{"id":"https://openalex.org/W4210944453","doi":"https://doi.org/10.1109/tcad.2022.3149856","title":"Efficient Analysis for Mitigation of Workload-Dependent Aging Degradation","display_name":"Efficient Analysis for Mitigation of Workload-Dependent Aging Degradation","publication_year":2022,"publication_date":"2022-02-08","ids":{"openalex":"https://openalex.org/W4210944453","doi":"https://doi.org/10.1109/tcad.2022.3149856"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2022.3149856","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2022.3149856","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103082019","display_name":"Shumpei Morita","orcid":"https://orcid.org/0000-0002-5365-3537"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]},{"id":"https://openalex.org/I39012071","display_name":"Kyoto College of Graduate Studies for Informatics","ror":"https://ror.org/05mzj8a56","country_code":"JP","type":"education","lineage":["https://openalex.org/I39012071"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shumpei Morita","raw_affiliation_strings":["Graduate School of Informatics, Kyoto University, Kyoto, Japan"],"raw_orcid":"https://orcid.org/0000-0002-5365-3537","affiliations":[{"raw_affiliation_string":"Graduate School of Informatics, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242","https://openalex.org/I39012071"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065421587","display_name":"Song Bian","orcid":"https://orcid.org/0000-0003-0467-6203"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Song Bian","raw_affiliation_strings":["School of Cyber Science and Technology, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Cyber Science and Technology, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074380332","display_name":"Michihiro Shintani","orcid":"https://orcid.org/0000-0002-1163-096X"},"institutions":[{"id":"https://openalex.org/I75917431","display_name":"Nara Institute of Science and Technology","ror":"https://ror.org/05bhada84","country_code":"JP","type":"education","lineage":["https://openalex.org/I75917431"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Michihiro Shintani","raw_affiliation_strings":["Graduate School of Science and Technology, Nara Institute of Science and Technology, Nara, Japan"],"raw_orcid":"https://orcid.org/0000-0002-1163-096X","affiliations":[{"raw_affiliation_string":"Graduate School of Science and Technology, Nara Institute of Science and Technology, Nara, Japan","institution_ids":["https://openalex.org/I75917431"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017861176","display_name":"Takashi Sat\u014d","orcid":"https://orcid.org/0000-0002-1577-8259"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]},{"id":"https://openalex.org/I39012071","display_name":"Kyoto College of Graduate Studies for Informatics","ror":"https://ror.org/05mzj8a56","country_code":"JP","type":"education","lineage":["https://openalex.org/I39012071"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Sato","raw_affiliation_strings":["Graduate School of Informatics, Kyoto University, Kyoto, Japan"],"raw_orcid":"https://orcid.org/0000-0002-1577-8259","affiliations":[{"raw_affiliation_string":"Graduate School of Informatics, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242","https://openalex.org/I39012071"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2234,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.42359414,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"41","issue":"12","first_page":"5515","last_page":"5525"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/workload","display_name":"Workload","score":0.8721746206283569},{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.8637008666992188},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7116027474403381},{"id":"https://openalex.org/keywords/duty-cycle","display_name":"Duty cycle","score":0.5920853614807129},{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.5886459946632385},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5778008699417114},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5531085729598999},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5336124897003174},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5084594488143921},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4693877100944519},{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.415605366230011},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3586638569831848},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3388924300670624},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.328609824180603},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24676883220672607},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1787889301776886},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.16610300540924072},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.16192924976348877},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.09787064790725708},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08850321173667908},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.0878954529762268}],"concepts":[{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.8721746206283569},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.8637008666992188},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7116027474403381},{"id":"https://openalex.org/C199822604","wikidata":"https://www.wikidata.org/wiki/Q557120","display_name":"Duty cycle","level":3,"score":0.5920853614807129},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.5886459946632385},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5778008699417114},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5531085729598999},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5336124897003174},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5084594488143921},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4693877100944519},{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.415605366230011},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3586638569831848},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3388924300670624},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.328609824180603},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24676883220672607},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1787889301776886},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.16610300540924072},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.16192924976348877},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.09787064790725708},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08850321173667908},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.0878954529762268},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2022.3149856","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2022.3149856","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3106782779","display_name":"Secure and Efficient Machine Learning Frameworks through Homomorphic Secure Protocols","funder_award_id":"20K19799","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G3483185236","display_name":"Multi-functional and ultra-low-cost disposable healthcare sensors using organic-silicon hybrid circuits","funder_award_id":"20H04156","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G3515084246","display_name":"Clonable PUF: Physical Unclonable Function with Limited Replication","funder_award_id":"20K21793","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G8697649210","display_name":null,"funder_award_id":"20H05156","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320322832","display_name":"University of Tokyo","ror":"https://ror.org/057zh3y96"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1533965610","https://openalex.org/W1967709031","https://openalex.org/W1987145716","https://openalex.org/W1999091229","https://openalex.org/W2000301874","https://openalex.org/W2046094701","https://openalex.org/W2069411775","https://openalex.org/W2102729267","https://openalex.org/W2105561360","https://openalex.org/W2110527999","https://openalex.org/W2126693329","https://openalex.org/W2155105016","https://openalex.org/W2169033838","https://openalex.org/W2170333286","https://openalex.org/W2376780133","https://openalex.org/W2399814356","https://openalex.org/W2562805216","https://openalex.org/W2570862532","https://openalex.org/W2587902172","https://openalex.org/W2607206275","https://openalex.org/W2611199568","https://openalex.org/W2780706692","https://openalex.org/W2799677856","https://openalex.org/W2799820380","https://openalex.org/W2899297761","https://openalex.org/W2904569294","https://openalex.org/W2945148843","https://openalex.org/W3152064381","https://openalex.org/W6678797189","https://openalex.org/W6713034641"],"related_works":["https://openalex.org/W2058965144","https://openalex.org/W2164382479","https://openalex.org/W98480971","https://openalex.org/W2150291671","https://openalex.org/W2027972911","https://openalex.org/W2146343568","https://openalex.org/W2013643406","https://openalex.org/W2157978810","https://openalex.org/W2517623286","https://openalex.org/W2071018290"],"abstract_inverted_index":{"The":[0,98],"effect":[1],"of":[2],"negative":[3],"bias":[4],"temperature":[5],"instability":[6],"(NBTI)":[7],"varies":[8],"significantly":[9],"according":[10],"to":[11,23,72,87,92,113],"given":[12],"workloads.":[13,59],"Finding":[14],"a":[15,93],"feasible":[16],"worst":[17],"case":[18],"workload":[19],"is":[20,65],"difficult":[21],"due":[22],"logical":[24],"correlation":[25],"within":[26],"the":[27,48,62,68,82,114],"logic":[28],"circuit":[29],"under":[30],"consideration.":[31],"In":[32,60],"this":[33],"article,":[34],"we":[35],"propose":[36],"an":[37],"NBTI-aware":[38],"subset":[39],"simulation":[40],"(SS)":[41],"framework":[42],"that":[43],"efficiently":[44],"and":[45],"accurately":[46],"finds":[47],"failure":[49],"probability":[50],"covering":[51],"various":[52],"input":[53,109],"duty":[54,110],"cycles":[55,111],"determined":[56],"by":[57],"different":[58],"addition,":[61],"proposed":[63,83],"method":[64,84],"incorporated":[66],"with":[67],"NBTI":[69,99],"mitigation":[70,100,106],"technique":[71],"facilitate":[73],"workload-aware":[74],"mitigation.":[75],"Through":[76],"numerical":[77],"experiments":[78],"using":[79],"benchmark":[80],"circuits,":[81],"achieves":[85],"up":[86],"36":[88],"times":[89],"speedup":[90],"compared":[91,112],"naive":[94],"Monte":[95],"Carlo":[96],"method.":[97,116],"based":[101],"on":[102],"SS":[103],"demonstrates$1.78\\times":[104],"$better":[105],"for":[107],"multiple":[108],"conventional":[115]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}