{"id":"https://openalex.org/W2769905020","doi":"https://doi.org/10.1109/tcad.2017.2772817","title":"Secure Scan and Test Using Obfuscation Throughout Supply Chain","display_name":"Secure Scan and Test Using Obfuscation Throughout Supply Chain","publication_year":2017,"publication_date":"2017-11-13","ids":{"openalex":"https://openalex.org/W2769905020","doi":"https://doi.org/10.1109/tcad.2017.2772817","mag":"2769905020"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2017.2772817","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2017.2772817","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101654149","display_name":"Xiaoxiao Wang","orcid":"https://orcid.org/0000-0001-7943-8360"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoxiao Wang","raw_affiliation_strings":["School of Electronics and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-7943-8360","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043228646","display_name":"Dongrong Zhang","orcid":"https://orcid.org/0000-0001-5351-592X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongrong Zhang","raw_affiliation_strings":["School of Electronics and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049009050","display_name":"Miao He","orcid":"https://orcid.org/0000-0002-2147-7751"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Miao He","raw_affiliation_strings":["ECE Department, University of Florida, Gainesville, FL, USA"],"raw_orcid":"https://orcid.org/0000-0002-2147-7751","affiliations":[{"raw_affiliation_string":"ECE Department, University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017747634","display_name":"Donglin Su","orcid":"https://orcid.org/0000-0003-4852-0569"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Donglin Su","raw_affiliation_strings":["School of Electronics and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4852-0569","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073054890","display_name":"Mark Tehranipoor","orcid":"https://orcid.org/0000-0003-4699-3231"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark Tehranipoor","raw_affiliation_strings":["ECE Department, University of Florida, Gainesville, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":9.9418,"has_fulltext":false,"cited_by_count":103,"citation_normalized_percentile":{"value":0.98906034,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"37","issue":"9","first_page":"1867","last_page":"1880"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.8270132541656494},{"id":"https://openalex.org/keywords/obfuscation","display_name":"Obfuscation","score":0.7887661457061768},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.674988865852356},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6299704313278198},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.586918294429779},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.584767758846283},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5751448273658752},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5736527442932129},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5634745955467224},{"id":"https://openalex.org/keywords/hardware-security-module","display_name":"Hardware security module","score":0.4833676218986511},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.47943419218063354},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.43197986483573914},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.42978808283805847},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3254227936267853},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.2771127223968506},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.26898887753486633},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.23806098103523254},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21668434143066406},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.19061502814292908},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.15429770946502686}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.8270132541656494},{"id":"https://openalex.org/C40305131","wikidata":"https://www.wikidata.org/wiki/Q2616305","display_name":"Obfuscation","level":2,"score":0.7887661457061768},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.674988865852356},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6299704313278198},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.586918294429779},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.584767758846283},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5751448273658752},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5736527442932129},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5634745955467224},{"id":"https://openalex.org/C39217717","wikidata":"https://www.wikidata.org/wiki/Q1432354","display_name":"Hardware security module","level":3,"score":0.4833676218986511},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.47943419218063354},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.43197986483573914},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.42978808283805847},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3254227936267853},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.2771127223968506},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.26898887753486633},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.23806098103523254},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21668434143066406},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.19061502814292908},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.15429770946502686},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2017.2772817","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2017.2772817","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G2904211840","display_name":null,"funder_award_id":"61427803","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4084089109","display_name":"\u9762\u5411\u5168\u751f\u547d\u5468\u671f\u786c\u4ef6\u5b89\u5168\u4fdd\u969c\u7684\u96c6\u6210\u7535\u8def\u8bbe\u8ba1\u4e0e\u7b5b\u9009\u5173\u952e\u6280\u672f\u7814\u7a76","funder_award_id":"61631002","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5806777686","display_name":null,"funder_award_id":"61504007","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":60,"referenced_works":["https://openalex.org/W1492283300","https://openalex.org/W1563937974","https://openalex.org/W1605172130","https://openalex.org/W1978060422","https://openalex.org/W1982627425","https://openalex.org/W1982643606","https://openalex.org/W1992008051","https://openalex.org/W2005090156","https://openalex.org/W2010903499","https://openalex.org/W2025669099","https://openalex.org/W2046867211","https://openalex.org/W2048183989","https://openalex.org/W2053303358","https://openalex.org/W2061551573","https://openalex.org/W2062658790","https://openalex.org/W2078353671","https://openalex.org/W2101017779","https://openalex.org/W2101863706","https://openalex.org/W2115394282","https://openalex.org/W2124928244","https://openalex.org/W2125846166","https://openalex.org/W2130364905","https://openalex.org/W2130468378","https://openalex.org/W2131433345","https://openalex.org/W2134226740","https://openalex.org/W2138366492","https://openalex.org/W2141624968","https://openalex.org/W2142537526","https://openalex.org/W2143180464","https://openalex.org/W2144980381","https://openalex.org/W2146689260","https://openalex.org/W2147784592","https://openalex.org/W2151443931","https://openalex.org/W2155441237","https://openalex.org/W2156692142","https://openalex.org/W2166832790","https://openalex.org/W2170489924","https://openalex.org/W2246345457","https://openalex.org/W2512558543","https://openalex.org/W2513553310","https://openalex.org/W2526914141","https://openalex.org/W2549775107","https://openalex.org/W2550198774","https://openalex.org/W2555495333","https://openalex.org/W2577825805","https://openalex.org/W2588382938","https://openalex.org/W2616454726","https://openalex.org/W2735315321","https://openalex.org/W2776226745","https://openalex.org/W3147739306","https://openalex.org/W4247267706","https://openalex.org/W6646078799","https://openalex.org/W6666443212","https://openalex.org/W6679267926","https://openalex.org/W6681086539","https://openalex.org/W6681113282","https://openalex.org/W6682894607","https://openalex.org/W6685043173","https://openalex.org/W6738398250","https://openalex.org/W6746609838"],"related_works":["https://openalex.org/W3186150091","https://openalex.org/W2759901721","https://openalex.org/W4321192641","https://openalex.org/W2566543615","https://openalex.org/W2911286527","https://openalex.org/W2553035740","https://openalex.org/W2111928029","https://openalex.org/W1501621551","https://openalex.org/W2134712318","https://openalex.org/W4292874131"],"abstract_inverted_index":{"Scan-based":[0],"test":[1,57,80,121,179,227],"is":[2,13,90,128,209,223],"commonly":[3],"used":[4],"to":[5,16,92],"increase":[6],"testability":[7],"and":[8,56,82,100,111,140,148,178,196,217,221],"fault":[9],"coverage,":[10],"however,":[11],"it":[12],"also":[14,129],"known":[15],"be":[17,34,41,93,160],"a":[18,54,68,119,170],"liability":[19],"for":[20,73],"chip":[21],"security.":[22],"Research":[23],"has":[24],"shown":[25],"that":[26,184,200],"intellectual":[27],"property":[28],"(IP)":[29],"or":[30],"secret":[31],"keys":[32],"can":[33,40,101,159,188],"leaked":[35],"through":[36],"scan-based":[37,60,98,198],"attacks,":[38,99],"which":[39,66,131],"performed":[42,145],"by":[43,152],"entities":[44],"within":[45],"the":[46,63,84,87,116,125,153,156,185,202,206],"supply":[47,64],"chain.":[48],"In":[49],"this":[50],"paper,":[51],"we":[52],"propose":[53],"design":[55,127,208],"methodology":[58,122,187],"against":[59,95],"attacks":[61,199],"throughout":[62],"chain,":[65],"includes":[67],"dynamically":[69],"obfuscated":[70],"scan":[71,104,166],"(DOS)":[72],"protecting":[74,83],"IP/integrated":[75],"circuits":[76],"(ICs).":[77],"By":[78],"perturbing":[79],"patterns/responses":[81],"Obfuscation":[85,203],"Key,":[86],"proposed":[88,157,186,207],"architecture":[89,158],"proven":[91],"robust":[94],"existing":[96,192],"noninvasive":[97],"protect":[102,189],"all":[103],"data":[105],"from":[106,191],"attackers":[107],"in":[108],"foundry,":[109],"assembly,":[110],"system":[112],"development":[113],"without":[114,168],"compromising":[115],"testability.":[117],"Further,":[118],"novel":[120],"cooperating":[123],"with":[124],"DOS":[126],"proposed,":[130],"shows":[132],"full":[133],"pattern":[134,218],"application":[135],"flexibility.":[136],"Finally,":[137],"detailed":[138],"security":[139],"experimental":[141],"analyses":[142],"have":[143],"been":[144],"on":[146,173,213,226],"ITC":[147],"industrial":[149],"benchmarks.":[150],"Demonstrated":[151],"simulation":[154],"results,":[155],"easily":[161],"plugged":[162],"into":[163],"EDA":[164],"generated":[165],"chains":[167],"generating":[169],"noticeable":[171],"impact":[172,225],"conventional":[174],"IC":[175],"design,":[176],"manufacturing,":[177],"flow.":[180],"The":[181],"results":[182],"demonstrate":[183],"chips":[190],"brute":[193],"force,":[194],"differential,":[195],"other":[197],"target":[201],"Key.":[204],"Furthermore,":[205],"of":[210],"low":[211],"overhead":[212],"area,":[214],"power":[215],"consumption,":[216],"generation":[219],"time,":[220],"there":[222],"no":[224],"time.":[228]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":13},{"year":2022,"cited_by_count":11},{"year":2021,"cited_by_count":19},{"year":2020,"cited_by_count":27},{"year":2019,"cited_by_count":13},{"year":2018,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}