{"id":"https://openalex.org/W2346421432","doi":"https://doi.org/10.1109/tcad.2016.2561411","title":"Test Stimulus Compression Based on Broadcast Scan With One Single Input","display_name":"Test Stimulus Compression Based on Broadcast Scan With One Single Input","publication_year":2016,"publication_date":"2016-05-02","ids":{"openalex":"https://openalex.org/W2346421432","doi":"https://doi.org/10.1109/tcad.2016.2561411","mag":"2346421432"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2016.2561411","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2016.2561411","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085419650","display_name":"Jhen-Zong Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Jhen-Zong Chen","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079657769","display_name":"Kuen-Jong Lee","orcid":"https://orcid.org/0000-0002-6690-0074"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kuen-Jong Lee","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5085419650"],"corresponding_institution_ids":["https://openalex.org/I91807558"],"apc_list":null,"apc_paid":null,"fwci":2.5227,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.88555576,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"36","issue":"1","first_page":"184","last_page":"197"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49337664246559143},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.49000540375709534},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.16513335704803467},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11527225375175476},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0705808699131012},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.05183097720146179}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49337664246559143},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.49000540375709534},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.16513335704803467},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11527225375175476},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0705808699131012},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.05183097720146179}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2016.2561411","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2016.2561411","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3207701371","display_name":null,"funder_award_id":"NSC102-2221-E006-270-MY3","funder_id":"https://openalex.org/F4320321040","funder_display_name":"National Science Council"},{"id":"https://openalex.org/G4451815623","display_name":null,"funder_award_id":"NSC102-2221-E006-266-MY3","funder_id":"https://openalex.org/F4320321040","funder_display_name":"National Science Council"}],"funders":[{"id":"https://openalex.org/F4320321040","display_name":"National Science Council","ror":"https://ror.org/02kv4zf79"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1480380098","https://openalex.org/W1597614024","https://openalex.org/W1763985980","https://openalex.org/W1849928240","https://openalex.org/W1985440524","https://openalex.org/W1991645253","https://openalex.org/W2003299974","https://openalex.org/W2003936936","https://openalex.org/W2008008242","https://openalex.org/W2040150722","https://openalex.org/W2092035107","https://openalex.org/W2105182837","https://openalex.org/W2112041422","https://openalex.org/W2115658300","https://openalex.org/W2123172689","https://openalex.org/W2124425429","https://openalex.org/W2134386044","https://openalex.org/W2144503280","https://openalex.org/W2147049590","https://openalex.org/W2159919870","https://openalex.org/W2171732829","https://openalex.org/W6628752396"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W4391913857","https://openalex.org/W2350741829","https://openalex.org/W2530322880"],"abstract_inverted_index":{"In":[0],"this":[1,140],"paper,":[2],"a":[3,31,38,188,209],"novel":[4,115],"test":[5,15,26,61,89,123,127,201,215],"compression":[6,16],"technique":[7],"is":[8,111,117,218],"proposed":[9],"that":[10,78,137,173],"can":[11,85,142,205],"achieve":[12,143],"very":[13,195],"high":[14],"ratio":[17],"with":[18,37,152,178,194],"low":[19],"area":[20,109,157,197],"overhead":[21,110,158],"and":[22,30,48,91,125,150,155,163,202],"only":[23,95],"one":[24],"single":[25,46,210],"input.":[27],"An":[28],"inverter":[29],"series":[32],"of":[33,147,181],"D":[34],"flip-flops":[35],"together":[36],"configurable":[39],"switch":[40,93],"logic":[41,94],"are":[42,71],"inserted":[43],"between":[44],"the":[45,49,56,60,82,87,92,107,121,174,179],"input":[47,57],"scan":[50,66,69,75,79],"chains":[51,70,80],"so":[52],"as":[53],"to":[54,59,97,101,119],"convert":[55],"patterns":[58,128],"data":[62,90,104,144,204],"required":[63,122],"by":[64,208],"each":[65,99],"chain.":[67],"All":[68],"divided":[72],"into":[73],"some":[74],"groups":[76],"such":[77],"in":[81],"same":[83,88],"group":[84,100],"share":[86],"needs":[96],"connect":[98],"an":[102],"appropriate":[103],"provider.":[105],"Hence":[106],"total":[108],"quite":[112],"small.":[113],"A":[114],"algorithm":[116],"developed":[118],"determine":[120],"configurations":[124],"corresponding":[126],"for":[129,159,187],"100%":[130],"testable":[131],"fault":[132],"coverage.":[133],"Experimental":[134],"results":[135,171],"show":[136],"on":[138,214],"average":[139],"method":[141],"reduction":[145,175,213],"factors":[146],"23\u00d7,":[148],"124\u00d7,":[149],"394\u00d7":[151],"3.77%,":[153],"0.95%,":[154],"0.03%":[156],"ISCAS'89,":[160],"IWLS'05":[161,164],"OpenCores,":[162],"Gaisler":[165],"Research":[166],"benchmark":[167],"circuits,":[168],"respectively.":[169],"These":[170],"indicate":[172],"factor":[176],"increases":[177],"sizes":[180],"circuits;":[182],"it":[183],"even":[184],"reaches":[185],"464\u00d7":[186],"circuit":[189],"containing":[190],"2.07":[191],"million":[192],"gates":[193],"small":[196],"overhead.":[198],"As":[199],"all":[200],"control":[203],"be":[206],"provided":[207],"input,":[211],"great":[212],"channel":[216],"requirement":[217],"also":[219],"achieved.":[220]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}