{"id":"https://openalex.org/W4285122104","doi":"https://doi.org/10.1109/tcad.2022.3177002","title":"Offline Training-Based Mitigation of IR Drop for ReRAM-Based Deep Neural Network Accelerators","display_name":"Offline Training-Based Mitigation of IR Drop for ReRAM-Based Deep Neural Network Accelerators","publication_year":2022,"publication_date":"2022-05-23","ids":{"openalex":"https://openalex.org/W4285122104","doi":"https://doi.org/10.1109/tcad.2022.3177002"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2022.3177002","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2022.3177002","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030318115","display_name":"Sugil Lee","orcid":"https://orcid.org/0000-0003-3092-6501"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sugil Lee","raw_affiliation_strings":["Department of EE, Ulsan National Institute of Science and Technology, Ulsan, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of EE, Ulsan National Institute of Science and Technology, Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084829415","display_name":"Mohammed E. Fouda","orcid":"https://orcid.org/0000-0001-7139-3428"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammed E. Fouda","raw_affiliation_strings":["Department of EECS, University of California at Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of EECS, University of California at Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100780257","display_name":"Jongeun Lee","orcid":"https://orcid.org/0000-0003-1523-2974"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jongeun Lee","raw_affiliation_strings":["Department of EE, Ulsan National Institute of Science and Technology, Ulsan, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of EE, Ulsan National Institute of Science and Technology, Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013660772","display_name":"Ahmed M. Eltawil","orcid":"https://orcid.org/0000-0003-1849-083X"},"institutions":[{"id":"https://openalex.org/I71920554","display_name":"King Abdullah University of Science and Technology","ror":"https://ror.org/01q3tbs38","country_code":"SA","type":"education","lineage":["https://openalex.org/I71920554"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Ahmed M. Eltawil","raw_affiliation_strings":["Division of CEMSE, King Abdullah University of Science and Technology, Thuwal, Saudi Arabia"],"affiliations":[{"raw_affiliation_string":"Division of CEMSE, King Abdullah University of Science and Technology, Thuwal, Saudi Arabia","institution_ids":["https://openalex.org/I71920554"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008034875","display_name":"Fadi Kurdahi","orcid":"https://orcid.org/0000-0002-6982-365X"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fadi Kurdahi","raw_affiliation_strings":["Department of EECS, University of California at Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of EECS, University of California at Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5030318115"],"corresponding_institution_ids":["https://openalex.org/I48566637"],"apc_list":null,"apc_paid":null,"fwci":1.1045,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.76138117,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"42","issue":"2","first_page":"521","last_page":"532"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.8153571486473083},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7711641192436218},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5843102931976318},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.5365161299705505},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4501405656337738},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4302371144294739},{"id":"https://openalex.org/keywords/performance-improvement","display_name":"Performance improvement","score":0.42135974764823914},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4126341640949249},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.41056448221206665},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3808887302875519},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.22913578152656555},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08782720565795898},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08410641551017761},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07001468539237976}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.8153571486473083},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7711641192436218},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5843102931976318},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.5365161299705505},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4501405656337738},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4302371144294739},{"id":"https://openalex.org/C2778915421","wikidata":"https://www.wikidata.org/wiki/Q3643177","display_name":"Performance improvement","level":2,"score":0.42135974764823914},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4126341640949249},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.41056448221206665},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3808887302875519},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.22913578152656555},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08782720565795898},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08410641551017761},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07001468539237976},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tcad.2022.3177002","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2022.3177002","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},{"id":"pmh:oai:repository.kaust.edu.sa:10754/678232","is_oa":false,"landing_page_url":"http://hdl.handle.net/10754/678232","pdf_url":null,"source":{"id":"https://openalex.org/S4306401596","display_name":"King Abdullah University of Science and Technology Repository (King Abdullah University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I71920554","host_organization_name":"King Abdullah University of Science and Technology","host_organization_lineage":["https://openalex.org/I71920554"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"},{"id":"pmh:oai:scholarworks.unist.ac.kr:201301/60064","is_oa":false,"landing_page_url":"https://scholarworks.unist.ac.kr/handle/201301/60064","pdf_url":null,"source":{"id":"https://openalex.org/S4306401118","display_name":"Scholarworks@UNIST (Ulsan National Institute of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I48566637","host_organization_name":"Ulsan National Institute of Science and Technology","host_organization_lineage":["https://openalex.org/I48566637"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"ARTICLE"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3463320963","display_name":null,"funder_award_id":"1.170067.01","funder_id":"https://openalex.org/F4320321348","funder_display_name":"Ulsan National Institute of Science and Technology"},{"id":"https://openalex.org/G7975456453","display_name":null,"funder_award_id":"2020R1A2C2015066","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"}],"funders":[{"id":"https://openalex.org/F4320321348","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W2094756095","https://openalex.org/W2518281301","https://openalex.org/W2613989746","https://openalex.org/W2724189024","https://openalex.org/W2729455382","https://openalex.org/W2775771159","https://openalex.org/W2782791387","https://openalex.org/W2895296961","https://openalex.org/W2923010225","https://openalex.org/W2946522000","https://openalex.org/W2957706073","https://openalex.org/W2996794321","https://openalex.org/W3013164405","https://openalex.org/W3014066663","https://openalex.org/W3016762888","https://openalex.org/W3036319002","https://openalex.org/W3091835145","https://openalex.org/W3092585568","https://openalex.org/W3111367661","https://openalex.org/W3141540147","https://openalex.org/W3174812964","https://openalex.org/W4232844652","https://openalex.org/W4250599615","https://openalex.org/W4254672563","https://openalex.org/W6631660994","https://openalex.org/W6638667902","https://openalex.org/W6693397755","https://openalex.org/W6755312279","https://openalex.org/W6787631549"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W1943174035","https://openalex.org/W2054635671","https://openalex.org/W2096437374","https://openalex.org/W1928481607","https://openalex.org/W2545245183","https://openalex.org/W3195722497","https://openalex.org/W2167784970","https://openalex.org/W1980301972","https://openalex.org/W2587448511"],"abstract_inverted_index":{"Recently,":[0],"resistive":[1],"RAM":[2],"(ReRAM)-based":[3],"hardware":[4,73],"accelerators":[5],"showed":[6],"unprecedented":[7],"performance":[8,32,105,122,181],"compared":[9],"the":[10,31,40,47,65,91,94,104,107,127,142,149,154,160,184,189,192],"digital":[11],"accelerators.":[12,35],"Technology":[13],"scaling":[14],"causes":[15],"an":[16],"inevitable":[17],"increase":[18],"in":[19,46,180],"interconnect":[20],"wire":[21],"resistance,":[22],"which":[23,50,62,187],"leads":[24],"to":[25,53,89,102,126,146,183],"IR":[26,37,68,95],"drops":[27,38],"that":[28],"could":[29],"limit":[30],"of":[33,67,93,106,191],"ReRAM-based":[34],"These":[36,98],"deteriorate":[39],"signal":[41],"integrity":[42],"and":[43,116,152,202],"quality,":[44],"especially":[45],"crossbar":[48],"structures":[49],"are":[51,100,139],"used":[52,101],"build":[54],"high-density":[55],"ReRAMs.":[56],"Hence,":[57],"finding":[58],"a":[59],"software":[60],"solution,":[61],"can":[63],"predict":[64,90],"effect":[66],"drop":[69,96],"without":[70],"involving":[71],"expensive":[72],"or":[74],"SPICE":[75,174],"simulations,":[76,175],"is":[77],"very":[78,177],"desirable.":[79],"In":[80,134],"this":[81],"article,":[82],"we":[83,163],"propose":[84,164],"two":[85],"neural":[86,110,118],"networks":[87,119],"models":[88,99,113,138,151],"impact":[92],"problem.":[97],"evaluate":[103],"different":[108],"deep":[109],"network":[111],"(DNN)":[112],"including":[114],"binary":[115],"quantized":[117],"showing":[120],"similar":[121],"(i.e.,":[123,130],"recognition":[124],"accuracy)":[125],"golden":[128],"validation":[129,161,170],"SPICE-based":[131],"DNN":[132,143,150,169],"validation).":[133],"addition,":[135],"these":[136],"predication":[137],"incorporated":[140],"into":[141],"training":[144,166],"framework":[145],"efficiently":[147],"retrain":[148],"bridge":[153],"accuracy":[155],"drop.":[156],"To":[157],"further":[158],"enhance":[159],"accuracy,":[162],"incremental":[165],"methods.":[167],"The":[168],"results,":[171],"done":[172],"through":[173],"show":[176],"high":[178],"improvement":[179],"close":[182],"baseline":[185],"performance,":[186],"demonstrates":[188],"efficacy":[190],"proposed":[193],"method":[194],"even":[195],"with":[196],"challenging":[197],"datasets,":[198],"such":[199],"as":[200],"CIFAR10":[201],"SVHN.":[203]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}