{"id":"https://openalex.org/W2737795851","doi":"https://doi.org/10.1109/tcad.2017.2729469","title":"Identifying Wafer-Level Systematic Failure Patterns via Unsupervised Learning","display_name":"Identifying Wafer-Level Systematic Failure Patterns via Unsupervised Learning","publication_year":2017,"publication_date":"2017-07-19","ids":{"openalex":"https://openalex.org/W2737795851","doi":"https://doi.org/10.1109/tcad.2017.2729469","mag":"2737795851"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2017.2729469","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2017.2729469","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038501242","display_name":"Mohamed Baker Alawieh","orcid":"https://orcid.org/0000-0002-3546-0336"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]},{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohamed Baker Alawieh","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USA","Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100702415","display_name":"Fa Wang","orcid":"https://orcid.org/0000-0002-8117-1914"},"institutions":[{"id":"https://openalex.org/I1342911587","display_name":"Oracle (United States)","ror":"https://ror.org/006c77m33","country_code":"US","type":"company","lineage":["https://openalex.org/I1342911587"]},{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fa Wang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USA","Oracle America, Santa Clara, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-8117-1914","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Oracle America, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1342911587"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100353869","display_name":"Xin Li","orcid":"https://orcid.org/0000-0002-4510-2436"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]},{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USA","Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA"],"raw_orcid":"https://orcid.org/0000-0002-4510-2436","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.6912,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.93328674,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"37","issue":"4","first_page":"832","last_page":"844"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.6292663812637329},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6125174760818481},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5718483328819275},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5164852142333984},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.44181931018829346},{"id":"https://openalex.org/keywords/data-set","display_name":"Data set","score":0.43597400188446045},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4109589755535126},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.38364624977111816},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2036048173904419}],"concepts":[{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.6292663812637329},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6125174760818481},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5718483328819275},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5164852142333984},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.44181931018829346},{"id":"https://openalex.org/C58489278","wikidata":"https://www.wikidata.org/wiki/Q1172284","display_name":"Data set","level":2,"score":0.43597400188446045},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4109589755535126},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.38364624977111816},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2036048173904419},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2017.2729469","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2017.2729469","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320307102","display_name":"Intel Corporation","ror":"https://ror.org/01ek73717"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W266633353","https://openalex.org/W856664601","https://openalex.org/W1530625153","https://openalex.org/W1549449731","https://openalex.org/W1600919542","https://openalex.org/W1601795611","https://openalex.org/W1663973292","https://openalex.org/W1971784203","https://openalex.org/W1972813896","https://openalex.org/W1975069947","https://openalex.org/W2008709856","https://openalex.org/W2020286945","https://openalex.org/W2023670504","https://openalex.org/W2024148935","https://openalex.org/W2030362328","https://openalex.org/W2035907685","https://openalex.org/W2043326216","https://openalex.org/W2049017777","https://openalex.org/W2056945148","https://openalex.org/W2065579159","https://openalex.org/W2076178084","https://openalex.org/W2086362611","https://openalex.org/W2089652283","https://openalex.org/W2098515641","https://openalex.org/W2100758165","https://openalex.org/W2104550562","https://openalex.org/W2108648342","https://openalex.org/W2116758077","https://openalex.org/W2120196566","https://openalex.org/W2145825841","https://openalex.org/W2167175161","https://openalex.org/W2170795408","https://openalex.org/W2171008692","https://openalex.org/W2269220321","https://openalex.org/W2286515324","https://openalex.org/W2319660501","https://openalex.org/W2509074878","https://openalex.org/W4238728061","https://openalex.org/W4255991306","https://openalex.org/W6609786941","https://openalex.org/W6623264290","https://openalex.org/W6635738176","https://openalex.org/W6656308666"],"related_works":["https://openalex.org/W1998662473","https://openalex.org/W1988252515","https://openalex.org/W2027108423","https://openalex.org/W1855666948","https://openalex.org/W2758561209","https://openalex.org/W1548095260","https://openalex.org/W2594414941","https://openalex.org/W2781711915","https://openalex.org/W2112817590","https://openalex.org/W1555291398"],"abstract_inverted_index":{"In":[0,78],"this":[1],"paper,":[2],"we":[3],"propose":[4],"a":[5,80,88],"novel":[6],"methodology":[7,22,73],"for":[8,17],"detecting":[9],"systematic":[10,53,92],"failure":[11,54,93],"patterns":[12,94,102],"at":[13],"the":[14,24,51,71,107],"wafer":[15],"level":[16],"yield":[18,114],"learning.":[19,115],"Our":[20],"proposed":[21,72,120],"takes":[23],"binary":[25],"testing":[26],"results":[27],"(i.e.,":[28],"pass":[29],"or":[30],"fail)":[31],"of":[32,46,91,110,118],"all":[33,97],"dies":[34],"over":[35],"multiple":[36],"wafers,":[37],"cluster":[38],"these":[39],"wafers":[40],"according":[41],"to":[42,69,75,86],"their":[43],"spatial":[44,99],"signatures":[45],"failures,":[47],"and":[48,112,129],"eventually":[49],"identify":[50,106],"underlying":[52],"patterns.":[55],"Several":[56],"data":[57,127,132],"processing":[58],"techniques,":[59],"including":[60],"singular":[61],"value":[62],"decomposition,":[63],"hierarchical":[64],"clustering,":[65],"etc.,":[66],"are":[67],"adopted":[68],"make":[70],"robust":[74],"random":[76],"failures.":[77],"addition,":[79],"Pseudo-Boolean":[81],"satisfiability":[82],"solver":[83],"is":[84,122],"used":[85],"extract":[87],"minimal":[89],"set":[90,128],"that":[95],"explain":[96],"wafer-level":[98],"signatures.":[100],"These":[101],"help":[103],"process":[104],"engineers":[105],"root":[108],"causes":[109],"failures":[111],"accelerate":[113],"The":[116],"efficacy":[117],"our":[119],"approach":[121],"demonstrated":[123],"by":[124],"one":[125,130],"synthetic":[126],"industrial":[131],"set.":[133]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":2}],"updated_date":"2026-06-19T17:40:00.097472","created_date":"2025-10-10T00:00:00"}