{"id":"https://openalex.org/W2999712069","doi":"https://doi.org/10.1109/tcad.2020.2966481","title":"An Efficient Adaptive Importance Sampling Method for SRAM and Analog Yield Analysis","display_name":"An Efficient Adaptive Importance Sampling Method for SRAM and Analog Yield Analysis","publication_year":2020,"publication_date":"2020-01-13","ids":{"openalex":"https://openalex.org/W2999712069","doi":"https://doi.org/10.1109/tcad.2020.2966481","mag":"2999712069"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2020.2966481","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2020.2966481","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102967066","display_name":"Shi Xiao","orcid":"https://orcid.org/0000-0003-1152-0055"},"institutions":[{"id":"https://openalex.org/I161318765","display_name":"University of California, Los Angeles","ror":"https://ror.org/046rm7j60","country_code":"US","type":"education","lineage":["https://openalex.org/I161318765"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiao Shi","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of California at Los Angeles, Los Angeles, CA, USA"],"raw_orcid":"https://orcid.org/0000-0003-1152-0055","affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of California at Los Angeles, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I161318765"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040139371","display_name":"Hao Yan","orcid":"https://orcid.org/0000-0002-5312-4483"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Yan","raw_affiliation_strings":["National ASIC Research Center, Southeast University, Nanjing, China","[National ASIC Research Center, Southeast University, Nanjing, China]"],"raw_orcid":"https://orcid.org/0000-0002-5312-4483","affiliations":[{"raw_affiliation_string":"National ASIC Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"[National ASIC Research Center, Southeast University, Nanjing, China]","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100376129","display_name":"Jinxin Wang","orcid":"https://orcid.org/0000-0003-4205-7673"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinxin Wang","raw_affiliation_strings":["National ASIC Research Center, Southeast University, Nanjing, China","[National ASIC Research Center, Southeast University, Nanjing, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National ASIC Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"[National ASIC Research Center, Southeast University, Nanjing, China]","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100417646","display_name":"Jiajia Zhang","orcid":"https://orcid.org/0000-0003-2796-657X"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiajia Zhang","raw_affiliation_strings":["National ASIC Research Center, Southeast University, Nanjing, China","[National ASIC Research Center, Southeast University, Nanjing, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National ASIC Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"[National ASIC Research Center, Southeast University, Nanjing, China]","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101499715","display_name":"Longxing Shi","orcid":"https://orcid.org/0000-0002-0629-7154"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longxing Shi","raw_affiliation_strings":["National ASIC Research Center, Southeast University, Nanjing, China","[National ASIC Research Center, Southeast University, Nanjing, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National ASIC Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"[National ASIC Research Center, Southeast University, Nanjing, China]","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008695429","display_name":"Lei He","orcid":"https://orcid.org/0000-0002-5266-3805"},"institutions":[{"id":"https://openalex.org/I161318765","display_name":"University of California, Los Angeles","ror":"https://ror.org/046rm7j60","country_code":"US","type":"education","lineage":["https://openalex.org/I161318765"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lei He","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of California at Los Angeles, Los Angeles, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-5266-3805","affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of California at Los Angeles, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I161318765"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1802,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.75813495,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"39","issue":"12","first_page":"4999","last_page":"5010"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.6128847599029541},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5799689888954163},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.51976078748703},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4717106521129608},{"id":"https://openalex.org/keywords/adaptive-sampling","display_name":"Adaptive sampling","score":0.43116453289985657},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.36810973286628723},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3164070248603821},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.18864619731903076},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1314733624458313},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.11274093389511108},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.08748728036880493}],"concepts":[{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.6128847599029541},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5799689888954163},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.51976078748703},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4717106521129608},{"id":"https://openalex.org/C2781395549","wikidata":"https://www.wikidata.org/wiki/Q4680762","display_name":"Adaptive sampling","level":3,"score":0.43116453289985657},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.36810973286628723},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3164070248603821},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.18864619731903076},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1314733624458313},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.11274093389511108},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.08748728036880493},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2020.2966481","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2020.2966481","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W193851967","https://openalex.org/W2029698240","https://openalex.org/W2033246483","https://openalex.org/W2040196349","https://openalex.org/W2057487175","https://openalex.org/W2076092328","https://openalex.org/W2083782718","https://openalex.org/W2092101442","https://openalex.org/W2103793078","https://openalex.org/W2119312496","https://openalex.org/W2120353978","https://openalex.org/W2153628901","https://openalex.org/W2158683023","https://openalex.org/W2272328839","https://openalex.org/W2329870304","https://openalex.org/W2519965010","https://openalex.org/W2566193534","https://openalex.org/W2768460200","https://openalex.org/W2809533575","https://openalex.org/W2945015747","https://openalex.org/W3139804307","https://openalex.org/W3151457670","https://openalex.org/W4247460323","https://openalex.org/W4251232855","https://openalex.org/W6607944616","https://openalex.org/W6752792481"],"related_works":["https://openalex.org/W2038693912","https://openalex.org/W1991602789","https://openalex.org/W1582396021","https://openalex.org/W1988359706","https://openalex.org/W312558119","https://openalex.org/W4210985407","https://openalex.org/W3107697994","https://openalex.org/W138014004","https://openalex.org/W2075598034","https://openalex.org/W1829869244"],"abstract_inverted_index":{"Performance":[0],"failure":[1,21,75,96,123],"has":[2,44],"become":[3],"a":[4,55,117],"major":[5],"threat":[6],"for":[7,74],"various":[8],"memory":[9],"and":[10,67,87,106,135,146,158],"analog":[11],"circuits.":[12],"It":[13],"is":[14,128],"challenging":[15],"to":[16,71,112],"estimate":[17],"the":[18,81,98,125,151],"extremely":[19],"small":[20],"probability":[22],"when":[23,110],"failed":[24],"samples":[25,105],"are":[26],"distributed":[27],"in":[28],"multiple":[29,122],"disjoint":[30],"regions.":[31,76],"In":[32],"this":[33],"article,":[34],"we":[35],"propose":[36],"an":[37],"adaptive":[38,62],"importance":[39],"sampling":[40,48,57],"(AIS)":[41],"algorithm.":[42],"AIS":[43,82,99,126,152],"several":[45,113],"iterations":[46],"of":[47,80],"region":[49],"adjustments,":[50],"while":[51],"existing":[52],"methods":[53],"predecide":[54],"static":[56],"distribution.":[58],"We":[59],"design":[60],"two":[61],"frameworks":[63],"based":[64],"on":[65],"resampling":[66],"population":[68],"Metropolis-Hastings":[69],"(MH)":[70],"iteratively":[72],"search":[73],"The":[77],"experimental":[78],"results":[79],"method":[83,100,127,153],"exhibit":[84],"better":[85,108],"efficiency":[86],"higher":[88],"accuracy.":[89],"For":[90,116,142],"SRAM":[91],"bit":[92],"cell":[93],"with":[94,121],"single":[95],"region,":[97],"uses":[101],"2-$27{\\times":[102],"}$":[103,130,138,157,160],"fewer":[104],"reaches":[107],"accuracy":[109],"compared":[111],"recent":[114],"methods.":[115,141],"two-stage":[118],"amplifier":[119],"circuit":[120,145],"regions,":[124],"$90{\\times":[129],"faster":[131],"than":[132],"Monte":[133],"Carlo":[134],"7-23":[136],"${\\times":[137],"over":[139,162],"other":[140,163],"charge":[143],"pump":[144],"$C^{2}MOS$":[147],"master-slave":[148],"latch":[149],"circuit,":[150],"can":[154],"reach":[155],"6-$18{\\times":[156],"4-$6{\\times":[159],"speedup":[161],"methods,":[164],"respectively.":[165]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":7},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}