{"id":"https://openalex.org/W4312587453","doi":"https://doi.org/10.1109/tcad.2022.3225066","title":"Machine Learning-Based Read Access Yield Estimation and Design Optimization for High-Density SRAM","display_name":"Machine Learning-Based Read Access Yield Estimation and Design Optimization for High-Density SRAM","publication_year":2022,"publication_date":"2022-12-01","ids":{"openalex":"https://openalex.org/W4312587453","doi":"https://doi.org/10.1109/tcad.2022.3225066"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2022.3225066","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2022.3225066","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103175852","display_name":"Taehwan Yoon","orcid":null},"institutions":[{"id":"https://openalex.org/I161024014","display_name":"Kwangwoon University","ror":"https://ror.org/02e9zc863","country_code":"KR","type":"education","lineage":["https://openalex.org/I161024014"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Taehwan Yoon","raw_affiliation_strings":["Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea","institution_ids":["https://openalex.org/I161024014"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108522065","display_name":"Hanwool Jeong","orcid":null},"institutions":[{"id":"https://openalex.org/I161024014","display_name":"Kwangwoon University","ror":"https://ror.org/02e9zc863","country_code":"KR","type":"education","lineage":["https://openalex.org/I161024014"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hanwool Jeong","raw_affiliation_strings":["Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea","institution_ids":["https://openalex.org/I161024014"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5103175852"],"corresponding_institution_ids":["https://openalex.org/I161024014"],"apc_list":null,"apc_paid":null,"fwci":1.6229,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.82986425,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"42","issue":"8","first_page":"2618","last_page":"2630"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6429075002670288},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.6251279711723328},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5688354969024658},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5403833985328674},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.536472499370575},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5225245952606201},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.5215287208557129},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.5075001120567322},{"id":"https://openalex.org/keywords/estimation","display_name":"Estimation","score":0.4542336165904999},{"id":"https://openalex.org/keywords/bayesian-optimization","display_name":"Bayesian optimization","score":0.4286206066608429},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4115336835384369},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24150687456130981},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1752573847770691},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.16687923669815063},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11159640550613403},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.09902974963188171}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6429075002670288},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.6251279711723328},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5688354969024658},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5403833985328674},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.536472499370575},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5225245952606201},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.5215287208557129},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.5075001120567322},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.4542336165904999},{"id":"https://openalex.org/C2778049539","wikidata":"https://www.wikidata.org/wiki/Q17002908","display_name":"Bayesian optimization","level":2,"score":0.4286206066608429},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4115336835384369},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24150687456130981},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1752573847770691},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.16687923669815063},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11159640550613403},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.09902974963188171},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2022.3225066","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2022.3225066","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2964706983","display_name":null,"funder_award_id":"SRFC-IT2102-06","funder_id":"https://openalex.org/F4320332195","funder_display_name":"Samsung"}],"funders":[{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1966959553","https://openalex.org/W2038718603","https://openalex.org/W2046515116","https://openalex.org/W2092101442","https://openalex.org/W2093064288","https://openalex.org/W2096581954","https://openalex.org/W2113613740","https://openalex.org/W2120353978","https://openalex.org/W2130282462","https://openalex.org/W2140313748","https://openalex.org/W2141274564","https://openalex.org/W2154477062","https://openalex.org/W2162613878","https://openalex.org/W2172203429","https://openalex.org/W2346205343","https://openalex.org/W2742220040","https://openalex.org/W2768460200","https://openalex.org/W2785885072","https://openalex.org/W2793045952","https://openalex.org/W2942378084","https://openalex.org/W2991641628","https://openalex.org/W3092014264","https://openalex.org/W3137312091","https://openalex.org/W3139804307","https://openalex.org/W3162484224","https://openalex.org/W3201078683","https://openalex.org/W3208221032","https://openalex.org/W4211049957","https://openalex.org/W4232939033","https://openalex.org/W4243073678","https://openalex.org/W4243669666","https://openalex.org/W4247460323","https://openalex.org/W4289761856","https://openalex.org/W6677720047","https://openalex.org/W6753146606"],"related_works":["https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W4293253840","https://openalex.org/W4378977321","https://openalex.org/W2967161359","https://openalex.org/W4308090481","https://openalex.org/W3211992815","https://openalex.org/W1976168335"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"an":[3],"efficient":[4],"yield":[5,52,109,124,139],"estimation":[6,53,125,140],"method":[7,54,85,95],"for":[8,126],"the":[9,16,29,43,50,57,67,75,93,107,112,120,135],"compensated-most":[10],"probable":[11],"failure":[12],"point":[13],"(C-MPFP)":[14],"with":[15,66,143],"probability":[17],"density":[18],"function":[19],"(PDF)":[20],"estimation.":[21],"Bayesian":[22],"optimization":[23,84,115],"(BO)":[24],"is":[25,86,141],"used":[26],"to":[27],"estimate":[28],"PDF.":[30],"The":[31,88],"computational":[32,121],"cost":[33,122],"can":[34,55,117],"be":[35],"significantly":[36],"reduced":[37],"using":[38],"this":[39],"method,":[40],"while":[41,105],"maintaining":[42],"accuracy.":[44],"Our":[45],"experimental":[46],"results":[47],"demonstrate":[48],"that":[49],"proposed":[51,94,113],"reduce":[56,119],"simulation":[58],"time":[59],"by":[60,92],"more":[61],"than":[62,101],"20":[63],"times":[64,138],"compared":[65],"Brute":[68],"force":[69],"Monte":[70],"Carlo":[71],"(BMC).":[72],"In":[73],"addition,":[74],"BO-based":[76],"automated":[77],"static":[78],"random-access":[79],"memory":[80],"read":[81],"access":[82],"design":[83,90,114,129],"proposed.":[87],"optimized":[89],"found":[91],"demonstrates":[96],"a":[97,127],"10%":[98],"faster":[99],"speed":[100],"arbitrarily":[102],"selected":[103],"designs":[104],"satisfying":[106],"target":[108],"constraint.":[110],"Consequently,":[111],"process":[116],"efficiently":[118],"of":[123,137],"given":[128],"as":[130,132],"well":[131],"effectively":[133],"reducing":[134],"number":[136],"invoked":[142],"BO.":[144]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}