{"id":"https://openalex.org/W2210885409","doi":"https://doi.org/10.1109/tcad.2015.2449231","title":"SeMIA: Self-Similarity-Based IC Integrity Analysis","display_name":"SeMIA: Self-Similarity-Based IC Integrity Analysis","publication_year":2015,"publication_date":"2015-06-23","ids":{"openalex":"https://openalex.org/W2210885409","doi":"https://doi.org/10.1109/tcad.2015.2449231","mag":"2210885409"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2015.2449231","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2015.2449231","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017256460","display_name":"Yu Zheng","orcid":"https://orcid.org/0000-0002-0411-3868"},"institutions":[{"id":"https://openalex.org/I58956616","display_name":"Case Western Reserve University","ror":"https://ror.org/051fd9666","country_code":"US","type":"education","lineage":["https://openalex.org/I58956616"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu Zheng","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH, USA","institution_ids":["https://openalex.org/I58956616"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101566677","display_name":"Shuo Yang","orcid":"https://orcid.org/0000-0003-3063-9035"},"institutions":[{"id":"https://openalex.org/I58956616","display_name":"Case Western Reserve University","ror":"https://ror.org/051fd9666","country_code":"US","type":"education","lineage":["https://openalex.org/I58956616"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shuo Yang","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH, USA","institution_ids":["https://openalex.org/I58956616"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039442844","display_name":"Swarup Bhunia","orcid":"https://orcid.org/0000-0001-6082-6961"},"institutions":[{"id":"https://openalex.org/I58956616","display_name":"Case Western Reserve University","ror":"https://ror.org/051fd9666","country_code":"US","type":"education","lineage":["https://openalex.org/I58956616"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Swarup Bhunia","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH, USA","institution_ids":["https://openalex.org/I58956616"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I58956616"],"apc_list":null,"apc_paid":null,"fwci":7.0205,"has_fulltext":false,"cited_by_count":39,"citation_normalized_percentile":{"value":0.9690054,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"35","issue":"1","first_page":"37","last_page":"48"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9775999784469604,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hardware-trojan","display_name":"Hardware Trojan","score":0.7484097480773926},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6173251867294312},{"id":"https://openalex.org/keywords/counterfeit","display_name":"Counterfeit","score":0.538691520690918},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4474480450153351},{"id":"https://openalex.org/keywords/adder","display_name":"Adder","score":0.44311463832855225},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4386471211910248},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.39686959981918335},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.34037983417510986},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.32518500089645386},{"id":"https://openalex.org/keywords/trojan","display_name":"Trojan","score":0.3249059021472931},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.2873614430427551},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.213088721036911}],"concepts":[{"id":"https://openalex.org/C2780873074","wikidata":"https://www.wikidata.org/wiki/Q5656397","display_name":"Hardware Trojan","level":3,"score":0.7484097480773926},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6173251867294312},{"id":"https://openalex.org/C2779356469","wikidata":"https://www.wikidata.org/wiki/Q502918","display_name":"Counterfeit","level":2,"score":0.538691520690918},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4474480450153351},{"id":"https://openalex.org/C164620267","wikidata":"https://www.wikidata.org/wiki/Q376953","display_name":"Adder","level":3,"score":0.44311463832855225},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4386471211910248},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.39686959981918335},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.34037983417510986},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.32518500089645386},{"id":"https://openalex.org/C174333608","wikidata":"https://www.wikidata.org/wiki/Q19635","display_name":"Trojan","level":2,"score":0.3249059021472931},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.2873614430427551},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.213088721036911},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2015.2449231","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2015.2449231","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6200000047683716,"display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G1348738775","display_name":"TUES:Type1:Collaborative: An Integrative Hands-on Approach to Security Education for Undergraduate Students","funder_award_id":"1245756","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G2207124082","display_name":"SaTC: STARSS: Collaborative: IPTrust: A Comprehensive Framework for IP Integrity Validation","funder_award_id":"1441705","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G7666939570","display_name":null,"funder_award_id":"2014-TS-2553","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"},{"id":"https://openalex.org/G8358152415","display_name":"CAREER: An Integrative and Scalable Approach to Embedded Hardware Protection","funder_award_id":"1054744","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":53,"referenced_works":["https://openalex.org/W124596592","https://openalex.org/W1501488688","https://openalex.org/W1967726944","https://openalex.org/W1970852936","https://openalex.org/W1972843069","https://openalex.org/W1975359679","https://openalex.org/W1976955200","https://openalex.org/W1989761413","https://openalex.org/W1992413325","https://openalex.org/W1995505545","https://openalex.org/W1996251773","https://openalex.org/W2009009482","https://openalex.org/W2026936612","https://openalex.org/W2029979276","https://openalex.org/W2035407142","https://openalex.org/W2056625534","https://openalex.org/W2078396904","https://openalex.org/W2095196676","https://openalex.org/W2098536553","https://openalex.org/W2101246871","https://openalex.org/W2104671161","https://openalex.org/W2106366482","https://openalex.org/W2106409910","https://openalex.org/W2110601965","https://openalex.org/W2112787602","https://openalex.org/W2113436456","https://openalex.org/W2115157620","https://openalex.org/W2115484543","https://openalex.org/W2116374153","https://openalex.org/W2117782804","https://openalex.org/W2118333479","https://openalex.org/W2120912790","https://openalex.org/W2134067926","https://openalex.org/W2138039798","https://openalex.org/W2145937629","https://openalex.org/W2150928734","https://openalex.org/W2157977768","https://openalex.org/W2158902938","https://openalex.org/W2161856614","https://openalex.org/W2161998562","https://openalex.org/W2168642835","https://openalex.org/W2172075479","https://openalex.org/W4231363479","https://openalex.org/W4234154886","https://openalex.org/W4246362357","https://openalex.org/W4248967823","https://openalex.org/W6674690352","https://openalex.org/W6675797392","https://openalex.org/W6676809857","https://openalex.org/W6676995458","https://openalex.org/W6682184091","https://openalex.org/W6684007194","https://openalex.org/W6685194180"],"related_works":["https://openalex.org/W4385434494","https://openalex.org/W3159333627","https://openalex.org/W3004467197","https://openalex.org/W1500594134","https://openalex.org/W2091750459","https://openalex.org/W2999465529","https://openalex.org/W3084939900","https://openalex.org/W2382172865","https://openalex.org/W1526642037","https://openalex.org/W4321062229"],"abstract_inverted_index":{"Counterfeit":[0],"chips":[1,74,174,236,265,278],"in":[2,59,87,130,153,252],"the":[3,17,81,133,163],"supply":[4],"chain":[5],"as":[6,8,75,125,127,143],"well":[7,126],"hardware":[9,229],"Trojan":[10,128],"(HT)":[11],"attacks":[12,129,177,207],"pose":[13],"serious":[14,28],"threats":[15],"to":[16,27,95,142,171,204,235],"semiconductor":[18],"industry.":[19],"If":[20],"undetected":[21],"before":[22],"deployment,":[23],"they":[24],"can":[25,53,112,232,266],"lead":[26],"consequences":[29],"including":[30],"system":[31],"performance/reliability":[32],"issues":[33],"during":[34],"field":[35,274],"operation":[36],"and":[37,84,175,181,231,248],"potential":[38],"revenue/reputation":[39],"loss":[40],"for":[41,221,245,255,283],"a":[42,70,76,104,154,256],"trusted":[43],"manufacturer.":[44],"Currently,":[45],"no":[46],"unified":[47,106],"detection":[48,67],"method":[49],"is":[50],"available":[51],"that":[52,111,244],"simultaneously":[54],"address":[55],"these":[56],"integrity":[57,108,146],"violations":[58],"integrated":[60],"circuits":[61],"(ICs).":[62],"In":[63,99],"addition,":[64],"most":[65,120],"existing":[66],"approaches":[68],"require":[69],"set":[71],"of":[72,123,135,162,168,211,263,281],"golden":[73,97,136],"reference,":[77],"which":[78],"significantly":[79],"increases":[80],"test":[82],"cost":[83],"complexity.":[85],"Furthermore,":[86],"some":[88],"scenarios,":[89],"it":[90,224],"may":[91],"be":[92,233,267],"extremely":[93],"difficult":[94],"obtain":[96],"chips.":[98,137],"this":[100],"paper,":[101],"we":[102,242],"present":[103],"novel":[105],"IC":[107],"analysis":[109,147],"approach":[110],"effectively":[113],"detect":[114,205],"both":[115,286],"recycled":[116,173,264],"counterfeit":[117],"ICs":[118,131],"(the":[119],"dominant":[121],"form":[122],"counterfeiting)":[124],"without":[132],"need":[134],"The":[138],"proposed":[139],"approach,":[140],"referred":[141],"self-similarity-based":[144],"microchip":[145],"(SeMIA),":[148],"exploits":[149],"intrinsic":[150],"structural":[151],"self-similarity":[152],"design":[155],"(e.g.,":[156],"multiple":[157,159],"cores,":[158],"functional":[160],"units":[161],"same":[164],"type,":[165],"different":[166],"parts":[167],"an":[169,200],"adder)":[170],"isolate":[172],"HT":[176],"under":[178],"large":[179],"inter-":[180,247],"intra-die":[182,250],"process":[183],"variations.":[184],"It":[185],"compares":[186],"dynamic":[187],"current":[188],"(${I}":[189],"_{\\text":[190],"{DDT}}$)":[191],"signatures":[192],"between":[193],"two":[194],"adjacent":[195],"similar":[196],"circuit":[197],"structures":[198],"using":[199],"appropriate":[201],"isolation":[202],"metric":[203],"such":[206],"with":[208],"high":[209],"degree":[210],"confidence.":[212],"SeMIA":[213,282],"does":[214],"not":[215],"rely":[216],"on":[217,273],"any":[218],"embedded":[219],"structure":[220],"authentication,":[222],"thus":[223],"comes":[225],"at":[226],"virtually":[227],"zero":[228],"overhead":[230],"applied":[234],"already":[237],"produced.":[238],"Through":[239],"extensive":[240],"simulations,":[241],"show":[243],"15%":[246],"10%":[249],"variations":[251],"threshold":[253],"voltage":[254],"45":[257],"nm":[258],"CMOS":[259],"process,":[260],"over":[261],"98%":[262],"reliably":[268],"identified.":[269],"Finally,":[270],"experimental":[271],"measurements":[272],"programmable":[275],"gate":[276],"array":[277],"demonstrate":[279],"effectiveness":[280],"protection":[284],"against":[285],"attacks.":[287]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":6}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}