{"id":"https://openalex.org/W2343421128","doi":"https://doi.org/10.1109/tcad.2016.2533861","title":"NRC: A Nibble Remapping Coding Strategy for NAND Flash Reliability Extension","display_name":"NRC: A Nibble Remapping Coding Strategy for NAND Flash Reliability Extension","publication_year":2016,"publication_date":"2016-02-24","ids":{"openalex":"https://openalex.org/W2343421128","doi":"https://doi.org/10.1109/tcad.2016.2533861","mag":"2343421128"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2016.2533861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2016.2533861","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008010888","display_name":"Debao Wei","orcid":"https://orcid.org/0000-0001-6353-1384"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Debao Wei","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084019048","display_name":"Libao Deng","orcid":"https://orcid.org/0000-0002-0124-0036"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Libao Deng","raw_affiliation_strings":["School of Information and Electrical Engineering, Harbin Institute of Technology at Weihai, Weihai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information and Electrical Engineering, Harbin Institute of Technology at Weihai, Weihai, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100364088","display_name":"Peng Zhang","orcid":"https://orcid.org/0000-0002-1289-6567"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Zhang","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101440139","display_name":"Liyan Qiao","orcid":"https://orcid.org/0000-0002-8220-7990"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyan Qiao","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019735827","display_name":"Xiyuan Peng","orcid":"https://orcid.org/0000-0001-7424-1008"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiyuan Peng","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":2.8331,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.91347535,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"35","issue":"11","first_page":"1942","last_page":"1946"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12162","display_name":"Cellular Automata and Applications","score":0.9854000210762024,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11269","display_name":"Algorithms and Data Compression","score":0.9674999713897705,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7100539207458496},{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.6922020316123962},{"id":"https://openalex.org/keywords/flash-file-system","display_name":"Flash file system","score":0.6872193217277527},{"id":"https://openalex.org/keywords/bch-code","display_name":"BCH code","score":0.6677689552307129},{"id":"https://openalex.org/keywords/coding","display_name":"Coding (social sciences)","score":0.5262799859046936},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.5017547607421875},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4966149926185608},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.466022253036499},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.4557097554206848},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.42199790477752686},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.21294626593589783},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.1992655098438263},{"id":"https://openalex.org/keywords/computer-memory","display_name":"Computer memory","score":0.1720680296421051},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.14505335688591003},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0930948555469513}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7100539207458496},{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.6922020316123962},{"id":"https://openalex.org/C27670709","wikidata":"https://www.wikidata.org/wiki/Q5457555","display_name":"Flash file system","level":4,"score":0.6872193217277527},{"id":"https://openalex.org/C42276685","wikidata":"https://www.wikidata.org/wiki/Q795705","display_name":"BCH code","level":3,"score":0.6677689552307129},{"id":"https://openalex.org/C179518139","wikidata":"https://www.wikidata.org/wiki/Q5140297","display_name":"Coding (social sciences)","level":2,"score":0.5262799859046936},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.5017547607421875},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4966149926185608},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.466022253036499},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.4557097554206848},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.42199790477752686},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.21294626593589783},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.1992655098438263},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.1720680296421051},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.14505335688591003},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0930948555469513},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2016.2533861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2016.2533861","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7400000095367432,"id":"https://metadata.un.org/sdg/4","display_name":"Quality Education"}],"awards":[{"id":"https://openalex.org/G1087032914","display_name":null,"funder_award_id":"61401121","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4092879151","display_name":null,"funder_award_id":"YQ14201","funder_id":"https://openalex.org/F4320326293","funder_display_name":"Guangxi Key Laboratory of Automatic Detection Technology and Instrument Foundation"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326293","display_name":"Guangxi Key Laboratory of Automatic Detection Technology and Instrument Foundation","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1544971428","https://openalex.org/W1982935918","https://openalex.org/W1987306842","https://openalex.org/W1989081289","https://openalex.org/W2010390358","https://openalex.org/W2011211268","https://openalex.org/W2014536047","https://openalex.org/W2043287599","https://openalex.org/W2051888055","https://openalex.org/W2067525510","https://openalex.org/W2070425502","https://openalex.org/W2075026597","https://openalex.org/W2084979612","https://openalex.org/W2129821171","https://openalex.org/W2179360174","https://openalex.org/W6647852247","https://openalex.org/W6653101257","https://openalex.org/W6679248497"],"related_works":["https://openalex.org/W164278522","https://openalex.org/W2054139911","https://openalex.org/W1577524679","https://openalex.org/W2386432552","https://openalex.org/W2101851311","https://openalex.org/W2391055460","https://openalex.org/W1937038249","https://openalex.org/W1994190181","https://openalex.org/W4230869547","https://openalex.org/W2378293894"],"abstract_inverted_index":{"According":[0],"to":[1,19,126],"the":[2,21,26,34,40,69,79,83,91,120,123,128],"appearance":[3],"frequency":[4],"of":[5,23,29,42,58,122],"nibble":[6,14],"short":[7],"code,":[8,115],"this":[9],"paper":[10],"presents":[11],"a":[12],"novel":[13],"remapping":[15],"coding":[16],"(NRC)":[17],"strategy":[18,36,81],"increase":[20],"ratio":[22],"\u201c1\u201ds":[24],"in":[25,102,108],"programming":[27],"data":[28,43,56,92],"NAND":[30,59],"flash":[31,70],"memory.":[32],"Because":[33],"NRC":[35,80,116],"does":[37,50],"not":[38,51],"change":[39],"length":[41],"during":[44],"encoding":[45],"and":[46,89,105],"decoding":[47],"process,":[48],"it":[49,63],"consume":[52],"any":[53],"extra":[54],"user":[55],"area":[57],"flash.":[60],"In":[61],"addition,":[62],"can":[64,117],"be":[65],"transparently":[66],"fit":[67],"within":[68],"translation":[71],"layer":[72],"algorithms.":[73],"The":[74],"experimental":[75],"results":[76],"show":[77],"that":[78],"reduces":[82],"program":[84],"disturb":[85],"errors":[86,94],"by":[87,95],"56.9%":[88],"decreases":[90],"retention":[93],"52.5%,":[96],"while":[97],"experiencing":[98],"only":[99],"2.2%":[100],"degradation":[101,107],"writing":[103],"speed":[104],"3.2%":[106],"reading":[109],"speed.":[110],"Compared":[111],"with":[112],"conventional":[113],"BCH":[114],"significantly":[118],"enhance":[119],"efficacy":[121],"out-of-band":[124],"space":[125],"improve":[127],"storage":[129],"reliability.":[130]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}