{"id":"https://openalex.org/W2803147926","doi":"https://doi.org/10.1109/tcad.2018.2837103","title":"Hybrid Quick Error Detection: Validation and Debug of SoCs Through High-Level Synthesis","display_name":"Hybrid Quick Error Detection: Validation and Debug of SoCs Through High-Level Synthesis","publication_year":2018,"publication_date":"2018-05-16","ids":{"openalex":"https://openalex.org/W2803147926","doi":"https://doi.org/10.1109/tcad.2018.2837103","mag":"2803147926"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2018.2837103","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2018.2837103","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041491379","display_name":"Keith A. Campbell","orcid":"https://orcid.org/0000-0002-3610-5256"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Keith Campbell","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Illinois at Urbana\u2013Champaign, Champaign, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Illinois at Urbana\u2013Champaign, Champaign, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043891822","display_name":"David C. Lin","orcid":"https://orcid.org/0000-0003-4492-0944"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Lin","raw_affiliation_strings":["Department of Electrical Engineering, Stanford University, Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Stanford University, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067099793","display_name":"Leon He","orcid":"https://orcid.org/0000-0002-4317-9915"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Leon He","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Illinois at Urbana\u2013Champaign, Champaign, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Illinois at Urbana\u2013Champaign, Champaign, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036121633","display_name":"Liwei Yang","orcid":"https://orcid.org/0000-0003-3345-5899"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Liwei Yang","raw_affiliation_strings":["Inspirit IoT Inc., Champaign, IL, USA"],"affiliations":[{"raw_affiliation_string":"Inspirit IoT Inc., Champaign, IL, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026163196","display_name":"Swathi Gurumani","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Swathi T. Gurumani","raw_affiliation_strings":["Inspirit IoT Inc., Champaign, IL, USA"],"affiliations":[{"raw_affiliation_string":"Inspirit IoT Inc., Champaign, IL, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090843153","display_name":"Kyle Rupnow","orcid":"https://orcid.org/0000-0003-2908-2225"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kyle Rupnow","raw_affiliation_strings":["Inspirit IoT Inc., Champaign, IL, USA"],"affiliations":[{"raw_affiliation_string":"Inspirit IoT Inc., Champaign, IL, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036312663","display_name":"Subhasish Mitra","orcid":"https://orcid.org/0000-0002-5572-5194"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Subhasish Mitra","raw_affiliation_strings":["Department of Electrical Engineering, Stanford University, Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Stanford University, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056321228","display_name":"Deming Chen","orcid":"https://orcid.org/0000-0002-3016-0270"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Deming Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Illinois at Urbana\u2013Champaign, Champaign, IL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Illinois at Urbana\u2013Champaign, Champaign, IL, USA","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5041491379"],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":null,"apc_paid":null,"fwci":0.2575,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55575154,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"38","issue":"7","first_page":"1345","last_page":"1358"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.8892556428909302},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7311543226242065},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6912816762924194},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6578370928764343},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5725041031837463},{"id":"https://openalex.org/keywords/high-level-synthesis","display_name":"High-level synthesis","score":0.5436139106750488},{"id":"https://openalex.org/keywords/suite","display_name":"Suite","score":0.4615509510040283},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.15895932912826538},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1461942195892334}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.8892556428909302},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7311543226242065},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6912816762924194},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6578370928764343},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5725041031837463},{"id":"https://openalex.org/C58013763","wikidata":"https://www.wikidata.org/wiki/Q5754574","display_name":"High-level synthesis","level":3,"score":0.5436139106750488},{"id":"https://openalex.org/C79581498","wikidata":"https://www.wikidata.org/wiki/Q1367530","display_name":"Suite","level":2,"score":0.4615509510040283},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.15895932912826538},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1461942195892334},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2018.2837103","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2018.2837103","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.9100000262260437}],"awards":[{"id":"https://openalex.org/G7925149951","display_name":null,"funder_award_id":"2014-HJ-2505","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"}],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W1970032753","https://openalex.org/W1974635992","https://openalex.org/W1981504678","https://openalex.org/W1981514768","https://openalex.org/W2004144979","https://openalex.org/W2006397252","https://openalex.org/W2009541799","https://openalex.org/W2014071060","https://openalex.org/W2021944457","https://openalex.org/W2040654750","https://openalex.org/W2049880113","https://openalex.org/W2057807751","https://openalex.org/W2062677539","https://openalex.org/W2063477863","https://openalex.org/W2063922433","https://openalex.org/W2066462613","https://openalex.org/W2066929795","https://openalex.org/W2072073269","https://openalex.org/W2074741789","https://openalex.org/W2087852986","https://openalex.org/W2093617526","https://openalex.org/W2094998159","https://openalex.org/W2098771792","https://openalex.org/W2122444922","https://openalex.org/W2129673456","https://openalex.org/W2134643952","https://openalex.org/W2141710608","https://openalex.org/W2143849045","https://openalex.org/W2149475760","https://openalex.org/W2151845324","https://openalex.org/W2153185479","https://openalex.org/W2153295660","https://openalex.org/W2156591015","https://openalex.org/W2158302200","https://openalex.org/W2161957517","https://openalex.org/W2162979607","https://openalex.org/W2166029537","https://openalex.org/W2172121474","https://openalex.org/W2275549139","https://openalex.org/W2402979134","https://openalex.org/W4230252678","https://openalex.org/W4248445118","https://openalex.org/W4251683102","https://openalex.org/W6666449423","https://openalex.org/W6682867524","https://openalex.org/W6833555142"],"related_works":["https://openalex.org/W2083794993","https://openalex.org/W4379115841","https://openalex.org/W3194833114","https://openalex.org/W1511772879","https://openalex.org/W4205868343","https://openalex.org/W3170750609","https://openalex.org/W2979471250","https://openalex.org/W2127898439","https://openalex.org/W2186315912","https://openalex.org/W2098397451"],"abstract_inverted_index":{"Validation":[0],"and":[1,24,50,83,97,130,174],"debug":[2,51,84],"challenges":[3,85],"of":[4,16,32,36,52,121],"system-on-chips":[5],"(SoCs)":[6],"are":[7],"getting":[8],"increasingly":[9],"difficult.":[10],"As":[11],"we":[12,71,175],"reach":[13],"the":[14,30,48,73,95,147,156],"limits":[15],"Dennard":[17],"scaling,":[18],"efforts":[19],"to":[20,46,62,113,136,179],"improve":[21],"system":[22],"performance":[23,169],"energy":[25],"efficiency":[26],"have":[27],"resulted":[28],"in":[29,40,93,127,146],"integration":[31],"a":[33,59,109],"wide":[34],"variety":[35],"complex":[37],"hardware":[38,53,66,87],"accelerators":[39,88],"SoCs.":[41],"Hence,":[42],"it":[43,115],"is":[44,58,111,116,152],"essential":[45],"address":[47],"validation":[49,82,138],"accelerators.":[54,67],"High-level":[55],"synthesis":[56],"(HLS)":[57],"promising":[60],"technique":[61],"rapidly":[63],"create":[64],"customized":[65],"In":[68],"this":[69],"paper,":[70],"present":[72],"hybrid":[74],"quick":[75],"error":[76,102],"detection":[77,103],"(H-QED)":[78],"approach":[79],"that":[80],"overcomes":[81],"for":[86,171],"by":[89,118,155,185],"leveraging":[90],"HLS":[91,157],"techniques":[92,178],"both":[94],"presilicon":[96,128],"post-silicon":[98,172],"stages.":[99],"H-QED":[100,140,159],"improves":[101],"latencies":[104,126],"(time":[105],"elapsed":[106],"from":[107],"when":[108,114],"bug":[110,131],"activated":[112],"detected)":[117],"2-5":[119],"orders":[120],"magnitude":[122],"with":[123,166],"one":[124],"cycle":[125],"scenarios":[129],"coverage":[132],"threefold":[133],"higher":[134],"compared":[135],"traditional":[137],"techniques.":[139],"also":[141,176],"uncovered":[142],"previously":[143],"unknown":[144],"bugs":[145],"CHStone":[148],"benchmark":[149],"suite,":[150],"which":[151],"widely":[153],"used":[154],"community.":[158],"incurs":[160],"an":[161],"8%":[162],"accelerator":[163],"area":[164],"overhead":[165],"negligible":[167],"silicon":[168],"impact":[170],"stage,":[173],"introduce":[177],"minimize":[180],"any":[181],"possible":[182],"intrusiveness":[183],"introduced":[184],"H-QED.":[186]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}