{"id":"https://openalex.org/W2061755246","doi":"https://doi.org/10.1109/tcad.2015.2419215","title":"Redundancy-Aware Power Grid Electromigration Checking Under Workload Uncertainties","display_name":"Redundancy-Aware Power Grid Electromigration Checking Under Workload Uncertainties","publication_year":2015,"publication_date":"2015-04-03","ids":{"openalex":"https://openalex.org/W2061755246","doi":"https://doi.org/10.1109/tcad.2015.2419215","mag":"2061755246"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2015.2419215","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2015.2419215","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028372749","display_name":"Sandeep Chatterjee","orcid":"https://orcid.org/0000-0001-9874-3969"},"institutions":[{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Sandeep Chatterjee","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada","Department of Electrical & Computer Engineering, University of Toronto, Toronto, On, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada","institution_ids":["https://openalex.org/I185261750"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, University of Toronto, Toronto, On, Canada","institution_ids":["https://openalex.org/I185261750"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108367462","display_name":"Mohammad Fawaz","orcid":null},"institutions":[{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mohammad Fawaz","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada","Department of Electrical & Computer Engineering, University of Toronto, Toronto, On, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada","institution_ids":["https://openalex.org/I185261750"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, University of Toronto, Toronto, On, Canada","institution_ids":["https://openalex.org/I185261750"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089881278","display_name":"Farid N. Najm","orcid":"https://orcid.org/0000-0001-5393-7794"},"institutions":[{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Farid N. Najm","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada","Department of Electrical & Computer Engineering, University of Toronto, Toronto, On, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada","institution_ids":["https://openalex.org/I185261750"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, University of Toronto, Toronto, On, Canada","institution_ids":["https://openalex.org/I185261750"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5028372749"],"corresponding_institution_ids":["https://openalex.org/I185261750"],"apc_list":null,"apc_paid":null,"fwci":0.108,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.39909644,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"34","issue":"9","first_page":"1509","last_page":"1522"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.747657299041748},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6675115823745728},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.5592498183250427},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.5423163175582886},{"id":"https://openalex.org/keywords/power-integrity","display_name":"Power integrity","score":0.5376573204994202},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.5113272070884705},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.49151739478111267},{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.4700677990913391},{"id":"https://openalex.org/keywords/multithreading","display_name":"Multithreading","score":0.46613141894340515},{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.4461211860179901},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4106270372867584},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.35740432143211365},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35735201835632324},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3482166826725006},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3371155261993408},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26466986536979675},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.18941855430603027},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.1673823595046997},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.1606406271457672},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15322086215019226}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.747657299041748},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6675115823745728},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.5592498183250427},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.5423163175582886},{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.5376573204994202},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.5113272070884705},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.49151739478111267},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.4700677990913391},{"id":"https://openalex.org/C201410400","wikidata":"https://www.wikidata.org/wiki/Q1064412","display_name":"Multithreading","level":3,"score":0.46613141894340515},{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.4461211860179901},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4106270372867584},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.35740432143211365},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35735201835632324},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3482166826725006},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3371155261993408},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26466986536979675},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18941855430603027},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1673823595046997},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.1606406271457672},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15322086215019226},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C138101251","wikidata":"https://www.wikidata.org/wiki/Q213092","display_name":"Thread (computing)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2015.2419215","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2015.2419215","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.550000011920929,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320334593","display_name":"Natural Sciences and Engineering Research Council of Canada","ror":"https://ror.org/01h531d29"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1483804921","https://openalex.org/W1536420687","https://openalex.org/W1561796284","https://openalex.org/W1878706723","https://openalex.org/W1994438562","https://openalex.org/W2007719944","https://openalex.org/W2029040443","https://openalex.org/W2046371518","https://openalex.org/W2083090974","https://openalex.org/W2109258578","https://openalex.org/W2135277685","https://openalex.org/W2151869166","https://openalex.org/W2155028245","https://openalex.org/W2163527337","https://openalex.org/W2169257893","https://openalex.org/W2443947004","https://openalex.org/W2478040551","https://openalex.org/W2606229180","https://openalex.org/W2620552423","https://openalex.org/W3149694916","https://openalex.org/W4230566481","https://openalex.org/W4236127247","https://openalex.org/W4251368852","https://openalex.org/W4251821671","https://openalex.org/W6631967576","https://openalex.org/W6683260138","https://openalex.org/W6738446551"],"related_works":["https://openalex.org/W2004615523","https://openalex.org/W2055638565","https://openalex.org/W2138118262","https://openalex.org/W2542708587","https://openalex.org/W4229007131","https://openalex.org/W2364197307","https://openalex.org/W4381800218","https://openalex.org/W3089117407","https://openalex.org/W2023373638","https://openalex.org/W2093385161"],"abstract_inverted_index":{"Electromigration":[0],"(EM)":[1],"in":[2,11,37,65,135,192],"on-die":[3],"metal":[4,31],"lines":[5],"is":[6,62,189],"becoming":[7],"a":[8,92,129,162,175,196,206],"significant":[9,64],"problem":[10,61],"modern":[12],"integrated":[13],"circuits":[14],"technology.":[15],"Due":[16],"to":[17,48,82,96,131,147,168,217],"the":[18,25,27,34,50,98,110,119,123,133,149,170,185,193],"high":[19],"levels":[20],"of":[21,30,113,137,174,199,208],"current":[22,143],"density":[23],"on":[24],"die,":[26],"large":[28],"number":[29],"lines,":[32,68,74],"and":[33,52,72,203,214],"inherent":[35,111],"conservatism":[36],"classical":[38],"full-chip":[39],"EM":[40,57,60,104],"models,":[41],"designers":[42,153],"are":[43],"finding":[44],"it":[45],"very":[46],"hard":[47],"meet":[49],"area":[51],"design":[53],"specs":[54],"while":[55,117],"guaranteeing":[56],"reliability.":[58,120],"The":[59,181],"most":[63],"power":[66,102,176,200],"grid":[67,103,177,201,215],"because":[69],"unlike":[70],"signal":[71],"clock":[73],"they":[75],"do":[76],"not":[77],"benefit":[78],"from":[79],"healing":[80],"due":[81],"their":[83],"mostly":[84],"unidirectional":[85],"currents.":[86],"In":[87,145],"this":[88],"paper,":[89],"we":[90,126,159,211],"develop":[91,128],"new":[93],"model,":[94,100,125,187],"referred":[95],"as":[97,140],"mesh":[99,115,124,165],"for":[101],"checking":[105],"which":[106,188],"takes":[107],"into":[108],"account":[109],"redundancy":[112],"its":[114,141],"structure":[116],"determining":[118],"To":[121],"implement":[122],"also":[127,160],"framework":[130],"estimate":[132,169,198],"change":[134],"statistics":[136],"an":[138],"interconnect":[139],"effective-EM":[142],"varies.":[144],"order":[146],"overcome":[148],"conservative":[150],"assumptions":[151],"that":[152,184],"usually":[154],"make":[155],"about":[156],"chip":[157],"workloads,":[158],"propose":[161],"novel":[163],"vectorless":[164],"model":[166],"technique":[167],"average":[171],"minimum":[172],"time-to-failure":[173],"under":[178],"workload":[179],"uncertainties.":[180],"results":[182],"indicate":[183],"series":[186],"currently":[190],"used":[191],"industry,":[194],"gives":[195],"pessimistic":[197],"MTF":[202],"reliability":[204],"by":[205,221],"factor":[207],"3-4.":[209],"Finally,":[210],"exploit":[212],"multithreading":[213],"locality":[216],"speedup":[218],"our":[219],"implementation":[220],"almost":[222],"$6{\\times":[223],"}$":[224],".":[225]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}