{"id":"https://openalex.org/W2898416406","doi":"https://doi.org/10.1109/tcad.2018.2878169","title":"Predicting ${X}$ -Sensitivity of Circuit-Inputs on Test-Coverage: A Machine-Learning Approach","display_name":"Predicting ${X}$ -Sensitivity of Circuit-Inputs on Test-Coverage: A Machine-Learning Approach","publication_year":2018,"publication_date":"2018-10-25","ids":{"openalex":"https://openalex.org/W2898416406","doi":"https://doi.org/10.1109/tcad.2018.2878169","mag":"2898416406"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2018.2878169","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2018.2878169","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087927094","display_name":"Manjari Pradhan","orcid":null},"institutions":[{"id":"https://openalex.org/I6498739","display_name":"Indian Statistical Institute","ror":"https://ror.org/00q2w1j53","country_code":"IN","type":"education","lineage":["https://openalex.org/I6498739"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Manjari Pradhan","raw_affiliation_strings":["Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India"],"affiliations":[{"raw_affiliation_string":"Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India","institution_ids":["https://openalex.org/I6498739"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052870102","display_name":"Bhaswar B. Bhattacharya","orcid":"https://orcid.org/0000-0002-2528-843X"},"institutions":[{"id":"https://openalex.org/I6498739","display_name":"Indian Statistical Institute","ror":"https://ror.org/00q2w1j53","country_code":"IN","type":"education","lineage":["https://openalex.org/I6498739"]},{"id":"https://openalex.org/I79576946","display_name":"University of Pennsylvania","ror":"https://ror.org/00b30xv10","country_code":"US","type":"education","lineage":["https://openalex.org/I79576946"]}],"countries":["IN","US"],"is_corresponding":false,"raw_author_name":"Bhaswar B. Bhattacharya","raw_affiliation_strings":["Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India","Wharton Statistics Department, University of Pennsylvania, Philadelphia, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India","institution_ids":["https://openalex.org/I6498739"]},{"raw_affiliation_string":"Wharton Statistics Department, University of Pennsylvania, Philadelphia, USA","institution_ids":["https://openalex.org/I79576946"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, USA","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067730042","display_name":"Bhargab B. Bhattacharya","orcid":"https://orcid.org/0000-0002-5890-2483"},"institutions":[{"id":"https://openalex.org/I6498739","display_name":"Indian Statistical Institute","ror":"https://ror.org/00q2w1j53","country_code":"IN","type":"education","lineage":["https://openalex.org/I6498739"]},{"id":"https://openalex.org/I79576946","display_name":"University of Pennsylvania","ror":"https://ror.org/00b30xv10","country_code":"US","type":"education","lineage":["https://openalex.org/I79576946"]}],"countries":["IN","US"],"is_corresponding":false,"raw_author_name":"Bhargab B. Bhattacharya","raw_affiliation_strings":["Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India","Wharton Statistics Department, University of Pennsylvania, Philadelphia, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India","institution_ids":["https://openalex.org/I6498739"]},{"raw_affiliation_string":"Wharton Statistics Department, University of Pennsylvania, Philadelphia, USA","institution_ids":["https://openalex.org/I79576946"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5087927094"],"corresponding_institution_ids":["https://openalex.org/I6498739"],"apc_list":null,"apc_paid":null,"fwci":2.0197,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.86788071,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"38","issue":"12","first_page":"2343","last_page":"2356"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5197341442108154},{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.486460417509079},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.4362734854221344},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42505139112472534},{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.42185232043266296},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3788555860519409},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.3181172311306},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.10870051383972168}],"concepts":[{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5197341442108154},{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.486460417509079},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.4362734854221344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42505139112472534},{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.42185232043266296},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3788555860519409},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.3181172311306},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.10870051383972168},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2018.2878169","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2018.2878169","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":59,"referenced_works":["https://openalex.org/W73629738","https://openalex.org/W156271197","https://openalex.org/W1487496064","https://openalex.org/W1554944419","https://openalex.org/W1600537614","https://openalex.org/W1601643892","https://openalex.org/W1844723944","https://openalex.org/W1964357740","https://openalex.org/W1977294468","https://openalex.org/W1995945562","https://openalex.org/W2019631303","https://openalex.org/W2027752285","https://openalex.org/W2039970904","https://openalex.org/W2051695371","https://openalex.org/W2058785831","https://openalex.org/W2063123613","https://openalex.org/W2065005875","https://openalex.org/W2067105175","https://openalex.org/W2071460053","https://openalex.org/W2073369140","https://openalex.org/W2087365878","https://openalex.org/W2094438930","https://openalex.org/W2095547201","https://openalex.org/W2097350515","https://openalex.org/W2101234009","https://openalex.org/W2110490782","https://openalex.org/W2121166935","https://openalex.org/W2124618076","https://openalex.org/W2133563096","https://openalex.org/W2134643952","https://openalex.org/W2137442640","https://openalex.org/W2139009001","https://openalex.org/W2146837256","https://openalex.org/W2152406824","https://openalex.org/W2156909104","https://openalex.org/W2158994553","https://openalex.org/W2171033594","https://openalex.org/W2210504300","https://openalex.org/W2271460598","https://openalex.org/W2313270384","https://openalex.org/W2345616536","https://openalex.org/W2499678836","https://openalex.org/W2592974517","https://openalex.org/W2735868545","https://openalex.org/W2740369419","https://openalex.org/W2743316100","https://openalex.org/W2794181462","https://openalex.org/W2797532987","https://openalex.org/W3019365222","https://openalex.org/W3106889297","https://openalex.org/W3147017700","https://openalex.org/W4235050476","https://openalex.org/W4256046779","https://openalex.org/W6655113542","https://openalex.org/W6663557909","https://openalex.org/W6675354045","https://openalex.org/W6680306327","https://openalex.org/W6740814466","https://openalex.org/W6742068993"],"related_works":["https://openalex.org/W2170314243","https://openalex.org/W2119179026","https://openalex.org/W2794947590","https://openalex.org/W2114971758","https://openalex.org/W2109932036","https://openalex.org/W2093081283","https://openalex.org/W4313118781","https://openalex.org/W2354546390","https://openalex.org/W2159172546","https://openalex.org/W2127141320"],"abstract_inverted_index":{"Digital":[0],"circuits":[1,191],"are":[2,53,148],"often":[3],"prone":[4],"to":[5,150,171],"suffer":[6],"from":[7,152],"uncertain":[8],"timing,":[9],"inadequate":[10],"sensor":[11],"feedback,":[12],"limited":[13],"controllability":[14],"of":[15,20,26,72,87,94,96,120,130,132,137,144,198],"past":[16],"states":[17],"or":[18,84],"inability":[19],"initializing":[21],"memory-banks,":[22],"and":[23,107,196],"erroneous":[24],"behavior":[25],"analog-to-digital":[27],"converters,":[28],"which":[29],"may":[30,91,103],"produce":[31],"an":[32],"unknown":[33],"(":[34],"<inline-formula":[35,63,74,121,159],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[36,64,75,122,160],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[37,65,76,123,161],"<tex-math":[38,66,77,124,162],"notation=\"LaTeX\">${X}$":[39,67,78,125,163],"</tex-math></inline-formula>":[40,68,79,126,164],")":[41],"logic":[42,89],"value":[43],"at":[44],"various":[45],"circuit":[46,90,146],"nodes.":[47],"Additionally,":[48],"many":[49],"design":[50],"bugs":[51],"that":[52,147,157],"identified":[54],"during":[55],"the":[56,118,135,145,153,158,180,193],"post-silicon":[57],"validation":[58],"phase":[59],"manifest":[60],"themselves":[61],"as":[62],"-values.":[69],"The":[70],"presence":[71],"such":[73],"-sources":[80,127,165],"on":[81,134,188],"certain":[82],"primary":[83],"secondary":[85],"inputs":[86],"a":[88,97,114,140],"cause":[92],"loss":[93,131],"fault-coverage":[95],"test":[98],"set,":[99],"which,":[100],"in":[101,128],"turn,":[102],"impact":[104],"its":[105],"reliability":[106],"robustness.":[108],"In":[109],"this":[110],"paper,":[111],"we":[112],"provide":[113],"mechanism":[115],"for":[116,182],"predicting":[117],"sensitivity":[119,173],"terms":[129],"fault-coverage,":[133],"basis":[136],"learning":[138],"only":[139],"few":[141],"structural":[142],"features":[143],"easy":[149],"extract":[151],"netlist.":[154],"We":[155],"show":[156],"can":[166],"be":[167],"graded":[168],"satisfactorily":[169],"according":[170],"their":[172],"using":[174],"support":[175],"vector":[176],"regression,":[177],"thereby":[178],"obviating":[179],"need":[181],"costly":[183],"explicit":[184],"simulation.":[185],"Experimental":[186],"results":[187],"several":[189],"benchmark":[190],"demonstrate":[192],"efficacy,":[194],"speed,":[195],"accuracy":[197],"prediction.":[199]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}