{"id":"https://openalex.org/W4319303202","doi":"https://doi.org/10.1109/tcad.2023.3240659","title":"CRAFT: Criticality-Aware Fault-Tolerance Enhancement Techniques for Emerging Memories-Based Deep Neural Networks","display_name":"CRAFT: Criticality-Aware Fault-Tolerance Enhancement Techniques for Emerging Memories-Based Deep Neural Networks","publication_year":2023,"publication_date":"2023-02-06","ids":{"openalex":"https://openalex.org/W4319303202","doi":"https://doi.org/10.1109/tcad.2023.3240659"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2023.3240659","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tcad.2023.3240659","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["arxiv","crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2302.03862","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068146203","display_name":"Thai-Hoang Nguyen","orcid":"https://orcid.org/0000-0001-5498-0030"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Thai-Hoang Nguyen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-5498-0030","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057878975","display_name":"Muhammad Imran","orcid":"https://orcid.org/0000-0002-6246-6143"},"institutions":[{"id":"https://openalex.org/I929597975","display_name":"National University of Sciences and Technology","ror":"https://ror.org/03w2j5y17","country_code":"PK","type":"education","lineage":["https://openalex.org/I929597975"]}],"countries":["PK"],"is_corresponding":false,"raw_author_name":"Muhammad Imran","raw_affiliation_strings":["Department of Electrical Engineering, School of Electrical Engineering and Computer Science, National University of Sciences and Technology, Islamabad, Pakistan"],"raw_orcid":"https://orcid.org/0000-0002-6246-6143","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, School of Electrical Engineering and Computer Science, National University of Sciences and Technology, Islamabad, Pakistan","institution_ids":["https://openalex.org/I929597975"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091341639","display_name":"Jaehyuk Choi","orcid":"https://orcid.org/0000-0003-4700-1900"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehyuk Choi","raw_affiliation_strings":["Department of Semiconductor Systems Engineering, Sungkyunkwan University, Suwon, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-4700-1900","affiliations":[{"raw_affiliation_string":"Department of Semiconductor Systems Engineering, Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026627679","display_name":"Joon-Sung Yang","orcid":"https://orcid.org/0000-0002-1502-5353"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joon-Sung Yang","raw_affiliation_strings":["School of Electrical and Electronic Engineering and Department of System Semiconductor Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-1502-5353","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering and Department of System Semiconductor Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5068146203"],"corresponding_institution_ids":["https://openalex.org/I848706"],"apc_list":null,"apc_paid":null,"fwci":0.6388,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.66287819,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"42","issue":"10","first_page":"3289","last_page":"3300"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7849002480506897},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.6272531151771545},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5922085642814636},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5146647095680237},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.4778268337249756},{"id":"https://openalex.org/keywords/deep-neural-networks","display_name":"Deep neural networks","score":0.4614964425563812},{"id":"https://openalex.org/keywords/criticality","display_name":"Criticality","score":0.4547932744026184},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.43676209449768066},{"id":"https://openalex.org/keywords/edge-device","display_name":"Edge device","score":0.42720022797584534},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.41802534461021423},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2592950463294983},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.20079737901687622},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.19816523790359497},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.13373839855194092},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09545201063156128}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7849002480506897},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.6272531151771545},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5922085642814636},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5146647095680237},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.4778268337249756},{"id":"https://openalex.org/C2984842247","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep neural networks","level":3,"score":0.4614964425563812},{"id":"https://openalex.org/C125611927","wikidata":"https://www.wikidata.org/wiki/Q17008131","display_name":"Criticality","level":2,"score":0.4547932744026184},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.43676209449768066},{"id":"https://openalex.org/C138236772","wikidata":"https://www.wikidata.org/wiki/Q25098575","display_name":"Edge device","level":3,"score":0.42720022797584534},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.41802534461021423},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2592950463294983},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.20079737901687622},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.19816523790359497},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.13373839855194092},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09545201063156128},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C79974875","wikidata":"https://www.wikidata.org/wiki/Q483639","display_name":"Cloud computing","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcad.2023.3240659","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tcad.2023.3240659","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},{"id":"pmh:oai:arXiv.org:2302.03862","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2302.03862","pdf_url":"https://arxiv.org/pdf/2302.03862","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2302.03862","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2302.03862","pdf_url":"https://arxiv.org/pdf/2302.03862","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1465815701","display_name":null,"funder_award_id":"20011074","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"},{"id":"https://openalex.org/G2551739661","display_name":null,"funder_award_id":"NRF-2020M3F3A2A01082326","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G3611974940","display_name":null,"funder_award_id":"2020M3F3A2A01082326","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G4700831490","display_name":null,"funder_award_id":"2022-","funder_id":"https://openalex.org/F4320335489","funder_display_name":"Institute for Information and Communications Technology Promotion"},{"id":"https://openalex.org/G8473630412","display_name":null,"funder_award_id":"2022-0-00971","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"},{"id":"https://openalex.org/G8805677413","display_name":null,"funder_award_id":"2022-0-00971","funder_id":"https://openalex.org/F4320322030","funder_display_name":"Ministry of Science, ICT and Future Planning"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320322030","display_name":"Ministry of Science, ICT and Future Planning","ror":"https://ror.org/032e49973"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"},{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"},{"id":"https://openalex.org/F4320335489","display_name":"Institute for Information and Communications Technology Promotion","ror":"https://ror.org/01g0hqq23"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4319303202.pdf","grobid_xml":"https://content.openalex.org/works/W4319303202.grobid-xml"},"referenced_works_count":46,"referenced_works":["https://openalex.org/W1971319818","https://openalex.org/W1982021032","https://openalex.org/W2034876082","https://openalex.org/W2045440623","https://openalex.org/W2098463429","https://openalex.org/W2112768159","https://openalex.org/W2115500527","https://openalex.org/W2119144962","https://openalex.org/W2124306283","https://openalex.org/W2194775991","https://openalex.org/W2300242332","https://openalex.org/W2331437931","https://openalex.org/W2396194837","https://openalex.org/W2433248078","https://openalex.org/W2518281301","https://openalex.org/W2587907650","https://openalex.org/W2612375349","https://openalex.org/W2625840880","https://openalex.org/W2767260595","https://openalex.org/W2768104155","https://openalex.org/W2798696633","https://openalex.org/W2805362231","https://openalex.org/W2809624076","https://openalex.org/W2909800597","https://openalex.org/W2945387900","https://openalex.org/W2946747688","https://openalex.org/W2948661249","https://openalex.org/W2962971773","https://openalex.org/W2989569745","https://openalex.org/W2996801341","https://openalex.org/W3005877950","https://openalex.org/W3084534437","https://openalex.org/W3089109564","https://openalex.org/W3092614054","https://openalex.org/W3101272433","https://openalex.org/W3146726557","https://openalex.org/W3214561666","https://openalex.org/W4242601976","https://openalex.org/W4243519499","https://openalex.org/W4252174618","https://openalex.org/W4295312788","https://openalex.org/W4297813615","https://openalex.org/W4312121082","https://openalex.org/W6677580257","https://openalex.org/W6753069482","https://openalex.org/W6766978945"],"related_works":["https://openalex.org/W2376759283","https://openalex.org/W3008607579","https://openalex.org/W126231364","https://openalex.org/W2567411726","https://openalex.org/W2279399181","https://openalex.org/W2333336726","https://openalex.org/W2963698000","https://openalex.org/W1668846860","https://openalex.org/W4309026116","https://openalex.org/W2062567410"],"abstract_inverted_index":{"Deep":[0],"neural":[1],"networks":[2],"(DNNs)":[3],"have":[4,36],"emerged":[5],"as":[6,74],"the":[7,21,64,79,86,113,120,128,148,154,168,185,195,211,230,243,265,299],"most":[8],"effective":[9],"programming":[10],"paradigm":[11],"for":[12,29,59],"computer":[13],"vision":[14],"and":[15,49,83,268],"natural":[16],"language":[17],"processing":[18],"applications.":[19],"With":[20],"rapid":[22],"development":[23],"of":[24,88,122,130,150,156,170,217,234,245,281,301],"DNNs,":[25,184],"efficient":[26],"hardware":[27],"architectures":[28],"deploying":[30,60],"DNN-based":[31,132],"applications":[32],"on":[33,112,173,182,200,264,273],"edge":[34],"devices":[35],"been":[37],"extensively":[38],"studied.":[39],"Emerging":[40],"nonvolatile":[41],"memories":[42],"(NVMs),":[43],"with":[44,215,237,276,292],"their":[45],"better":[46],"scalability,":[47],"nonvolatility,":[48],"good":[50],"read":[51,95],"performance,":[52],"are":[53,197,227],"found":[54],"to":[55,115,146,166,224,256,270,296],"be":[56,94,116,135,252,290],"promising":[57],"candidates":[58],"DNNs.":[61,89],"However,":[62],"despite":[63],"promise,":[65],"emerging":[66],"NVMs":[67,103],"often":[68],"suffer":[69],"from":[70],"reliability":[71,129,149],"issues,":[72],"such":[73],"stuck-at":[75,91,100,126,157,171,225,249,304],"faults,":[76,127],"which":[77,208],"decrease":[78],"chip":[80],"yield/memory":[81],"lifetime":[82],"severely":[84],"impact":[85,169,194],"accuracy":[87,196],"A":[90,159],"cell":[92],"can":[93,134,192,251,289],"but":[96],"not":[97,107],"reprogrammed,":[98],"thus,":[99],"faults":[101,172,250,305],"in":[102,109,153,188,229,306],"may":[104,106],"or":[105],"result":[108],"errors":[110,123,222],"depending":[111],"data":[114,160],"stored.":[117],"By":[118],"reducing":[119],"number":[121],"caused":[124],"by":[125,177,254],"a":[131,246,278],"system":[133],"enhanced.":[136],"This":[137],"article":[138],"proposes":[139],"CRAFT,":[140],"i.e.,":[141,284],"criticality-aware":[142],"fault-tolerance":[143,294],"enhancement":[144],"techniques":[145],"enhance":[147,298],"NVM-based":[151],"DNNs":[152,174,302],"presence":[155],"faults.":[158],"block":[161],"remapping":[162],"technique":[163],"is":[164],"used":[165],"reduce":[167],"accuracy.":[175],"Additionally,":[176],"performing":[178],"bit-level":[179],"criticality":[180],"analysis":[181],"various":[183,238],"critical-bit":[186],"positions":[187,214],"network":[189],"parameters":[190],"that":[191,216,242],"significantly":[193],"identified.":[198],"Based":[199],"this":[201],"analysis,":[202],"we":[203],"propose":[204],"an":[205],"encoding":[206],"method":[207],"effectively":[209],"swaps":[210],"critical":[212,231],"bit":[213],"noncritical":[218],"bits":[219],"when":[220],"more":[221],"(due":[223],"faults)":[226],"present":[228],"bits.":[232],"Experiments":[233],"CRAFT":[235,288],"architecture":[236],"DNN":[239,247],"models":[240],"indicate":[241],"robustness":[244,300],"against":[248,303],"enhanced":[253],"up":[255,269],"<inline-formula":[257],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[258],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[259],"<tex-math":[260],"notation=\"LaTeX\">$10^{5}$":[261],"</tex-math></inline-formula>":[262],"times":[263,272],"CIFAR-10":[266],"dataset":[267,275],"29":[271],"ImageNet":[274],"only":[277],"minimal":[279],"amount":[280],"storage":[282],"overhead,":[283],"1.17%.":[285],"Being":[286],"orthogonal,":[287],"integrated":[291],"existing":[293],"schemes":[295],"further":[297],"NVMs.":[307]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2025-12-24T23:09:58.560324","created_date":"2025-10-10T00:00:00"}
