{"id":"https://openalex.org/W3137312091","doi":"https://doi.org/10.1109/tcad.2021.3068107","title":"Fast Statistical Analysis of Rare Failure Events With Truncated Normal Distribution in High-Dimensional Variation Space","display_name":"Fast Statistical Analysis of Rare Failure Events With Truncated Normal Distribution in High-Dimensional Variation Space","publication_year":2021,"publication_date":"2021-03-23","ids":{"openalex":"https://openalex.org/W3137312091","doi":"https://doi.org/10.1109/tcad.2021.3068107","mag":"3137312091"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2021.3068107","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2021.3068107","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021178333","display_name":"Zhengqi Gao","orcid":"https://orcid.org/0000-0002-1515-4198"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengqi Gao","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-1515-4198","affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210132426","https://openalex.org/I4391767673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062927280","display_name":"Jun Tao","orcid":"https://orcid.org/0000-0001-8742-687X"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Tao","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-8742-687X","affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210132426","https://openalex.org/I4391767673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101680116","display_name":"Yangfeng Su","orcid":"https://orcid.org/0000-0002-8744-1591"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yangfeng Su","raw_affiliation_strings":["School of Mathematical Sciences, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mathematical Sciences, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054960059","display_name":"Dian Zhou","orcid":"https://orcid.org/0000-0002-2648-5232"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dian Zhou","raw_affiliation_strings":["Department of Electrical Engineering, University of Texas at Dallas, Richardson, TX, USA"],"raw_orcid":"https://orcid.org/0000-0002-2648-5232","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064213921","display_name":"Xuan Zeng","orcid":"https://orcid.org/0000-0002-8097-4053"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuan Zeng","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-8097-4053","affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210132426","https://openalex.org/I4391767673"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100353869","display_name":"Xin Li","orcid":"https://orcid.org/0000-0002-4510-2436"},"institutions":[{"id":"https://openalex.org/I4210159968","display_name":"Duke Kunshan University","ror":"https://ror.org/04sr5ys16","country_code":"CN","type":"education","lineage":["https://openalex.org/I170897317","https://openalex.org/I37461747","https://openalex.org/I4210159968"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Li","raw_affiliation_strings":["Data Science Research Center, Duke Kunshan University, Jiangsu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Data Science Research Center, Duke Kunshan University, Jiangsu, China","institution_ids":["https://openalex.org/I4210159968"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.998,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.78465781,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"41","issue":"3","first_page":"789","last_page":"793"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resampling","display_name":"Resampling","score":0.657764732837677},{"id":"https://openalex.org/keywords/extrapolation","display_name":"Extrapolation","score":0.599130392074585},{"id":"https://openalex.org/keywords/sss*","display_name":"SSS*","score":0.5117220878601074},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4996335506439209},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4871370494365692},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4762180745601654},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.4350026547908783},{"id":"https://openalex.org/keywords/normal-distribution","display_name":"Normal distribution","score":0.4299086928367615},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.42551082372665405},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.32044491171836853},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.23168739676475525},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.09962841868400574},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.09907272458076477}],"concepts":[{"id":"https://openalex.org/C150921843","wikidata":"https://www.wikidata.org/wiki/Q1170431","display_name":"Resampling","level":2,"score":0.657764732837677},{"id":"https://openalex.org/C132459708","wikidata":"https://www.wikidata.org/wiki/Q744069","display_name":"Extrapolation","level":2,"score":0.599130392074585},{"id":"https://openalex.org/C148699463","wikidata":"https://www.wikidata.org/wiki/Q3492668","display_name":"SSS*","level":2,"score":0.5117220878601074},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4996335506439209},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4871370494365692},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4762180745601654},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.4350026547908783},{"id":"https://openalex.org/C102094743","wikidata":"https://www.wikidata.org/wiki/Q133871","display_name":"Normal distribution","level":2,"score":0.4299086928367615},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.42551082372665405},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32044491171836853},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.23168739676475525},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.09962841868400574},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.09907272458076477},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2021.3068107","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2021.3068107","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2318418051","display_name":null,"funder_award_id":"2020YFA0711901","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G5945834488","display_name":null,"funder_award_id":"61874032","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6197183902","display_name":null,"funder_award_id":"61929102","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6863714809","display_name":null,"funder_award_id":"91330201","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6975089314","display_name":null,"funder_award_id":"61774045","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7293827671","display_name":null,"funder_award_id":"91730303","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1988698377","https://openalex.org/W1989728241","https://openalex.org/W2061294987","https://openalex.org/W2120353978","https://openalex.org/W2130282462","https://openalex.org/W2168101540","https://openalex.org/W2519965010","https://openalex.org/W2945015747","https://openalex.org/W2945579250","https://openalex.org/W3139804307","https://openalex.org/W3151880060","https://openalex.org/W4243669666"],"related_works":["https://openalex.org/W2128297914","https://openalex.org/W2508890067","https://openalex.org/W2113168655","https://openalex.org/W1626149224","https://openalex.org/W2002742537","https://openalex.org/W2021159292","https://openalex.org/W5646447","https://openalex.org/W2551994626","https://openalex.org/W2080636732","https://openalex.org/W982686666"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"to":[3,37],"accurately":[4],"estimate":[5],"the":[6,43,65,85,112,121,126],"rare":[7],"failure":[8,57,74,87],"rates":[9],"for":[10,56],"large-scale":[11],"circuits":[12],"(e.g.,":[13],"SRAM)":[14],"where":[15],"process":[16],"variations":[17],"are":[18],"modeled":[19],"as":[20],"truncated":[21,31,44],"normal":[22,45],"distributions":[23,46],"in":[24,52],"high-dimensional":[25],"space,":[26],"we":[27,76],"propose":[28],"a":[29,48,70],"novel":[30],"scaled-sigma":[32,38],"sampling":[33,39],"(T-SSS)":[34],"method.":[35],"Similar":[36],"(SSS),":[40],"T-SSS":[41,94,114],"distorts":[42],"by":[47,89,98],"scaling":[49],"factor,":[50],"resulting":[51],"an":[53],"analytical":[54],"model":[55,81],"rate":[58,88],"estimation.":[59],"By":[60],"drawing":[61],"random":[62],"samples":[63],"from":[64],"distorted":[66],"distribution":[67],"and":[68,83],"estimating":[69,99],"sequence":[71],"of":[72,93],"scaled":[73],"rates,":[75],"can":[77,116],"solve":[78],"all":[79],"unknown":[80],"coefficients":[82],"predict":[84],"original":[86],"extrapolation.":[90],"The":[91],"accuracy":[92,119],"is":[95],"further":[96],"assessed":[97],"its":[100],"confidence":[101],"interval":[102],"(CI)":[103],"based":[104],"on":[105],"resampling.":[106],"Our":[107],"numerical":[108],"results":[109],"demonstrate":[110],"that":[111],"proposed":[113],"method":[115,123],"achieve":[117],"superior":[118],"over":[120],"state-of-the-art":[122],"without":[124],"increasing":[125],"computational":[127],"cost.":[128]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}