{"id":"https://openalex.org/W4392173812","doi":"https://doi.org/10.1109/tcad.2024.3370108","title":"GRAP: Efficient GPU-Based Redundancy Analysis Using Parallel Evaluation for Cross Faults","display_name":"GRAP: Efficient GPU-Based Redundancy Analysis Using Parallel Evaluation for Cross Faults","publication_year":2024,"publication_date":"2024-02-26","ids":{"openalex":"https://openalex.org/W4392173812","doi":"https://doi.org/10.1109/tcad.2024.3370108"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2024.3370108","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2024.3370108","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5114585267","display_name":"Seung Ho Shin","orcid":"https://orcid.org/0009-0002-1153-0034"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung Ho Shin","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0002-1153-0034","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100782289","display_name":"Hayoung Lee","orcid":"https://orcid.org/0000-0002-6868-0829"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hayoung Lee","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-6868-0829","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068528309","display_name":"Sungho Kang","orcid":"https://orcid.org/0000-0002-7093-2095"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-7093-2095","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":1.4863,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.82533243,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"43","issue":"8","first_page":"2518","last_page":"2531"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6849318146705627},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.684018611907959},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.6699329614639282},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10226914286613464}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6849318146705627},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.684018611907959},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.6699329614639282},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10226914286613464}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2024.3370108","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2024.3370108","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320317879","display_name":"SK Hynix","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1567270582","https://openalex.org/W1774732302","https://openalex.org/W1864199185","https://openalex.org/W1965423371","https://openalex.org/W1984875683","https://openalex.org/W1988388144","https://openalex.org/W2016939324","https://openalex.org/W2038176281","https://openalex.org/W2040066907","https://openalex.org/W2089748700","https://openalex.org/W2098987953","https://openalex.org/W2110902223","https://openalex.org/W2120017516","https://openalex.org/W2136323667","https://openalex.org/W2152425525","https://openalex.org/W2155640457","https://openalex.org/W2170624319","https://openalex.org/W2170901118","https://openalex.org/W2612114356","https://openalex.org/W2762908080","https://openalex.org/W2954055522","https://openalex.org/W2981452903","https://openalex.org/W2995036598","https://openalex.org/W3003352156","https://openalex.org/W3123810022","https://openalex.org/W3203143386","https://openalex.org/W3213862435","https://openalex.org/W4235914240","https://openalex.org/W4249672558","https://openalex.org/W4250981202","https://openalex.org/W6642448059"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"Various":[0],"memory":[1,15,63],"repair":[2,25,191],"methodologies":[3],"based":[4],"on":[5,105],"redundancy":[6,102],"analysis":[7,196],"(RA)":[8],"have":[9],"been":[10],"developed":[11],"to":[12,96],"improve":[13],"the":[14,66,71,80,84,86,115,124,130,154,166,169,183],"yield.":[16],"However,":[17],"conventional":[18,176],"RAs":[19],"often":[20],"encounter":[21],"difficulties":[22],"in":[23,140],"finding":[24],"solutions":[26],"for":[27,53,161],"cases":[28,100,141],"involving":[29],"a":[30,59,137,143,194],"large":[31,144],"number":[32,145],"of":[33,70,101,146,168,175],"faults":[34,55,110,147],"and":[35,148,165],"redundancies.":[36,149],"To":[37],"address":[38],"this":[39],"problem,":[40],"an":[41,119,189],"efficient":[42,120,200],"graphics":[43],"processing":[44,68],"unit":[45],"(GPU)-based":[46],"RA":[47,177,185],"is":[48,89,171],"proposed":[49,184],"using":[50,118,153],"Parallel":[51],"evaluation":[52],"cross":[54,106],"(GRAP).":[56],"GRAP":[57,133,170],"involves":[58],"preprocessing":[60],"stage":[61],"during":[62],"testing,":[64],"leveraging":[65,199],"parallel":[67,163,201],"capacities":[69],"GPU.":[72],"Preprocessing":[73],"facilitates":[74],"rapid":[75],"solution":[76,87,125,138],"search":[77,88,126],"by":[78,113,198],"analyzing":[79],"fault":[81],"information.":[82],"After":[83],"test,":[85],"performed.":[90],"The":[91,108,179],"GPU":[92,162],"threads":[93],"are":[94,111,151],"used":[95],"implement":[97],"all":[98],"possible":[99],"allocation,":[103],"focusing":[104],"faults.":[107],"remaining":[109],"categorized":[112],"allocating":[114],"corresponding":[116],"redundancies":[117],"method.":[121],"Given":[122],"that":[123,182],"process":[127],"efficiently":[128],"exploits":[129],"multiple":[131],"threads,":[132],"can":[134,187],"rapidly":[135],"find":[136],"even":[139],"with":[142,173,193],"Experiments":[150],"performed":[152],"compute":[155],"unified":[156],"device":[157],"architecture":[158],"(CUDA)":[159],"library":[160],"processing,":[164],"performance":[167],"compared":[172],"those":[174],"methodologies.":[178],"results":[180],"demonstrated":[181],"method":[186],"achieve":[188],"optimal":[190],"rate":[192],"high":[195],"speed":[197],"computing.":[202]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}