{"id":"https://openalex.org/W4405023036","doi":"https://doi.org/10.1109/tcad.2024.3511335","title":"HALTRAV: Design of a High-Performance and Area-Efficient Latch With Triple-Node-Upset Recovery and Algorithm-Based Verifications","display_name":"HALTRAV: Design of a High-Performance and Area-Efficient Latch With Triple-Node-Upset Recovery and Algorithm-Based Verifications","publication_year":2024,"publication_date":"2024-12-04","ids":{"openalex":"https://openalex.org/W4405023036","doi":"https://doi.org/10.1109/tcad.2024.3511335"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2024.3511335","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2024.3511335","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04954952v1/document","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Xing Guo","orcid":"https://orcid.org/0000-0003-4257-2288"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Guo","raw_affiliation_strings":["School of Computer Science and Technology, Anhui University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-4257-2288","affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101630605","display_name":"Jiajia Zhang","orcid":"https://orcid.org/0000-0002-9362-4060"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiajia Zhang","raw_affiliation_strings":["School of Computer Science and Technology, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071271798","display_name":"Meng Xu","orcid":"https://orcid.org/0000-0002-1587-3096"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xu Meng","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-1587-3096","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046371899","display_name":"Zhenmin Li","orcid":"https://orcid.org/0000-0001-9920-2435"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenmin Li","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-9920-2435","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Department of Computer Science and Networks, Kyushu Institute of Technology, Fukuoka, Japan"],"raw_orcid":"https://orcid.org/0000-0001-8305-604X","affiliations":[{"raw_affiliation_string":"Department of Computer Science and Networks, Kyushu Institute of Technology, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Patrick Girard","raw_affiliation_strings":["Laboratory of Informatics, Robotics and Microelectronics of Montpellier, University of Montpellier/CNRS, Montpellier, France"],"raw_orcid":"https://orcid.org/0000-0003-0722-8772","affiliations":[{"raw_affiliation_string":"Laboratory of Informatics, Robotics and Microelectronics of Montpellier, University of Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I4210101743","https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115593017","display_name":"Bin Liang","orcid":null},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Liang","raw_affiliation_strings":["College of Computer Science and Technology, National University of Defense Technology, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer Science and Technology, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072439444","display_name":"Aibin Yan","orcid":"https://orcid.org/0000-0003-0024-987X"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]},{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aibin Yan","raw_affiliation_strings":["School of Computer Science and Technology, Anhui University, Hefei, China","School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-0024-987X","affiliations":[{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":15.2283,"has_fulltext":true,"cited_by_count":46,"citation_normalized_percentile":{"value":0.99692308,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"44","issue":"6","first_page":"2367","last_page":"2377"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9891999959945679,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.8224759101867676},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5912204384803772},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5572333931922913},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5047134160995483},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.34250324964523315},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.340320348739624},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.192513108253479},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16282010078430176},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.0571514368057251}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.8224759101867676},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5912204384803772},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5572333931922913},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5047134160995483},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.34250324964523315},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.340320348739624},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.192513108253479},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16282010078430176},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0571514368057251},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcad.2024.3511335","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2024.3511335","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},{"id":"pmh:oai:HAL:lirmm-04954952v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04954952","pdf_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04954952v1/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2025, 44 (6), pp.2367-2377. ⟨10.1109/TCAD.2024.3511335⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:HAL:lirmm-04954952v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04954952","pdf_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-04954952v1/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2025, 44 (6), pp.2367-2377. ⟨10.1109/TCAD.2024.3511335⟩","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5899999737739563,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2747975400","display_name":null,"funder_award_id":"62027815","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4505544967","display_name":null,"funder_award_id":"2022AH020014","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4949740588","display_name":null,"funder_award_id":"62111540164","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4405023036.pdf","grobid_xml":"https://content.openalex.org/works/W4405023036.grobid-xml"},"referenced_works_count":26,"referenced_works":["https://openalex.org/W1659671481","https://openalex.org/W2015524290","https://openalex.org/W2277435279","https://openalex.org/W2558274594","https://openalex.org/W2613938152","https://openalex.org/W2769731910","https://openalex.org/W2784261945","https://openalex.org/W2923710620","https://openalex.org/W2945902746","https://openalex.org/W2954322948","https://openalex.org/W2971710811","https://openalex.org/W3000209635","https://openalex.org/W3008392074","https://openalex.org/W3091404708","https://openalex.org/W3097826648","https://openalex.org/W3155037334","https://openalex.org/W4213416064","https://openalex.org/W4280650494","https://openalex.org/W4281611099","https://openalex.org/W4308474872","https://openalex.org/W4308544387","https://openalex.org/W4312361274","https://openalex.org/W4312546227","https://openalex.org/W4320170196","https://openalex.org/W4389987532","https://openalex.org/W4391468691"],"related_works":["https://openalex.org/W2028180791","https://openalex.org/W607682241","https://openalex.org/W320153218","https://openalex.org/W2352434195","https://openalex.org/W2619155","https://openalex.org/W2361293896","https://openalex.org/W1968403090","https://openalex.org/W3205431322","https://openalex.org/W4200618691","https://openalex.org/W2001819439"],"abstract_inverted_index":{"With":[0],"the":[1,63,89,96,102,131,147,153,156],"rapid":[2],"advancement":[3],"of":[4,42,45,91,104,133,150,155],"semiconductor":[5],"technologies,":[6],"latches":[7,70,139],"become":[8],"increasingly":[9],"sensitive":[10],"to":[11,137,152],"soft":[12],"errors,":[13],"especially":[14],"triple":[15],"node":[16],"upsets":[17],"(TNUs),":[18],"in":[19,117],"harsh":[20],"radiation":[21],"environments.":[22],"In":[23],"this":[24],"article,":[25],"we":[26,78],"first":[27],"propose":[28,80],"a":[29],"high-performance":[30],"and":[31,58,106,114,120,159],"area-efficient":[32],"latch,":[33],"namely,":[34],"HALTRAV,":[35],"featuring":[36],"complete":[37,53],"TNU-recovery.":[38],"The":[39],"storage":[40],"portion":[41],"HALTRAV":[43,105,110,151],"consists":[44],"28":[46],"interlocked":[47],"source-drain":[48],"cross-coupled":[49],"inverters":[50],"(SCIs)":[51],"for":[52,68],"TNU-recovery":[54,103],"with":[55],"area":[56],"efficiency":[57],"low":[59],"delay.":[60],"To":[61],"mitigate":[62],"issue":[64],"that":[65,85,109,140],"node-upset-recovery":[66,90],"verifications":[67],"existing":[69],"highly":[71],"relies":[72],"on":[73,124],"electronic":[74],"design":[75],"automation":[76],"tools,":[77],"further":[79],"an":[81],"algorithm-based":[82],"verification":[83],"method":[84],"can":[86],"automatically":[87],"verify":[88],"latches,":[92],"which":[93],"greatly":[94],"simplifies":[95],"reliability-verification":[97],"flow.":[98],"Simulation":[99],"results":[100,144],"demonstrate":[101,146],"also":[107,145],"show":[108],"achieves":[111],"40.38%,":[112],"8.17%,":[113],"31.89%":[115],"reduction":[116],"delay,":[118],"area,":[119],"delay-power\u2013area":[121],"product":[122],"(DPAP)":[123],"average,":[125],"respectively;":[126],"however;":[127],"it":[128],"is":[129],"at":[130],"cost":[132],"power":[134],"as":[135],"compared":[136],"typical":[138],"are":[141],"TNU-recoverable.":[142],"Comparison":[143],"moderate":[148],"sensitivity":[149],"impacts":[154],"process,":[157],"voltage,":[158],"temperature":[160],"(PVT)":[161],"variations.":[162]},"counts_by_year":[{"year":2026,"cited_by_count":35},{"year":2025,"cited_by_count":11}],"updated_date":"2026-07-21T08:15:58.654021","created_date":"2025-10-10T00:00:00"}