{"id":"https://openalex.org/W4293243546","doi":"https://doi.org/10.1109/tcad.2022.3197521","title":"GNN4REL: Graph Neural Networks for Predicting Circuit Reliability Degradation","display_name":"GNN4REL: Graph Neural Networks for Predicting Circuit Reliability Degradation","publication_year":2022,"publication_date":"2022-08-09","ids":{"openalex":"https://openalex.org/W4293243546","doi":"https://doi.org/10.1109/tcad.2022.3197521"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2022.3197521","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2022.3197521","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030348801","display_name":"Lilas Alrahis","orcid":"https://orcid.org/0000-0001-9932-6833"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Lilas Alrahis","raw_affiliation_strings":["Division of Engineering, New York University Abu Dhabi, Abu Dhabi, UAE"],"raw_orcid":"https://orcid.org/0000-0001-9932-6833","affiliations":[{"raw_affiliation_string":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi, UAE","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052751303","display_name":"Johann Knechtel","orcid":"https://orcid.org/0000-0001-5093-2939"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Johann Knechtel","raw_affiliation_strings":["Division of Engineering, New York University Abu Dhabi, Abu Dhabi, UAE"],"raw_orcid":"https://orcid.org/0000-0001-5093-2939","affiliations":[{"raw_affiliation_string":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi, UAE","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083905801","display_name":"Florian Klemme","orcid":"https://orcid.org/0000-0002-0148-0523"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Florian Klemme","raw_affiliation_strings":["Department of Computer Science, University of Stuttgart, Stuttgart, Germany"],"raw_orcid":"https://orcid.org/0000-0002-0148-0523","affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059133190","display_name":"Hussam Amrouch","orcid":"https://orcid.org/0000-0002-5649-3102"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["Department of Computer Science, University of Stuttgart, Stuttgart, Germany"],"raw_orcid":"https://orcid.org/0000-0002-5649-3102","affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059987567","display_name":"Ozgur Sinanoglu","orcid":"https://orcid.org/0000-0003-0782-0397"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ozgur Sinanoglu","raw_affiliation_strings":["Division of Engineering, New York University Abu Dhabi, Abu Dhabi, UAE"],"raw_orcid":"https://orcid.org/0000-0003-0782-0397","affiliations":[{"raw_affiliation_string":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi, UAE","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.8622,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.91198673,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"41","issue":"11","first_page":"3826","last_page":"3837"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6909251809120178},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5657287240028381},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5072171688079834},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4860835373401642},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.4687483608722687},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.4578792452812195},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.4376075565814972},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3875877857208252},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3469882607460022},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.22418347001075745},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14306795597076416},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13695889711380005},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11277309060096741},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10433483123779297},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08908334374427795}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6909251809120178},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5657287240028381},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5072171688079834},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4860835373401642},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.4687483608722687},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.4578792452812195},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.4376075565814972},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3875877857208252},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3469882607460022},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.22418347001075745},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14306795597076416},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13695889711380005},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11277309060096741},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10433483123779297},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08908334374427795},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2022.3197521","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2022.3197521","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320313203","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W637484538","https://openalex.org/W1966797259","https://openalex.org/W1979441310","https://openalex.org/W2007678974","https://openalex.org/W2096581954","https://openalex.org/W2396345169","https://openalex.org/W2789041031","https://openalex.org/W2962711740","https://openalex.org/W2964015378","https://openalex.org/W2999392067","https://openalex.org/W3024722044","https://openalex.org/W3142835241","https://openalex.org/W3183146245","https://openalex.org/W3198329143","https://openalex.org/W3198511427","https://openalex.org/W3200855694","https://openalex.org/W3212416488","https://openalex.org/W4280640024","https://openalex.org/W4288089571","https://openalex.org/W6726873649","https://openalex.org/W6736685754","https://openalex.org/W6754929296","https://openalex.org/W6775947557","https://openalex.org/W6787733248"],"related_works":["https://openalex.org/W1973774436","https://openalex.org/W2160859600","https://openalex.org/W3092420867","https://openalex.org/W2042032654","https://openalex.org/W2115729972","https://openalex.org/W2158291854","https://openalex.org/W2123535323","https://openalex.org/W2134944363","https://openalex.org/W4231005419","https://openalex.org/W1804063983"],"abstract_inverted_index":{"Process":[0],"variations":[1,19,137],"and":[2,51,138,159,209],"device":[3,139],"aging":[4,111,140],"impose":[5],"profound":[6],"challenges":[7],"for":[8,41,119],"circuit":[9,24],"designers.":[10],"Without":[11],"a":[12,148,191,227],"precise":[13],"understanding":[14],"of":[15,18,23,135,144,222],"the":[16,21,115,133,142,178,184],"impact":[17,134],"on":[20,141,190,207],"delay":[22,79,143,220],"paths,":[25],"guardbands,":[26],"which":[27],"keep":[28],"timing":[29,71],"violations":[30],"at":[31],"bay,":[32],"cannot":[33],"be":[34,90],"correctly":[35],"estimated.":[36,92],"This":[37],"problem":[38],"is":[39,96,188,196],"exacerbated":[40],"advanced":[42],"technology":[43,193],"nodes,":[44],"where":[45],"transistor":[46,165],"dimensions":[47],"reach":[48],"atomic":[49],"levels":[50],"established":[52],"margins":[53],"are":[54,84,174],"severely":[55],"constrained.":[56],"Hence,":[57],"traditional":[58],"worst-case":[59],"analysis":[60,72,95],"becomes":[61],"impractical,":[62],"resulting":[63],"in":[64],"intolerable":[65],"performance":[66],"overheads.":[67],"Contrarily,":[68],"process-variation/aging-aware":[69],"static":[70],"(STA)":[73],"equips":[74],"designers":[75,155],"with":[76],"accurate":[77,160],"statistical":[78],"distributions.":[80],"Timing":[81],"guardbands":[82],"that":[83,195],"small,":[85],"yet":[86],"sufficient,":[87],"can":[88],"then":[89],"effectively":[91],"However,":[93],"such":[94],"costly":[97],"as":[98,212,214],"it":[99,105],"requires":[100],"intensive":[101],"Monte-Carlo":[102],"simulations.":[103],"Further,":[104],"necessitates":[106],"access":[107],"to":[108,113,130,156,232],"confidential":[109],"physics-based":[110],"models":[112],"generate":[114],"standard-cell":[116,167],"libraries":[117],"required":[118],"STA.":[120],"In":[121],"this":[122],"work,":[123],"we":[124,217],"employ":[125],"graph":[126],"neural":[127],"networks":[128],"(GNNs)":[129],"accurately":[131],"estimate":[132,219],"process":[136],"any":[145],"path":[146],"within":[147,225],"circuit.":[149],"Our":[150],"proposed":[151],"GNN4REL":[152,187],"framework":[153],"empowers":[154],"perform":[157],"rapid":[158],"reliability":[161],"estimations":[162],"without":[163],"accessing":[164],"models,":[166],"libraries,":[168],"or":[169],"even":[170],"STA;":[171],"these":[172],"components":[173],"all":[175,223],"incorporated":[176],"into":[177],"GNN":[179],"model":[180,194],"via":[181],"training":[182],"by":[183],"foundry.":[185],"Specifically,":[186],"trained":[189],"FinFET":[192],"calibrated":[197],"against":[198],"industrial":[199],"14-nm":[200],"measurement":[201],"data.":[202],"Through":[203],"our":[204],"extensive":[205],"experiments":[206],"EPFL":[208],"ITC-99":[210],"benchmarks,":[211],"well":[213],"RISC-V":[215],"processors,":[216],"successfully":[218],"degradations":[221],"paths\u2014notably":[224],"seconds\u2014with":[226],"mean":[228],"absolute":[229],"error":[230],"down":[231],"0.01":[233],"percentage":[234],"points.":[235]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":8}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}