{"id":"https://openalex.org/W4404371702","doi":"https://doi.org/10.1109/tcad.2024.3499903","title":"A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM","display_name":"A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM","publication_year":2024,"publication_date":"2024-11-14","ids":{"openalex":"https://openalex.org/W4404371702","doi":"https://doi.org/10.1109/tcad.2024.3499903"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2024.3499903","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2024.3499903","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5105684348","display_name":"J. Yoon","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joonsik Yoon","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0009-7416-2639","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100782289","display_name":"Hayoung Lee","orcid":"https://orcid.org/0000-0002-6868-0829"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},{"id":"https://openalex.org/I57664883","display_name":"Ajou University","ror":"https://ror.org/03tzb2h73","country_code":"KR","type":"education","lineage":["https://openalex.org/I57664883"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hayoung Lee","raw_affiliation_strings":["Department of Intelligence Semiconductor Engineering, Ajou University, Suwon, Gyeonggi, South Korea","Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-6868-0829","affiliations":[{"raw_affiliation_string":"Department of Intelligence Semiconductor Engineering, Ajou University, Suwon, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I57664883"]},{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079951532","display_name":"Youngki Moon","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngki Moon","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0001-4264-4803","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114585267","display_name":"Seung Ho Shin","orcid":"https://orcid.org/0009-0002-1153-0034"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung Ho Shin","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0002-1153-0034","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068528309","display_name":"Sungho Kang","orcid":"https://orcid.org/0000-0002-7093-2095"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-7093-2095","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6083,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.60975342,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"44","issue":"5","first_page":"2014","last_page":"2025"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9732999801635742,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9732999801635742,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9401000142097473,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9171000123023987,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5151275396347046},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4664674997329712},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4556863307952881},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2550086975097656},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.07992488145828247},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.06525459885597229}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5151275396347046},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4664674997329712},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4556863307952881},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2550086975097656},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.07992488145828247},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.06525459885597229}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2024.3499903","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2024.3499903","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.6200000047683716}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1984875683","https://openalex.org/W2004229053","https://openalex.org/W2062143991","https://openalex.org/W2081200720","https://openalex.org/W2082375193","https://openalex.org/W2086936129","https://openalex.org/W2098987953","https://openalex.org/W2109945377","https://openalex.org/W2110902223","https://openalex.org/W2119482888","https://openalex.org/W2132584944","https://openalex.org/W2136323667","https://openalex.org/W2139254411","https://openalex.org/W2152425525","https://openalex.org/W2155640457","https://openalex.org/W2179691660","https://openalex.org/W2519910949","https://openalex.org/W2531632794","https://openalex.org/W2546503017","https://openalex.org/W2564353128","https://openalex.org/W2587784056","https://openalex.org/W2622148586","https://openalex.org/W2760338732","https://openalex.org/W2762908080","https://openalex.org/W2789385241","https://openalex.org/W2954055522","https://openalex.org/W2995036598","https://openalex.org/W3123810022","https://openalex.org/W3165551765","https://openalex.org/W4225865409","https://openalex.org/W4235914240","https://openalex.org/W4249672558","https://openalex.org/W4292261931","https://openalex.org/W4313546932","https://openalex.org/W4392746501"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"High":[0],"bandwidth":[1],"memory":[2,9,36,44,61,139],"(HBM)":[3],"represents":[4],"a":[5,59,73,90,114],"significant":[6],"advancement":[7],"in":[8,66],"technology,":[10],"requiring":[11],"quick":[12],"and":[13,25,32,41,55,69,82,93,112,152],"accurate":[14],"data":[15,39],"processing.":[16],"Built-in":[17],"self-repair":[18],"(BISR)":[19],"is":[20],"crucial":[21],"for":[22,98],"ensuring":[23],"high-capacity":[24],"reliable":[26],"memories,":[27],"as":[28,138],"it":[29],"automatically":[30],"detects":[31],"repairs":[33],"faults":[34],"within":[35],"systems,":[37],"preventing":[38],"loss":[40],"enhancing":[42],"overall":[43,148],"reliability.":[45],"The":[46],"proposed":[47,107,132,144],"BISR":[48,108,145,151],"aims":[49],"to":[50],"enhance":[51],"the":[52,106,120,131,135,143,147,153],"repair":[53,100,110,116],"rate":[54],"reliability":[56,154],"by":[57,85],"using":[58],"content-addressable":[60],"structure":[62],"that":[63,105,130],"operates":[64],"effectively":[65],"both":[67,79],"offline":[68],"online":[70],"modes.":[71],"Furthermore,":[72],"new":[74],"redundancy":[75],"analysis":[76,80],"algorithm":[77],"reduces":[78,134],"time":[81],"area":[83,136],"overhead":[84,137],"converting":[86],"fault":[87],"information":[88],"into":[89],"matrix":[91],"format":[92],"focusing":[94],"on":[95],"fault-free":[96],"areas":[97],"each":[99],"solution.":[101],"Experimental":[102],"results":[103],"demonstrate":[104],"improves":[109],"rates":[111],"derives":[113],"final":[115],"solution":[117],"immediately":[118],"after":[119],"test":[121],"sequences":[122],"are":[123],"completed.":[124],"Moreover,":[125],"hardware":[126],"comparisons":[127],"have":[128],"shown":[129],"approach":[133],"size":[140],"increases.":[141],"Consequently,":[142],"enhances":[146],"performance":[149],"of":[150,155],"HBM.":[156]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}