{"id":"https://openalex.org/W2942195480","doi":"https://doi.org/10.1109/tcad.2019.2912946","title":"Memristor Model Optimization Based on Parameter Extraction From Device Characterization Data","display_name":"Memristor Model Optimization Based on Parameter Extraction From Device Characterization Data","publication_year":2019,"publication_date":"2019-04-25","ids":{"openalex":"https://openalex.org/W2942195480","doi":"https://doi.org/10.1109/tcad.2019.2912946","mag":"2942195480"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2019.2912946","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2019.2912946","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055959085","display_name":"Chris Yakopcic","orcid":"https://orcid.org/0000-0001-6401-272X"},"institutions":[{"id":"https://openalex.org/I127591826","display_name":"University of Dayton","ror":"https://ror.org/021v3qy27","country_code":"US","type":"education","lineage":["https://openalex.org/I127591826"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chris Yakopcic","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Dayton, Dayton, USA"],"raw_orcid":"https://orcid.org/0000-0001-6401-272X","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Dayton, Dayton, USA","institution_ids":["https://openalex.org/I127591826"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104090957","display_name":"Tarek M. Taha","orcid":null},"institutions":[{"id":"https://openalex.org/I127591826","display_name":"University of Dayton","ror":"https://ror.org/021v3qy27","country_code":"US","type":"education","lineage":["https://openalex.org/I127591826"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tarek M. Taha","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Dayton, Dayton, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Dayton, Dayton, USA","institution_ids":["https://openalex.org/I127591826"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032088072","display_name":"David J. Mountain","orcid":"https://orcid.org/0000-0002-4071-2702"},"institutions":[{"id":"https://openalex.org/I4210113003","display_name":"Physical Sciences (United States)","ror":"https://ror.org/021qvjc46","country_code":"US","type":"company","lineage":["https://openalex.org/I4210113003"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David J. Mountain","raw_affiliation_strings":["Advanced Computing Systems Research Program, Laboratory for Physical Sciences at Research Park, Catonsville, USA"],"raw_orcid":"https://orcid.org/0000-0002-4071-2702","affiliations":[{"raw_affiliation_string":"Advanced Computing Systems Research Program, Laboratory for Physical Sciences at Research Park, Catonsville, USA","institution_ids":["https://openalex.org/I4210113003"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008910976","display_name":"Thomas Salter","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113003","display_name":"Physical Sciences (United States)","ror":"https://ror.org/021qvjc46","country_code":"US","type":"company","lineage":["https://openalex.org/I4210113003"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Thomas Salter","raw_affiliation_strings":["Advanced Computing Systems Research Program, Laboratory for Physical Sciences at Research Park, Catonsville, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Computing Systems Research Program, Laboratory for Physical Sciences at Research Park, Catonsville, USA","institution_ids":["https://openalex.org/I4210113003"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017426058","display_name":"Matthew Marinella","orcid":"https://orcid.org/0000-0002-6537-1836"},"institutions":[{"id":"https://openalex.org/I192454743","display_name":"Sandia National Laboratories California","ror":"https://ror.org/058m7ey48","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1330989302","https://openalex.org/I192454743","https://openalex.org/I198811213","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew J. Marinella","raw_affiliation_strings":["Advanced Semiconductor Device Research and Development, Sandia National Laboratories, Albuquerque, USA"],"raw_orcid":"https://orcid.org/0000-0002-6537-1836","affiliations":[{"raw_affiliation_string":"Advanced Semiconductor Device Research and Development, Sandia National Laboratories, Albuquerque, USA","institution_ids":["https://openalex.org/I192454743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067728478","display_name":"Mark McLean","orcid":"https://orcid.org/0000-0001-5565-785X"},"institutions":[{"id":"https://openalex.org/I4210113003","display_name":"Physical Sciences (United States)","ror":"https://ror.org/021qvjc46","country_code":"US","type":"company","lineage":["https://openalex.org/I4210113003"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark McLean","raw_affiliation_strings":["Advanced Computing Systems Research Program, Laboratory for Physical Sciences at Research Park, Catonsville, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Computing Systems Research Program, Laboratory for Physical Sciences at Research Park, Catonsville, USA","institution_ids":["https://openalex.org/I4210113003"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.8681,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.85859784,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"39","issue":"5","first_page":"1084","last_page":"1095"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10660","display_name":"Conducting polymers and applications","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.9210890531539917},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6228196620941162},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.6140179634094238},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5336953401565552},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5142533183097839},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.5062683820724487},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.45611095428466797},{"id":"https://openalex.org/keywords/curve-fitting","display_name":"Curve fitting","score":0.4390052556991577},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.43230587244033813},{"id":"https://openalex.org/keywords/data-set","display_name":"Data set","score":0.42793595790863037},{"id":"https://openalex.org/keywords/memistor","display_name":"Memistor","score":0.4247346818447113},{"id":"https://openalex.org/keywords/experimental-data","display_name":"Experimental data","score":0.4243129789829254},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34924548864364624},{"id":"https://openalex.org/keywords/biological-system","display_name":"Biological system","score":0.3345497250556946},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.26283425092697144},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.22587370872497559},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.15713974833488464},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.15046384930610657},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.14583036303520203},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14350023865699768},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14088457822799683},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10372298955917358},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09382116794586182}],"concepts":[{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.9210890531539917},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6228196620941162},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.6140179634094238},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5336953401565552},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5142533183097839},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.5062683820724487},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.45611095428466797},{"id":"https://openalex.org/C184389593","wikidata":"https://www.wikidata.org/wiki/Q603159","display_name":"Curve fitting","level":2,"score":0.4390052556991577},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.43230587244033813},{"id":"https://openalex.org/C58489278","wikidata":"https://www.wikidata.org/wiki/Q1172284","display_name":"Data set","level":2,"score":0.42793595790863037},{"id":"https://openalex.org/C1895703","wikidata":"https://www.wikidata.org/wiki/Q6034938","display_name":"Memistor","level":4,"score":0.4247346818447113},{"id":"https://openalex.org/C55037315","wikidata":"https://www.wikidata.org/wiki/Q5421151","display_name":"Experimental data","level":2,"score":0.4243129789829254},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34924548864364624},{"id":"https://openalex.org/C186060115","wikidata":"https://www.wikidata.org/wiki/Q30336093","display_name":"Biological system","level":1,"score":0.3345497250556946},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.26283425092697144},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22587370872497559},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.15713974833488464},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.15046384930610657},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.14583036303520203},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14350023865699768},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14088457822799683},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10372298955917358},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09382116794586182},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2019.2912946","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2019.2912946","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5699999928474426}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":64,"referenced_works":["https://openalex.org/W174928017","https://openalex.org/W1578783943","https://openalex.org/W1914934879","https://openalex.org/W1964751313","https://openalex.org/W1965288361","https://openalex.org/W2002184239","https://openalex.org/W2008901850","https://openalex.org/W2013055927","https://openalex.org/W2016564072","https://openalex.org/W2016922062","https://openalex.org/W2027895023","https://openalex.org/W2038493039","https://openalex.org/W2069233440","https://openalex.org/W2075493167","https://openalex.org/W2080659521","https://openalex.org/W2089597903","https://openalex.org/W2093981880","https://openalex.org/W2108343465","https://openalex.org/W2110697514","https://openalex.org/W2112181056","https://openalex.org/W2114665523","https://openalex.org/W2119569919","https://openalex.org/W2122148191","https://openalex.org/W2153251307","https://openalex.org/W2153690880","https://openalex.org/W2154478031","https://openalex.org/W2157729981","https://openalex.org/W2159461700","https://openalex.org/W2161330443","https://openalex.org/W2162279286","https://openalex.org/W2162651880","https://openalex.org/W2163031927","https://openalex.org/W2166432809","https://openalex.org/W2168454477","https://openalex.org/W2313645715","https://openalex.org/W2315023655","https://openalex.org/W2468082729","https://openalex.org/W2501149572","https://openalex.org/W2509848459","https://openalex.org/W2533869951","https://openalex.org/W2546031353","https://openalex.org/W2548790537","https://openalex.org/W2554183644","https://openalex.org/W2556305966","https://openalex.org/W2562554684","https://openalex.org/W2570985767","https://openalex.org/W2603064927","https://openalex.org/W2611311053","https://openalex.org/W2735482625","https://openalex.org/W2768879618","https://openalex.org/W2783010598","https://openalex.org/W2783539394","https://openalex.org/W2801005785","https://openalex.org/W2801737682","https://openalex.org/W2803003891","https://openalex.org/W2888248059","https://openalex.org/W2889002427","https://openalex.org/W2889441566","https://openalex.org/W2890045559","https://openalex.org/W2890071049","https://openalex.org/W3106114372","https://openalex.org/W3151055086","https://openalex.org/W6723952408","https://openalex.org/W6736339276"],"related_works":["https://openalex.org/W3170109256","https://openalex.org/W2185262500","https://openalex.org/W4251693286","https://openalex.org/W1543954628","https://openalex.org/W4385367273","https://openalex.org/W2780290013","https://openalex.org/W2797315502","https://openalex.org/W2163054919","https://openalex.org/W4252977987","https://openalex.org/W3216217287"],"abstract_inverted_index":{"This":[0,92],"paper":[1],"presents":[2],"a":[3,11,19,27,50,82,145,156],"memristive":[4],"device":[5],"model":[6,66,73,90,93],"capable":[7],"of":[8,14,29,139,152],"accurately":[9],"matching":[10],"wide":[12],"range":[13],"characterization":[15,103],"data":[16,104],"collected":[17],"from":[18,109,121],"tantalum":[20,124],"oxide":[21,125],"memristor.":[22],"Memristor":[23],"models":[24],"commonly":[25],"use":[26],"set":[28],"equations":[30],"and":[31,171],"fitting":[32,62],"parameters":[33,74],"to":[34,59,68,101,135],"match":[35,100],"the":[36,47,65,97,102,110,128,137,150],"complex":[37],"dynamic":[38],"conductivity":[39],"pattern":[40],"observed":[41],"in":[42,64,168],"these":[43],"devices.":[44],"Along":[45],"with":[46],"proposed":[48],"model,":[49],"procedure":[51,80],"is":[52,87],"also":[53],"described":[54],"that":[55],"can":[56],"be":[57],"used":[58],"optimize":[60],"each":[61],"parameter":[63],"relative":[67],"an":[69,169],"I-V":[70,85,117],"curve.":[71],"Therefore,":[72],"are":[75,119,164],"self-updated":[76],"based":[77],"on":[78,144],"this":[79,113,162],"when":[81],"new":[83],"cyclic":[84,116],"sweep":[86],"provided":[88],"for":[89,160],"optimization.":[91],"will":[94],"automatically":[95],"provide":[96],"best":[98],"possible":[99],"without":[105],"any":[106],"additional":[107],"optimization":[108],"user.":[111],"In":[112],"paper,":[114],"multiple":[115],"characterizations":[118],"modeled":[120],"ten":[122],"different":[123],"devices":[126,143],"(on":[127],"same":[129],"wafer).":[130],"Additionally,":[131],"studies":[132],"were":[133],"completed":[134],"demonstrate":[136],"amount":[138,151],"variation":[140,153,163],"present":[141,154],"between":[142],"wafer,":[146],"as":[147,149],"well":[148],"within":[155],"single":[157],"device.":[158],"Methods":[159],"modeling":[161,175],"then":[165],"proposed,":[166],"resulting":[167],"accurate":[170],"complete,":[172],"automated,":[173],"memristor":[174],"approach.":[176]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}