{"id":"https://openalex.org/W3008822546","doi":"https://doi.org/10.1109/tcad.2020.2974339","title":"A Simple and Accurate Modeling Method of Channel Thermal Noise Using BSIM4 Noise Models","display_name":"A Simple and Accurate Modeling Method of Channel Thermal Noise Using BSIM4 Noise Models","publication_year":2020,"publication_date":"2020-02-18","ids":{"openalex":"https://openalex.org/W3008822546","doi":"https://doi.org/10.1109/tcad.2020.2974339","mag":"3008822546"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2020.2974339","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2020.2974339","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061855785","display_name":"Ilho Myeong","orcid":"https://orcid.org/0000-0002-3662-0231"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Ilho Myeong","raw_affiliation_strings":["Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea","School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-3662-0231","affiliations":[{"raw_affiliation_string":"Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100770739","display_name":"Juhyun Kim","orcid":"https://orcid.org/0000-0002-3098-5010"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Juhyun Kim","raw_affiliation_strings":["Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea","School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004723387","display_name":"Hyungwoo Ko","orcid":"https://orcid.org/0000-0001-7801-6721"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyungwoo Ko","raw_affiliation_strings":["Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea","School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-7801-6721","affiliations":[{"raw_affiliation_string":"Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062928741","display_name":"Ickhyun Song","orcid":"https://orcid.org/0000-0002-7669-9853"},"institutions":[{"id":"https://openalex.org/I115475287","display_name":"Oklahoma State University","ror":"https://ror.org/01g9vbr38","country_code":"US","type":"education","lineage":["https://openalex.org/I115475287"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ickhyun Song","raw_affiliation_strings":["School of Electrical and Computer Engineering, Oklahoma State University, Stillwater, OK, USA"],"raw_orcid":"https://orcid.org/0000-0002-7669-9853","affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Oklahoma State University, Stillwater, OK, USA","institution_ids":["https://openalex.org/I115475287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100710029","display_name":"Yong-Seok Kim","orcid":"https://orcid.org/0000-0002-7052-4534"},"institutions":[{"id":"https://openalex.org/I4210111902","display_name":"Dongbu HiTek (South Korea)","ror":"https://ror.org/018z3cr21","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210111902"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yongseok Kim","raw_affiliation_strings":["TE Modeling, Technology Development Division, DB HiTek, Gyeonggi, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TE Modeling, Technology Development Division, DB HiTek, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I4210111902"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111914425","display_name":"Hyungcheol Shin","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyungcheol Shin","raw_affiliation_strings":["Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea","School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5061855785"],"corresponding_institution_ids":["https://openalex.org/I139264467"],"apc_list":null,"apc_paid":null,"fwci":0.5202,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.63912691,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"39","issue":"12","first_page":"4351","last_page":"4358"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.7098454236984253},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5716099143028259},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.48678919672966003},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.478891521692276},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.42835763096809387},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3756420612335205},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.34199658036231995},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3404359221458435},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17404979467391968},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12531885504722595},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.11158230900764465}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.7098454236984253},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5716099143028259},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.48678919672966003},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.478891521692276},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.42835763096809387},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3756420612335205},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.34199658036231995},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3404359221458435},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17404979467391968},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12531885504722595},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.11158230900764465},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2020.2974339","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2020.2974339","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1983397169","https://openalex.org/W1986293271","https://openalex.org/W1990853617","https://openalex.org/W2024844287","https://openalex.org/W2065703802","https://openalex.org/W2093053366","https://openalex.org/W2109445684","https://openalex.org/W2110392286","https://openalex.org/W2115249085","https://openalex.org/W2120956030","https://openalex.org/W2121113478","https://openalex.org/W2129137228","https://openalex.org/W2130519062","https://openalex.org/W2141707986","https://openalex.org/W2147369769","https://openalex.org/W2147992897","https://openalex.org/W2148072273","https://openalex.org/W2162927682","https://openalex.org/W2165072054","https://openalex.org/W2169346032","https://openalex.org/W4251197034","https://openalex.org/W6645949316"],"related_works":["https://openalex.org/W1976985527","https://openalex.org/W2368336207","https://openalex.org/W2551698344","https://openalex.org/W1963716487","https://openalex.org/W2354034738","https://openalex.org/W2035196487","https://openalex.org/W2162144182","https://openalex.org/W2382303592","https://openalex.org/W1489340745","https://openalex.org/W2017146373"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,7,66,76],"method":[4],"for":[5,118],"extracting":[6],"channel":[8],"thermal":[9,63,162],"noise":[10,17,22,57,86,163],"(Sid)":[11],"using":[12,156],"analytical":[13],"equations":[14,31],"and":[15,28,34,47,141],"measured":[16,85],"parameters.":[18,87],"Among":[19],"the":[20,30,42,56,61,84,89,92,96,106,111,122,136,149,153,157],"four":[21],"parameters":[23],"considered":[24],"(Rn,":[25],"Gopt,":[26,139],"Bopt,":[27,140],"NFmin),":[29],"of":[32,60,65,91,126,138,148],"Rn":[33],"NFmin":[35,142],"were":[36],"used":[37],"to":[38,79,101,121],"extract":[39],"Sid,":[40],"since":[41],"Sid":[43,81],"extracted":[44,82],"from":[45,83],"Gopt":[46],"Bopt":[48],"was":[49,73,99,165],"affected":[50],"more":[51],"by":[52],"measurement":[53],"variations.":[54],"NTNOI,":[55],"enhancement":[58],"factor":[59],"charge-based":[62],"model":[64,70,113],"Berkeley":[67],"short-channel":[68],"IGFET":[69],"4":[71],"(BSIM4),":[72],"modeled":[74],"as":[75],"gate-bias-dependent":[77],"function":[78],"reproduce":[80],"Regarding":[88],"accuracy":[90,137],"proposed":[93],"model,":[94,159,164],"while":[95],"error":[97,117,125],"rate":[98],"found":[100],"vary":[102],"slightly":[103],"depending":[104],"on":[105],"device":[107],"dimensions":[108],"(finger":[109],"number),":[110],"new":[112],"showed":[114],"only":[115],"4%":[116],"rn,":[119],"compared":[120],"default":[123,150],"model's":[124],"41%":[127],"obtained":[128],"with":[129],"NTNOI":[130],"fixed":[131],"at":[132],"1.":[133],"In":[134],"addition,":[135],"is":[143],"substantially":[144],"higher":[145],"than":[146],"that":[147],"model.":[151],"Finally,":[152],"modeling":[154],"technique":[155],"holistic":[158],"another":[160],"BSIM4":[161],"briefly":[166],"discussed.":[167]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
