{"id":"https://openalex.org/W4313193564","doi":"https://doi.org/10.1109/tcad.2022.3229281","title":"Generation of New Low-Complexity March Algorithms for Optimum Faults Detection in SRAM","display_name":"Generation of New Low-Complexity March Algorithms for Optimum Faults Detection in SRAM","publication_year":2022,"publication_date":"2022-12-14","ids":{"openalex":"https://openalex.org/W4313193564","doi":"https://doi.org/10.1109/tcad.2022.3229281"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2022.3229281","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2022.3229281","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101902091","display_name":"Aiman Zakwan Jidin","orcid":"https://orcid.org/0000-0003-2003-5756"},"institutions":[{"id":"https://openalex.org/I32589535","display_name":"Technical University of Malaysia Malacca","ror":"https://ror.org/01xb6rs26","country_code":"MY","type":"education","lineage":["https://openalex.org/I32589535"]},{"id":"https://openalex.org/I65079550","display_name":"Universiti Malaysia Perlis","ror":"https://ror.org/00xmkb790","country_code":"MY","type":"education","lineage":["https://openalex.org/I65079550"]}],"countries":["MY"],"is_corresponding":true,"raw_author_name":"Aiman Zakwan Jidin","raw_affiliation_strings":["Faculty of Electronics Engineering and Technology, Universiti Malaysia Perlis, Arau, Malaysia","Fakulti Teknologi Kejuruteraan Elektrik dan Elektronik, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electronics Engineering and Technology, Universiti Malaysia Perlis, Arau, Malaysia","institution_ids":["https://openalex.org/I65079550"]},{"raw_affiliation_string":"Fakulti Teknologi Kejuruteraan Elektrik dan Elektronik, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052256878","display_name":"Razaidi Hussin","orcid":"https://orcid.org/0000-0002-2725-0515"},"institutions":[{"id":"https://openalex.org/I65079550","display_name":"Universiti Malaysia Perlis","ror":"https://ror.org/00xmkb790","country_code":"MY","type":"education","lineage":["https://openalex.org/I65079550"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Razaidi Hussin","raw_affiliation_strings":["Faculty of Electronics Engineering and Technology, Universiti Malaysia Perlis, Arau, Malaysia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electronics Engineering and Technology, Universiti Malaysia Perlis, Arau, Malaysia","institution_ids":["https://openalex.org/I65079550"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103108063","display_name":"Lee Weng Fook","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Lee Weng Fook","raw_affiliation_strings":["IC Design Department, Emerald System Design Center, Penang, Malaysia"],"affiliations":[{"raw_affiliation_string":"IC Design Department, Emerald System Design Center, Penang, Malaysia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008943686","display_name":"Mohd Syafiq Mispan","orcid":"https://orcid.org/0000-0002-8654-9330"},"institutions":[{"id":"https://openalex.org/I32589535","display_name":"Technical University of Malaysia Malacca","ror":"https://ror.org/01xb6rs26","country_code":"MY","type":"education","lineage":["https://openalex.org/I32589535"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Mohd Syafiq Mispan","raw_affiliation_strings":["Fakulti Teknologi Kejuruteraan Elektrik dan Elektronik, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia"],"affiliations":[{"raw_affiliation_string":"Fakulti Teknologi Kejuruteraan Elektrik dan Elektronik, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003157471","display_name":"Nor Azura Zakaria","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nor Azura Zakaria","raw_affiliation_strings":["UST Semiconductor Department, UST Global Malaysia, Penang, Malaysia"],"affiliations":[{"raw_affiliation_string":"UST Semiconductor Department, UST Global Malaysia, Penang, Malaysia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001374276","display_name":"Loh Wan Ying","orcid":"https://orcid.org/0000-0002-8062-7860"},"institutions":[{"id":"https://openalex.org/I65079550","display_name":"Universiti Malaysia Perlis","ror":"https://ror.org/00xmkb790","country_code":"MY","type":"education","lineage":["https://openalex.org/I65079550"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Loh Wan Ying","raw_affiliation_strings":["Faculty of Electronics Engineering and Technology, Universiti Malaysia Perlis, Arau, Malaysia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electronics Engineering and Technology, Universiti Malaysia Perlis, Arau, Malaysia","institution_ids":["https://openalex.org/I65079550"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062161065","display_name":"Norshuhani Zamin","orcid":"https://orcid.org/0000-0002-5882-4016"},"institutions":[{"id":"https://openalex.org/I120238654","display_name":"Saudi Electronic University","ror":"https://ror.org/05ndh7v49","country_code":"SA","type":"education","lineage":["https://openalex.org/I120238654"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Norshuhani Zamin","raw_affiliation_strings":["College of Computing and Informatics, Saudi Electronic University, Riyadh, Saudi Arabia"],"affiliations":[{"raw_affiliation_string":"College of Computing and Informatics, Saudi Electronic University, Riyadh, Saudi Arabia","institution_ids":["https://openalex.org/I120238654"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5101902091"],"corresponding_institution_ids":["https://openalex.org/I32589535","https://openalex.org/I65079550"],"apc_list":null,"apc_paid":null,"fwci":3.1788,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.92629816,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"42","issue":"8","first_page":"2738","last_page":"2751"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7517951726913452},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6907002925872803},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6474029421806335},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6431581377983093},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6094810366630554},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5802779197692871},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4698295295238495},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.46575337648391724},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4611419141292572},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.435647577047348},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2358083426952362},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2266055941581726}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7517951726913452},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6907002925872803},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6474029421806335},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6431581377983093},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6094810366630554},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5802779197692871},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4698295295238495},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.46575337648391724},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4611419141292572},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.435647577047348},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2358083426952362},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2266055941581726},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2022.3229281","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2022.3229281","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.41999998688697815,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W61204997","https://openalex.org/W69709131","https://openalex.org/W1580083564","https://openalex.org/W1849928240","https://openalex.org/W2000238728","https://openalex.org/W2084363702","https://openalex.org/W2097100364","https://openalex.org/W2106246015","https://openalex.org/W2117659148","https://openalex.org/W2121938580","https://openalex.org/W2139207445","https://openalex.org/W2160093572","https://openalex.org/W2160275570","https://openalex.org/W2267667027","https://openalex.org/W2351063309","https://openalex.org/W2504518172","https://openalex.org/W2791506403","https://openalex.org/W2854988840","https://openalex.org/W2899526346","https://openalex.org/W2965716424","https://openalex.org/W2975536606","https://openalex.org/W2980888283","https://openalex.org/W2986849151","https://openalex.org/W3010157049","https://openalex.org/W3021582262","https://openalex.org/W3108186916","https://openalex.org/W3118395396","https://openalex.org/W3146460456","https://openalex.org/W3192467450","https://openalex.org/W3193822651","https://openalex.org/W4210447066","https://openalex.org/W4210691908","https://openalex.org/W4245703168","https://openalex.org/W6675503376","https://openalex.org/W6680517372","https://openalex.org/W6755925521","https://openalex.org/W6768474731","https://openalex.org/W7067974511"],"related_works":["https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W4293253840","https://openalex.org/W4378977321","https://openalex.org/W2967161359","https://openalex.org/W4308090481","https://openalex.org/W2119025037","https://openalex.org/W3192832106"],"abstract_inverted_index":{"Memory":[0,189],"BIST":[1,190],"implements":[2],"March":[3,20,36,87,119,163,166],"test":[4,16,46,75,121,156],"techniques":[5],"extensively":[6],"for":[7],"testing":[8],"embedded":[9],"memories":[10],"on":[11,93],"a":[12,66,82],"chip.":[13],"A":[14],"high-complexity":[15],"algorithm":[17],"like":[18],"the":[19,25,61,69,74,97,110,117,128,133,180,188],"MSS":[21],"(18N)":[22],"can":[23,41],"guarantee":[24],"detection":[26,131,142],"of":[27,57,132,179],"all":[28],"unlinked":[29],"static":[30],"faults":[31,58,94,135],"in":[32,60,187],"SRAM.":[33],"In":[34],"contrast,":[35],"algorithms":[37,88],"with":[38,169],"lower":[39],"complexity":[40],"be":[42],"used":[43],"to":[44,84,108,123,146,151],"reduce":[45],"costs":[47],"and":[48,73,115,126,130,150,165,171,192],"chip":[49],"area":[50],"overhead.":[51],"Still,":[52],"they":[53],"have":[54],"poor":[55],"coverage":[56,71,92,178],"identified":[59],"nanometer":[62,98],"process":[63,99],"technologies.":[64,100],"Subsequently,":[65],"balance":[67],"between":[68],"fault":[70,141],"(FC)":[72],"cost":[76],"is":[77],"necessary.":[78],"This":[79],"article":[80],"presents":[81],"method":[83,160],"generate":[85,109],"new":[86,111,162],"that":[89,175],"provide":[90,176],"optimum":[91,177],"introduced":[95],"by":[96,104],"It":[101],"was":[102],"achieved":[103],"developing":[105],"automated":[106],"software":[107],"Data":[112],"Background":[113],"sequence":[114],"rearrange":[116],"existing":[118],"algorithms\u2019":[120],"operations":[122],"remove":[124],"redundancies":[125],"enable":[127],"sensitization":[129],"intended":[134],"while":[136],"preserving":[137],"their":[138,148,193],"complexities.":[139],"Comprehensive":[140],"analyses":[143],"were":[144,184,195],"conducted":[145],"assess":[147],"FCs":[149],"find":[152],"any":[153],"removable":[154],"redundant":[155],"operations.":[157],"The":[158],"proposed":[159],"produced":[161],"AZ1":[164],"AZ2":[167],"algorithms,":[168],"13N":[170],"14N":[172],"complexity,":[173],"respectively,":[174],"targeted":[181],"faults.":[182],"They":[183],"successfully":[185],"implemented":[186],"controllers,":[191],"functionalities":[194],"validated":[196],"via":[197],"simulations.":[198]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}