{"id":"https://openalex.org/W4404101387","doi":"https://doi.org/10.1109/tcad.2024.3443006","title":"ROI-HIT: Region of Interest-Driven High-Dimensional Microarchitecture Design Space Exploration","display_name":"ROI-HIT: Region of Interest-Driven High-Dimensional Microarchitecture Design Space Exploration","publication_year":2024,"publication_date":"2024-11-01","ids":{"openalex":"https://openalex.org/W4404101387","doi":"https://doi.org/10.1109/tcad.2024.3443006"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2024.3443006","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2024.3443006","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108811434","display_name":"Xiaolan Zhao","orcid":"https://orcid.org/0000-0001-8977-2725"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuyang Zhao","raw_affiliation_strings":["School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-8977-2725","affiliations":[{"raw_affiliation_string":"School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018804085","display_name":"Tianning Gao","orcid":"https://orcid.org/0000-0001-7916-4494"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tianning Gao","raw_affiliation_strings":["Department of Electrical Engineering, University of Texas at Dallas, Dallas, TX, USA"],"raw_orcid":"https://orcid.org/0000-0001-7916-4494","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Texas at Dallas, Dallas, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101567596","display_name":"Aidong Zhao","orcid":"https://orcid.org/0000-0003-3512-0320"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aidong Zhao","raw_affiliation_strings":["School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0003-3512-0320","affiliations":[{"raw_affiliation_string":"School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039204202","display_name":"Zhaori Bi","orcid":"https://orcid.org/0000-0002-7315-3150"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaori Bi","raw_affiliation_strings":["School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-7315-3150","affiliations":[{"raw_affiliation_string":"School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037328458","display_name":"Changhao Yan","orcid":"https://orcid.org/0000-0002-8936-3945"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changhao Yan","raw_affiliation_strings":["School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-8936-3945","affiliations":[{"raw_affiliation_string":"School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045464812","display_name":"Fan Yang","orcid":"https://orcid.org/0000-0003-2164-8175"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Yang","raw_affiliation_strings":["School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0003-2164-8175","affiliations":[{"raw_affiliation_string":"School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021251855","display_name":"Sheng\u2010Guo Wang","orcid":"https://orcid.org/0000-0001-6101-675X"},"institutions":[{"id":"https://openalex.org/I102149020","display_name":"University of North Carolina at Charlotte","ror":"https://ror.org/04dawnj30","country_code":"US","type":"education","lineage":["https://openalex.org/I102149020"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"Sheng-Guo Wang","raw_affiliation_strings":["School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","College of Engineering, The University of North Carolina at Charlotte, Charlotte, NC, USA"],"raw_orcid":"https://orcid.org/0000-0001-6101-675X","affiliations":[{"raw_affiliation_string":"School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]},{"raw_affiliation_string":"College of Engineering, The University of North Carolina at Charlotte, Charlotte, NC, USA","institution_ids":["https://openalex.org/I102149020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054960059","display_name":"Dian Zhou","orcid":"https://orcid.org/0000-0002-2648-5232"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"Dian Zhou","raw_affiliation_strings":["School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","Department of Electrical Engineering, University of Texas at Dallas, Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]},{"raw_affiliation_string":"Department of Electrical Engineering, University of Texas at Dallas, Dallas, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064213921","display_name":"Xuan Zeng","orcid":"https://orcid.org/0000-0002-8097-4053"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuan Zeng","raw_affiliation_strings":["School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-8097-4053","affiliations":[{"raw_affiliation_string":"School of Microelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.831,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.87030221,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"43","issue":"11","first_page":"4178","last_page":"4189"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9821000099182129,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9821000099182129,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","score":0.9186000227928162,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microarchitecture","display_name":"Microarchitecture","score":0.7406901121139526},{"id":"https://openalex.org/keywords/space","display_name":"Space (punctuation)","score":0.5915840864181519},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5261107087135315},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.33896762132644653},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3282333016395569},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.19876143336296082},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08251580595970154}],"concepts":[{"id":"https://openalex.org/C107598950","wikidata":"https://www.wikidata.org/wiki/Q259864","display_name":"Microarchitecture","level":2,"score":0.7406901121139526},{"id":"https://openalex.org/C2778572836","wikidata":"https://www.wikidata.org/wiki/Q380933","display_name":"Space (punctuation)","level":2,"score":0.5915840864181519},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5261107087135315},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.33896762132644653},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3282333016395569},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.19876143336296082},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08251580595970154}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2024.3443006","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2024.3443006","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3495785756","display_name":null,"funder_award_id":"92373207","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5071938314","display_name":null,"funder_award_id":"62141407","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6135847747","display_name":null,"funder_award_id":"62304052","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1480330138","https://openalex.org/W1502922572","https://openalex.org/W1977899896","https://openalex.org/W1983394510","https://openalex.org/W1990517717","https://openalex.org/W2079810998","https://openalex.org/W2126105956","https://openalex.org/W2136918060","https://openalex.org/W2143381319","https://openalex.org/W2147657366","https://openalex.org/W2346205343","https://openalex.org/W2551048680","https://openalex.org/W2588464298","https://openalex.org/W3023052894","https://openalex.org/W3027968530","https://openalex.org/W4200520905","https://openalex.org/W4212774754","https://openalex.org/W4293024064","https://openalex.org/W4378218479","https://openalex.org/W4386764824","https://openalex.org/W6766900132","https://openalex.org/W6795637285","https://openalex.org/W6801501157","https://openalex.org/W6845734913","https://openalex.org/W6850826703","https://openalex.org/W6987020231","https://openalex.org/W7055119176"],"related_works":["https://openalex.org/W122453572","https://openalex.org/W2351011383","https://openalex.org/W2146879484","https://openalex.org/W4221002079","https://openalex.org/W1757458251","https://openalex.org/W1980898636","https://openalex.org/W2141090099","https://openalex.org/W2045325972","https://openalex.org/W3008777550","https://openalex.org/W4302312371"],"abstract_inverted_index":{"Exploring":[0],"the":[1,12,15,20,37,42,45,51,67,74,99,102,114,122],"design":[2,17,47,68,78,94],"space":[3,18,48,69],"of":[4,14,30,77,124,130],"RISC-V":[5],"processors":[6],"faces":[7],"significant":[8],"challenges":[9],"due":[10],"to":[11,40,65,91,111,132,145],"vastness":[13],"high-dimensional":[16],"and":[19,49,96,140],"associated":[21],"expensive":[22],"simulation":[23],"costs.":[24],"This":[25],"work":[26],"proposes":[27],"a":[28,80,86],"region":[29],"interest":[31],"(ROI)-driven":[32],"method,":[33,127],"which":[34],"focuses":[35],"on":[36,44,58,85],"promising":[38],"ROIs":[39],"reduce":[41,73],"over-exploration":[43],"huge":[46],"improve":[50],"optimization":[52],"efficiency.":[53],"A":[54],"tree":[55],"structure":[56],"based":[57,84],"self-organizing":[59],"map":[60],"(SOM)":[61],"networks":[62],"is":[63,89,109],"proposed":[64,126],"partition":[66],"into":[70],"ROIs.":[71,103],"To":[72],"high":[75],"dimensionality":[76],"space,":[79],"variable":[81],"selection":[82],"technique":[83],"sensitivity":[87],"matrix":[88],"developed":[90],"prune":[92],"unimportant":[93],"parameters":[95],"efficiently":[97],"hit":[98],"optimum":[100],"inside":[101],"Moreover,":[104],"an":[105],"asynchronous":[106],"parallel":[107],"strategy":[108],"employed":[110],"further":[112],"save":[113],"time":[115],"taken":[116],"by":[117],"simulations.":[118],"Experimental":[119],"results":[120],"demonstrate":[121],"superiority":[123],"our":[125],"achieving":[128],"improvements":[129],"up":[131],"43.82%":[133],"in":[134,137,142],"performance,":[135],"33.20%":[136],"power":[138],"consumption,":[139],"11.41%":[141],"area":[143],"compared":[144],"state-of-the-art":[146],"methods.":[147]},"counts_by_year":[{"year":2025,"cited_by_count":6}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}