{"id":"https://openalex.org/W2791589347","doi":"https://doi.org/10.1109/tcad.2018.2801240","title":"Hardware Protection via Logic Locking Test Points","display_name":"Hardware Protection via Logic Locking Test Points","publication_year":2018,"publication_date":"2018-02-02","ids":{"openalex":"https://openalex.org/W2791589347","doi":"https://doi.org/10.1109/tcad.2018.2801240","mag":"2791589347"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2018.2801240","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2018.2801240","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100705950","display_name":"Michael Chen","orcid":"https://orcid.org/0000-0003-2951-8295"},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Michael Chen","raw_affiliation_strings":["Mentor\u2014a Siemens Business, Wilsonville, OR, USA"],"affiliations":[{"raw_affiliation_string":"Mentor\u2014a Siemens Business, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060680839","display_name":"Elham Moghaddam","orcid":"https://orcid.org/0000-0001-8697-9544"},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Elham Moghaddam","raw_affiliation_strings":["Mentor\u2014a Siemens Business, Wilsonville, OR, USA"],"affiliations":[{"raw_affiliation_string":"Mentor\u2014a Siemens Business, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075158519","display_name":"Nilanjan Mukherjee","orcid":"https://orcid.org/0000-0001-6689-7525"},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nilanjan Mukherjee","raw_affiliation_strings":["Mentor\u2014a Siemens Business, Wilsonville, OR, USA"],"affiliations":[{"raw_affiliation_string":"Mentor\u2014a Siemens Business, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080960636","display_name":"Janusz Rajski","orcid":"https://orcid.org/0000-0003-2124-447X"},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Janusz Rajski","raw_affiliation_strings":["Mentor\u2014a Siemens Business, Wilsonville, OR, USA"],"affiliations":[{"raw_affiliation_string":"Mentor\u2014a Siemens Business, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072675590","display_name":"Jerzy Tyszer","orcid":"https://orcid.org/0000-0001-9722-2344"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Jerzy Tyszer","raw_affiliation_strings":["Faculty of Electronics and Telecommunications, Pozna\u0144 University of Technology, Pozna\u0144, Poland"],"affiliations":[{"raw_affiliation_string":"Faculty of Electronics and Telecommunications, Pozna\u0144 University of Technology, Pozna\u0144, Poland","institution_ids":["https://openalex.org/I46597724"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078225459","display_name":"Justyna Zawada","orcid":"https://orcid.org/0000-0002-1881-8164"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Justyna Zawada","raw_affiliation_strings":["Faculty of Electronics and Telecommunications, Pozna\u0144 University of Technology, Pozna\u0144, Poland"],"affiliations":[{"raw_affiliation_string":"Faculty of Electronics and Telecommunications, Pozna\u0144 University of Technology, Pozna\u0144, Poland","institution_ids":["https://openalex.org/I46597724"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100705950"],"corresponding_institution_ids":["https://openalex.org/I4210137693"],"apc_list":null,"apc_paid":null,"fwci":3.0296,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.91505744,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"37","issue":"12","first_page":"3020","last_page":"3030"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9753000140190125,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6425825357437134},{"id":"https://openalex.org/keywords/obfuscation","display_name":"Obfuscation","score":0.6195589303970337},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.6081718802452087},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5801864266395569},{"id":"https://openalex.org/keywords/lock","display_name":"Lock (firearm)","score":0.5682873725891113},{"id":"https://openalex.org/keywords/counterfeit","display_name":"Counterfeit","score":0.5493729114532471},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5262907147407532},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5216313004493713},{"id":"https://openalex.org/keywords/hardware-security-module","display_name":"Hardware security module","score":0.5007402896881104},{"id":"https://openalex.org/keywords/intellectual-property","display_name":"Intellectual property","score":0.4768194556236267},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3824920952320099},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.36857616901397705},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.27997785806655884},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26283612847328186},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.2372337281703949},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.14834925532341003}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6425825357437134},{"id":"https://openalex.org/C40305131","wikidata":"https://www.wikidata.org/wiki/Q2616305","display_name":"Obfuscation","level":2,"score":0.6195589303970337},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6081718802452087},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5801864266395569},{"id":"https://openalex.org/C174839445","wikidata":"https://www.wikidata.org/wiki/Q1134386","display_name":"Lock (firearm)","level":2,"score":0.5682873725891113},{"id":"https://openalex.org/C2779356469","wikidata":"https://www.wikidata.org/wiki/Q502918","display_name":"Counterfeit","level":2,"score":0.5493729114532471},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5262907147407532},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5216313004493713},{"id":"https://openalex.org/C39217717","wikidata":"https://www.wikidata.org/wiki/Q1432354","display_name":"Hardware security module","level":3,"score":0.5007402896881104},{"id":"https://openalex.org/C34974158","wikidata":"https://www.wikidata.org/wiki/Q131257","display_name":"Intellectual property","level":2,"score":0.4768194556236267},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3824920952320099},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.36857616901397705},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.27997785806655884},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26283612847328186},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.2372337281703949},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.14834925532341003},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2018.2801240","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2018.2801240","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1524250393","https://openalex.org/W1709754610","https://openalex.org/W1767588723","https://openalex.org/W1953724919","https://openalex.org/W1969318341","https://openalex.org/W2008284146","https://openalex.org/W2008819052","https://openalex.org/W2010903499","https://openalex.org/W2063615695","https://openalex.org/W2064541558","https://openalex.org/W2088455835","https://openalex.org/W2095410905","https://openalex.org/W2101900253","https://openalex.org/W2103468612","https://openalex.org/W2106669085","https://openalex.org/W2110019537","https://openalex.org/W2112965713","https://openalex.org/W2115910167","https://openalex.org/W2123831500","https://openalex.org/W2130364905","https://openalex.org/W2130429991","https://openalex.org/W2134593345","https://openalex.org/W2137298573","https://openalex.org/W2140904634","https://openalex.org/W2143180464","https://openalex.org/W2166253090","https://openalex.org/W2166778460","https://openalex.org/W2182814350","https://openalex.org/W2284547673","https://openalex.org/W2419784917","https://openalex.org/W2566491692","https://openalex.org/W2567189449","https://openalex.org/W2570882127","https://openalex.org/W4231741859","https://openalex.org/W4232599178","https://openalex.org/W4240277685","https://openalex.org/W6652337990","https://openalex.org/W6678723913"],"related_works":["https://openalex.org/W3186150091","https://openalex.org/W2759901721","https://openalex.org/W2011955375","https://openalex.org/W4321192641","https://openalex.org/W2566543615","https://openalex.org/W2157191248","https://openalex.org/W2107525390","https://openalex.org/W2911286527","https://openalex.org/W2150046587","https://openalex.org/W2164493372"],"abstract_inverted_index":{"Growing":[0],"reverse-engineering":[1],"attempts":[2],"to":[3,13,20,57,78,81,102,115,121],"steal":[4],"or":[5,12],"violate":[6],"a":[7,44,65,74,86,147,192],"design":[8,31,106,142,154],"intellectual":[9],"property":[10],"(IP),":[11],"identify":[14],"the":[15,29,34,104,112,117,123,139,152,185],"device":[16],"technology":[17,99],"in":[18,28,43,73,111,190],"order":[19],"counterfeit":[21],"integrated":[22],"circuits":[23],"(ICs),":[24],"raise":[25],"serious":[26],"concerns":[27],"IC":[30],"community.":[32],"As":[33,146],"information":[35],"derived":[36],"from":[37,144],"these":[38],"practices":[39],"can":[40,137],"be":[41,109],"used":[42,100],"number":[45],"of":[46,60,141,170,195],"malicious":[47],"ways,":[48],"various":[49],"active":[50],"techniques":[51],"have":[52],"been":[53],"proposed":[54,186],"and":[55,119,167],"deployed":[56],"protect":[58],"IP,":[59],"which":[61],"logic":[62,83],"locking":[63],"is":[64,90,132,151,173,188],"vital":[66],"part.":[67],"It":[68],"allows":[69],"inserting":[70],"certain":[71],"gates":[72],"circuit's":[75],"data":[76],"path":[77],"lock":[79,116],"outputs":[80],"fixed":[82],"values,":[84],"if":[85],"wrong":[87],"unlocking":[88],"key":[89],"applied.":[91],"This":[92],"paper":[93],"demonstrates":[94],"that":[95,134,184],"test":[96,135,181],"points-industry-proven":[97],"design-for-test":[98],"primarily":[101],"enhance":[103],"overall":[105,153],"testability-can":[107],"also":[108,158],"reused":[110],"mission":[113],"mode":[114],"circuit,":[118],"thus":[120],"improve":[122],"hardware":[124,196],"security":[125],"against":[126,161],"IP":[127,171],"piracy.":[128],"In":[129],"particular,":[130],"it":[131],"shown":[133],"points":[136,182],"facilitate":[138],"hiding":[140],"functionality":[143],"adversaries.":[145],"result,":[148],"not":[149],"only":[150],"testability":[155],"improved,":[156],"but":[157],"effective":[159,189],"protection":[160],"piracy":[162],"through":[163],"unauthorized":[164],"excess":[165],"production":[166],"other":[168],"forms":[169],"theft":[172],"ensured.":[174],"Experimental":[175],"results":[176],"on":[177],"industrial":[178],"designs":[179],"with":[180],"demonstrate":[183],"scheme":[187],"achieving":[191],"desired":[193],"degree":[194],"obfuscation.":[197]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}