{"id":"https://openalex.org/W4323338367","doi":"https://doi.org/10.1109/tcad.2023.3253043","title":"CNN-Based Stochastic Regression for IDDQ Outlier Identification","display_name":"CNN-Based Stochastic Regression for IDDQ Outlier Identification","publication_year":2023,"publication_date":"2023-03-06","ids":{"openalex":"https://openalex.org/W4323338367","doi":"https://doi.org/10.1109/tcad.2023.3253043"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2023.3253043","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2023.3253043","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048521134","display_name":"Chia-Heng Yen","orcid":"https://orcid.org/0000-0002-6646-9253"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chia-Heng Yen","raw_affiliation_strings":["Department of Computer Science and Institute of Computer Science and Engineering, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0002-6646-9253","affiliations":[{"raw_affiliation_string":"Department of Computer Science and Institute of Computer Science and Engineering, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024940546","display_name":"Chun-Teng Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Teng Chen","raw_affiliation_strings":["Department of Computer Science and Institute of Computer Science and Engineering, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Institute of Computer Science and Engineering, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112899767","display_name":"Cheng-Yen Wen","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Cheng-Yen Wen","raw_affiliation_strings":["Department of Electronics Engineering and Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering and Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084399586","display_name":"Ying-Yen Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I901624438","display_name":"Realtek (Taiwan)","ror":"https://ror.org/05x1ffr83","country_code":"TW","type":"company","lineage":["https://openalex.org/I901624438"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ying-Yen Chen","raw_affiliation_strings":["CTC/DFT, Realtek Semiconductor Corporation, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CTC/DFT, Realtek Semiconductor Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I901624438"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086374528","display_name":"Jih-Nung Lee","orcid":"https://orcid.org/0000-0003-4805-4350"},"institutions":[{"id":"https://openalex.org/I901624438","display_name":"Realtek (Taiwan)","ror":"https://ror.org/05x1ffr83","country_code":"TW","type":"company","lineage":["https://openalex.org/I901624438"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jih-Nung Lee","raw_affiliation_strings":["CTC/DFT, Realtek Semiconductor Corporation, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0003-4805-4350","affiliations":[{"raw_affiliation_string":"CTC/DFT, Realtek Semiconductor Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I901624438"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057687376","display_name":"Shu-Yi Kao","orcid":null},"institutions":[{"id":"https://openalex.org/I901624438","display_name":"Realtek (Taiwan)","ror":"https://ror.org/05x1ffr83","country_code":"TW","type":"company","lineage":["https://openalex.org/I901624438"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shu-Yi Kao","raw_affiliation_strings":["CTC/DFT, Realtek Semiconductor Corporation, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CTC/DFT, Realtek Semiconductor Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I901624438"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109999808","display_name":"Kai\u2013Chiang Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kai-Chiang Wu","raw_affiliation_strings":["Department of Computer Science and Institute of Computer Science and Engineering, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Institute of Computer Science and Engineering, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045156360","display_name":"Mango C.-T. Chao","orcid":"https://orcid.org/0000-0002-7299-9015"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Mango Chia-Tso Chao","raw_affiliation_strings":["Department of Electronics Engineering and Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0002-7299-9015","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering and Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7363,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.6923527,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"42","issue":"11","first_page":"4282","last_page":"4295"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.8841172456741333},{"id":"https://openalex.org/keywords/outlier","display_name":"Outlier","score":0.6871556043624878},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.48600396513938904},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.44919443130493164},{"id":"https://openalex.org/keywords/regression","display_name":"Regression","score":0.4347839951515198},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4168829023838043},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41317951679229736},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.36483126878738403},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.34856677055358887},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.34573274850845337},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.33423876762390137},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2352977693080902},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.10742172598838806},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.08580198884010315}],"concepts":[{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.8841172456741333},{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.6871556043624878},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.48600396513938904},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.44919443130493164},{"id":"https://openalex.org/C83546350","wikidata":"https://www.wikidata.org/wiki/Q1139051","display_name":"Regression","level":2,"score":0.4347839951515198},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4168829023838043},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41317951679229736},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.36483126878738403},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.34856677055358887},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.34573274850845337},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.33423876762390137},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2352977693080902},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.10742172598838806},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.08580198884010315},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2023.3253043","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2023.3253043","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5600000023841858,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1527363716","https://openalex.org/W1579853615","https://openalex.org/W1967683336","https://openalex.org/W2011955149","https://openalex.org/W2091758325","https://openalex.org/W2099803635","https://openalex.org/W2099807755","https://openalex.org/W2116996377","https://openalex.org/W2120859640","https://openalex.org/W2121399123","https://openalex.org/W2131862714","https://openalex.org/W2168946591","https://openalex.org/W2570435998","https://openalex.org/W2585209422","https://openalex.org/W2810471131","https://openalex.org/W3024581365","https://openalex.org/W3026917414","https://openalex.org/W3032952423","https://openalex.org/W3166607604","https://openalex.org/W3171204660","https://openalex.org/W4241008425","https://openalex.org/W4247409213","https://openalex.org/W6634817459","https://openalex.org/W6733396966"],"related_works":["https://openalex.org/W2164017138","https://openalex.org/W2181536841","https://openalex.org/W2121399123","https://openalex.org/W2946329844","https://openalex.org/W1549631873","https://openalex.org/W188508038","https://openalex.org/W2519728371","https://openalex.org/W2140747718","https://openalex.org/W2542635574","https://openalex.org/W4311044804"],"abstract_inverted_index":{"To":[0],"reduce":[1],"defect":[2],"parts":[3],"per":[4],"million":[5],"(DPPM)":[6],"on":[7,37,95,207,238,260],"IC":[8],"products,":[9],"IDDQ":[10,33,82,97,126,139,174,236,258,282],"testing":[11,34],"can":[12,78,105,163,190,273],"be":[13,79,106,164,191],"exploited":[14],"for":[15,81],"identifying":[16,280],"the":[17,86,89,92,96,116,130,143,147,150,153,158,168,172,177,180,184,221,234,243,256,265,270,275],"outliers":[18],"which":[19],"are":[20,52,65],"potentially":[21],"defective":[22,277],"but":[23],"not":[24],"detected":[25],"by":[26,108,193,279],"sign-off":[27],"functional":[28],"and":[29,91,119,128,157,209,229,242,251],"parametric":[30],"tests.":[31],"Conventional":[32],"paradigms":[35],"depending":[36],"a":[38,100,110,188,195,201],"simple":[39],"statistical":[40],"<inline-formula":[41,222,244],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[42,223,245],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[43,224,246],"<tex-math":[44,225,247],"notation=\"LaTeX\">$6\\sigma":[45],"$":[46],"</tex-math></inline-formula>":[47,227,249],"rule":[48],"or":[49],"engineers\u2019":[50],"experience":[51],"usually":[53],"too":[54],"conservative":[55],"to":[56,115,166],"effectively":[57],"identify":[58,129],"nontrivial":[59],"outliers,":[60],"especially,":[61],"when":[62],"spatial":[63,181],"correlations":[64,182],"of":[66,149,171,183,204,233,255],"great":[67],"concern/influence.":[68],"In":[69,85,176],"article,":[70],"an":[71,124,133],"improved":[72,154,159,178],"convolutional":[73],"neural":[74],"network":[75],"(CNN)-based":[76],"method":[77],"proposed":[80,87],"outlier":[83,134],"identification.":[84],"method,":[88,179],"mean":[90,118],"standard":[93,120],"deviation":[94],"value":[98,140],"inside":[99,187],"die":[101],"under":[102],"test":[103],"(DUT)":[104],"predicted":[107,117],"employing":[109],"stochastic":[111,161,197],"regression":[112,162,198],"model.":[113],"According":[114],"deviation,":[121],"we":[122],"derive":[123],"expected":[125,144,173,235,257],"interval":[127],"DUT":[131],"as":[132],"if":[135],"its":[136],"actual":[137],"measured":[138],"is":[141,216],"beyond":[142],"interval.":[145],"From":[146],"observation":[148],"experimental":[151,266],"results,":[152],"data":[155,206],"preprocessing":[156],"CNN-based":[160,196],"contained":[165],"enhance":[167],"prediction":[169,219],"accuracy":[170],"intervals.":[175],"neighboring":[185],"dice":[186,278],"window":[189],"considered":[192],"training":[194],"model":[199,215,272],"with":[200],"large":[202],"volume":[203],"industrial":[205],"28":[208,239],"65":[210,261],"nm":[211,240,262],"products.":[212],"The":[213],"trained":[214,271],"highly":[217],"accurate":[218],"in":[220],"notation=\"LaTeX\">$R^{2}$":[226,248],"(0.973)":[228],"RMSE":[230,252],"(0.626":[231],"mA)":[232],"values":[237,259],"product":[241],"(0.942)":[250],"(2.155":[253],"uA)":[254],"product.":[263],"Furthermore,":[264],"results":[267],"show":[268],"that":[269],"capture":[274],"potential":[276],"efficient":[281],"outliers.":[283]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}