{"id":"https://openalex.org/W4285116403","doi":"https://doi.org/10.1109/tcad.2022.3175241","title":"A Batched Bayesian Optimization Approach for Analog Circuit Synthesis via Multi-Fidelity Modeling","display_name":"A Batched Bayesian Optimization Approach for Analog Circuit Synthesis via Multi-Fidelity Modeling","publication_year":2022,"publication_date":"2022-05-16","ids":{"openalex":"https://openalex.org/W4285116403","doi":"https://doi.org/10.1109/tcad.2022.3175241"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2022.3175241","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2022.3175241","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054587707","display_name":"Biao He","orcid":"https://orcid.org/0000-0003-0343-1087"},"institutions":[{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Biao He","raw_affiliation_strings":["Microelectronics Department, State Key Laboratory of ASIC &#x0026; System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Microelectronics Department, State Key Laboratory of ASIC &#x0026; System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101708626","display_name":"Shuhan Zhang","orcid":"https://orcid.org/0000-0001-6738-4107"},"institutions":[{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuhan Zhang","raw_affiliation_strings":["Microelectronics Department, State Key Laboratory of ASIC &#x0026; System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Microelectronics Department, State Key Laboratory of ASIC &#x0026; System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100398595","display_name":"Yifan Wang","orcid":"https://orcid.org/0000-0003-3189-4513"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yifan Wang","raw_affiliation_strings":["Department of Electrical Engineering, The University of Texas at Dallas, Richardson, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, The University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018804085","display_name":"Tianning Gao","orcid":"https://orcid.org/0000-0001-7916-4494"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tianning Gao","raw_affiliation_strings":["Department of Electrical Engineering, The University of Texas at Dallas, Richardson, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, The University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045464812","display_name":"Fan Yang","orcid":"https://orcid.org/0000-0003-2164-8175"},"institutions":[{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Yang","raw_affiliation_strings":["Microelectronics Department, State Key Laboratory of ASIC &#x0026; System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Microelectronics Department, State Key Laboratory of ASIC &#x0026; System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037328458","display_name":"Changhao Yan","orcid":"https://orcid.org/0000-0002-8936-3945"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changhao Yan","raw_affiliation_strings":["Microelectronics Department, State Key Laboratory of ASIC &#x0026; System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Microelectronics Department, State Key Laboratory of ASIC &#x0026; System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054960059","display_name":"Dian Zhou","orcid":"https://orcid.org/0000-0002-2648-5232"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dian Zhou","raw_affiliation_strings":["Department of Electrical Engineering, The University of Texas at Dallas, Richardson, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, The University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039204202","display_name":"Zhaori Bi","orcid":"https://orcid.org/0000-0002-7315-3150"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaori Bi","raw_affiliation_strings":["Microelectronics Department, State Key Laboratory of ASIC &#x0026; System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Microelectronics Department, State Key Laboratory of ASIC &#x0026; System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064213921","display_name":"Xuan Zeng","orcid":"https://orcid.org/0000-0002-8097-4053"},"institutions":[{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuan Zeng","raw_affiliation_strings":["Microelectronics Department, State Key Laboratory of ASIC &#x0026; System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Microelectronics Department, State Key Laboratory of ASIC &#x0026; System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5054587707"],"corresponding_institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210132426"],"apc_list":null,"apc_paid":null,"fwci":1.7382,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.84086318,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"42","issue":"2","first_page":"347","last_page":"359"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10848","display_name":"Advanced Multi-Objective Optimization Algorithms","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6573272943496704},{"id":"https://openalex.org/keywords/bayesian-optimization","display_name":"Bayesian optimization","score":0.5900054574012756},{"id":"https://openalex.org/keywords/fidelity","display_name":"Fidelity","score":0.5693992972373962},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.5577175617218018},{"id":"https://openalex.org/keywords/high-fidelity","display_name":"High fidelity","score":0.4268222153186798},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3927420675754547},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3702687621116638},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.33691030740737915},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.28340649604797363},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1279970109462738},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0853433609008789},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0783318281173706}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6573272943496704},{"id":"https://openalex.org/C2778049539","wikidata":"https://www.wikidata.org/wiki/Q17002908","display_name":"Bayesian optimization","level":2,"score":0.5900054574012756},{"id":"https://openalex.org/C2776459999","wikidata":"https://www.wikidata.org/wiki/Q2119376","display_name":"Fidelity","level":2,"score":0.5693992972373962},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.5577175617218018},{"id":"https://openalex.org/C113364801","wikidata":"https://www.wikidata.org/wiki/Q26674","display_name":"High fidelity","level":2,"score":0.4268222153186798},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3927420675754547},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3702687621116638},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.33691030740737915},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.28340649604797363},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1279970109462738},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0853433609008789},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0783318281173706}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2022.3175241","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2022.3175241","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.41999998688697815,"id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G2318418051","display_name":null,"funder_award_id":"2020YFA0711901","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G2948269054","display_name":null,"funder_award_id":"2020YFA0711900","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G4364189045","display_name":null,"funder_award_id":"62090025","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5041706605","display_name":null,"funder_award_id":"61822402","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5071938314","display_name":null,"funder_award_id":"62141407","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6197183902","display_name":null,"funder_award_id":"61929102","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7938649858","display_name":null,"funder_award_id":"61974032","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W61667912","https://openalex.org/W65083733","https://openalex.org/W1491420040","https://openalex.org/W1665719966","https://openalex.org/W1693986406","https://openalex.org/W1964239621","https://openalex.org/W1998752433","https://openalex.org/W2005596987","https://openalex.org/W2020732830","https://openalex.org/W2039522160","https://openalex.org/W2065183815","https://openalex.org/W2074046446","https://openalex.org/W2121456807","https://openalex.org/W2128439793","https://openalex.org/W2144133630","https://openalex.org/W2167789032","https://openalex.org/W2559655401","https://openalex.org/W2586938721","https://openalex.org/W2736440494","https://openalex.org/W2742044854","https://openalex.org/W2769791151","https://openalex.org/W2945689147","https://openalex.org/W2957304873","https://openalex.org/W2989851762","https://openalex.org/W2991641628","https://openalex.org/W2998324702","https://openalex.org/W3011917993","https://openalex.org/W3035803417","https://openalex.org/W3089720745","https://openalex.org/W3100083105","https://openalex.org/W3102150134","https://openalex.org/W4211049957","https://openalex.org/W4212863985","https://openalex.org/W4242427575","https://openalex.org/W4289761856","https://openalex.org/W6637134053","https://openalex.org/W6637591494","https://openalex.org/W6674792215","https://openalex.org/W6681048580","https://openalex.org/W6683185311","https://openalex.org/W6685594460","https://openalex.org/W6710751941","https://openalex.org/W6714488831","https://openalex.org/W6717592245","https://openalex.org/W6750841938","https://openalex.org/W6751513613","https://openalex.org/W6753146606","https://openalex.org/W6758997602"],"related_works":["https://openalex.org/W4313443006","https://openalex.org/W4385452045","https://openalex.org/W2945374968","https://openalex.org/W4293777179","https://openalex.org/W2164070813","https://openalex.org/W2135608140","https://openalex.org/W2895525995","https://openalex.org/W2332512904","https://openalex.org/W4224231624","https://openalex.org/W2319626700"],"abstract_inverted_index":{"Device":[0],"sizing":[1],"is":[2,67],"a":[3,32,62,70,95,101,148,158],"challenging":[4],"problem":[5],"for":[6,21],"analog":[7,38],"circuit":[8,39],"design.":[9],"Traditional":[10],"methods":[11],"depend":[12],"on":[13,186],"domain":[14],"knowledge":[15],"and":[16,31,116,167],"intensive":[17],"simulations":[18],"to":[19,41,105,152,205],"search":[20],"feasible":[22],"parameters.":[23],"Recent":[24],"studies":[25],"apply":[26],"the":[27,49,54,74,107,127,132,141,154,160,164,172,176,180,183,197,206],"Bayesian":[28],"optimization":[29,173],"(BO)":[30],"Gaussian":[33],"process":[34],"(GP)":[35],"model":[36,78,104,130],"in":[37,69,147],"synthesis":[40],"improve":[42],"efficiency.":[43],"The":[44,110,190],"BO":[45,60,98,112],"framework":[46],"automatically":[47],"selects":[48,117],"parameter":[50,155],"candidates":[51],"by":[52,120,200],"inferring":[53],"surrogate":[55],"GP":[56,77,129],"model.":[57],"However,":[58],"naive":[59],"employs":[61],"sequential":[63],"updating":[64],"strategy":[65],"which":[66,84,169],"inefficient":[68],"multicore":[71],"environment.":[72],"Besides,":[73],"widely":[75],"used":[76],"requires":[79],"costly":[80],"high":[81],"fidelity":[82,134],"data,":[83],"are":[85],"obtained":[86,136],"from":[87,137],"fine":[88],"simulations.":[89,139],"In":[90,125,175],"this":[91],"article,":[92],"we":[93,178],"propose":[94],"constrained":[96],"batch":[97,111],"approach":[99,185,195],"with":[100],"multifidelity":[102],"(MF)":[103],"solve":[106],"above":[108],"difficulties.":[109],"exploits":[113],"parallel":[114],"computing":[115],"promising":[118],"parameters":[119],"multiple":[121],"acquisition":[122],"function":[123],"ensemble.":[124],"addition,":[126],"MF":[128],"adapts":[131],"low":[133],"data":[135],"coarse":[138],"Specifically,":[140],"proposed":[142,161,184],"method":[143,162],"incorporates":[144],"information":[145],"gain":[146],"weighted":[149],"clustering":[150],"algorithm":[151],"refine":[153],"candidates.":[156],"As":[157],"result,":[159],"maintains":[163],"candidates\u2019":[165],"quality":[166],"diversity,":[168],"speeds":[170],"up":[171],"convergence.":[174],"experiments,":[177],"demonstrate":[179],"efficiency":[181],"of":[182],"three":[187],"real-world":[188],"circuits.":[189],"results":[191],"show":[192],"that":[193],"our":[194],"reduces":[196],"simulation":[198],"costs":[199],"at":[201],"least":[202],"54.6%":[203],"compared":[204],"state-of-the-art":[207],"baselines.":[208]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
