid.org/0009-0004-5146-825X"},"institutions":[{"id":"https://openalex.org/I161024014","display_name":"Kwangwoon University","ror":"https://ror.org/02e9zc863","country_code":"KR","type":"education","lineage":["https://openalex.org/I161024014"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dongho Kim","raw_affiliation_strings":["Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0004-5146-825X","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea","institution_ids":["https://openalex.org/I161024014"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013475600","display_name":"Junseo Lee","orcid":"https://orcid.org/0000-0002-3302-1436"},"institutions":[{"id":"https://openalex.org/I161024014","display_name":"Kwangwoon University","ror":"https://ror.org/02e9zc863","country_code":"KR","type":"education","lineage":["https://openalex.org/I161024014"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Junseo Lee","raw_affiliation_strings":["Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-3302-1436","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea","institution_ids":["https://openalex.org/I161024014"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Seokhun Kim","orcid":"https://orcid.org/0009-0005-4171-4987"},"institutions":[{"id":"https://openalex.org/I161024014","display_name":"Kwangwoon University","ror":"https://ror.org/02e9zc863","country_code":"KR","type":"education","lineage":["https://openalex.org/I161024014"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seokhun Kim","raw_affiliation_strings":["Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0005-4171-4987","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea","institution_ids":["https://openalex.org/I161024014"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056380142","display_name":"Jihwan Park","orcid":"https://orcid.org/0000-0002-7298-653X"},"institutions":[{"id":"https://openalex.org/I161024014","display_name":"Kwangwoon University","ror":"https://ror.org/02e9zc863","country_code":"KR","type":"education","lineage":["https://openalex.org/I161024014"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jihwan Park","raw_affiliation_strings":["Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-7298-653X","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea","institution_ids":["https://openalex.org/I161024014"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012271077","display_name":"Sangheon Lee","orcid":"https://orcid.org/0000-0002-1491-0625"},"institutions":[{"id":"https://openalex.org/I161024014","display_name":"Kwangwoon University","ror":"https://ror.org/02e9zc863","country_code":"KR","type":"education","lineage":["https://openalex.org/I161024014"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangheon Lee","raw_affiliation_strings":["Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-1491-0625","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea","institution_ids":["https://openalex.org/I161024014"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108522065","display_name":"Hanwool Jeong","orcid":null},"institutions":[{"id":"https://openalex.org/I161024014","display_name":"Kwangwoon University","ror":"https://ror.org/02e9zc863","country_code":"KR","type":"education","lineage":["https://openalex.org/I161024014"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hanwool Jeong","raw_affiliation_strings":["Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-7346-6739","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea","institution_ids":["https://openalex.org/I161024014"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.00579563,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"44","issue":"8","first_page":"3099","last_page":"3111"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9861000180244446,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9861000180244446,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12535","display_name":"Machine Learning and Data Classification","score":0.949999988079071,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9447000026702881,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6067565083503723},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.5403751134872437},{"id":"https://openalex.org/keywords/bayesian-optimization","display_name":"Bayesian optimization","score":0.5141861438751221},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.5085278749465942},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.48723092675209045},{"id":"https://openalex.org/keywords/bayesian-network","display_name":"Bayesian network","score":0.4429113268852234},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.437541127204895},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4174852967262268},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3315116763114929}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6067565083503723},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.5403751134872437},{"id":"https://openalex.org/C2778049539","wikidata":"https://www.wikidata.org/wiki/Q17002908","display_name":"Bayesian optimization","level":2,"score":0.5141861438751221},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.5085278749465942},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.48723092675209045},{"id":"https://openalex.org/C33724603","wikidata":"https://www.wikidata.org/wiki/Q812540","display_name":"Bayesian network","level":2,"score":0.4429113268852234},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.437541127204895},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4174852967262268},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3315116763114929}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2025.3531337","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2025.3531337","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6600000262260437,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G2964706983","display_name":null,"funder_award_id":"SRFC-IT2102-06","funder_id":"https://openalex.org/F4320332195","funder_display_name":"Samsung"}],"funders":[{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1502922572","https://openalex.org/W2014357578","https://openalex.org/W2038193917","https://openalex.org/W2162613878","https://openalex.org/W2172203429","https://openalex.org/W2198948050","https://openalex.org/W2368587440","https://openalex.org/W2475655475","https://openalex.org/W2543153005","https://openalex.org/W2626010172","https://openalex.org/W3013336438","https://openalex.org/W3036532492","https://openalex.org/W3121642476","https://openalex.org/W3127407055","https://openalex.org/W3149279458","https://openalex.org/W3185898267","https://openalex.org/W3213817780","https://openalex.org/W4386764902","https://openalex.org/W4386765017","https://openalex.org/W4386765237","https://openalex.org/W4386869565","https://openalex.org/W6675200109","https://openalex.org/W6767972373"],"related_works":["https://openalex.org/W3106461837","https://openalex.org/W4283700523","https://openalex.org/W3168182983","https://openalex.org/W4387079005","https://openalex.org/W4321472004","https://openalex.org/W4221166418","https://openalex.org/W2968265130","https://openalex.org/W2973085194","https://openalex.org/W3117893869","https://openalex.org/W4401858220"],"abstract_inverted_index":{"This":[0],"article":[1],"proposes":[2],"a":[3,39,46,149],"Bayesian":[4,79],"learning":[5],"driven":[6],"automated":[7],"embedded":[8],"memory":[9],"design":[10,43,69,112],"methodology":[11,123],"that":[12,37],"aims":[13],"to":[14,44,85,92,108,144],"minimize":[15,18],"leakage":[16,139],"current,":[17],"power,":[19],"and":[20,51,58,99,138],"maximize":[21],"performance":[22],"while":[23,65],"meeting":[24],"predefined":[25],"constraints.":[26],"To":[27],"achieve":[28],"this":[29],"objective":[30],"effectively,":[31],"we":[32],"present":[33],"an":[34],"automatic":[35],"tool":[36],"leverages":[38],"reference":[40],"initial":[41],"circuit":[42,56,76,88,97],"generate":[45],"diverse":[47],"set":[48],"of":[49,75,151],"schematic":[50],"layout":[52],"options":[53,77],"for":[54],"logic-equivalent":[55],"variants":[57],"various":[59],"transistor":[60,101],"threshold":[61],"voltage":[62],"(Vth)":[63],"modifications,":[64],"ensuring":[66],"compliance":[67],"with":[68,148],"rules.":[70],"Subsequently,":[71],"leveraging":[72],"the":[73,94,110,121,145],"range":[74],"generated,":[78],"optimization":[80],"is":[81],"employed":[82],"not":[83],"only":[84],"identify":[86],"optimal":[87],"parameters":[89],"but":[90],"also":[91],"select":[93],"most":[95],"appropriate":[96],"topology":[98],"individual":[100],"<inline-formula":[102,128],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[103,129],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[104,130],"<tex-math":[105,131],"notation=\"LaTeX\">$V_{th}$":[106],"</tex-math></inline-formula>":[107,135],"attain":[109],"desired":[111],"objectives.":[113],"TSMC":[114],"28":[115],"nm":[116],"process":[117],"simulation":[118],"results":[119],"demonstrate":[120],"proposed":[122],"reducing":[124],"power":[125],"by":[126,136,141],"26.28%\u201346.44%,":[127],"notation=\"LaTeX\">$T_{\\mathrm":[132],"{":[133],"access}}$":[134],"25.60%\u201342.29%,":[137],"current":[140],"22.73%\u201350.11%":[142],"compared":[143],"compiler-generated":[146],"design,":[147],"runtime":[150],"10\u201340":[152],"h.":[153]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}