{"id":"https://openalex.org/W2068743191","doi":"https://doi.org/10.1109/tcad.2014.2366876","title":"Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor","display_name":"Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor","publication_year":2014,"publication_date":"2014-11-05","ids":{"openalex":"https://openalex.org/W2068743191","doi":"https://doi.org/10.1109/tcad.2014.2366876","mag":"2068743191"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2014.2366876","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2014.2366876","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101654149","display_name":"Xiaoxiao Wang","orcid":"https://orcid.org/0000-0001-7943-8360"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoxiao Wang","raw_affiliation_strings":["Beihang University, Beijing, China","Freescale Semiconductor, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Freescale Semiconductor, Inc., Austin, TX, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084205383","display_name":"LeRoy Winemberg","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"LeRoy Winemberg","raw_affiliation_strings":["Freescale Semiconductor, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Austin, TX, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087238171","display_name":"Donglin Su","orcid":"https://orcid.org/0000-0003-4395-0682"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Donglin Su","raw_affiliation_strings":["Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058811000","display_name":"Dat Tran","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dat Tran","raw_affiliation_strings":["Freescale Semiconductor, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Austin, TX, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037449429","display_name":"Saji George","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Saji George","raw_affiliation_strings":["Freescale Semiconductor, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Austin, TX, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103579842","display_name":"Nisar Ahmed","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Nisar Ahmed","raw_affiliation_strings":["Freescale Semiconductor, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Austin, TX, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028357177","display_name":"Steve Palosh","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Steve Palosh","raw_affiliation_strings":["Freescale Semiconductor, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Austin, TX, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007373806","display_name":"Allan Dobin","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Allan Dobin","raw_affiliation_strings":["Freescale Semiconductor, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., Austin, TX, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113697198","display_name":"Mohammad Tehranipoor","orcid":null},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammad Tehranipoor","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Connecticut, Storrs, CT, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Connecticut, Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.6935,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.91185052,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"34","issue":"1","first_page":"109","last_page":"121"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5903140902519226},{"id":"https://openalex.org/keywords/noise-margin","display_name":"Noise margin","score":0.5340086221694946},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5327283143997192},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5148569941520691},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5079954266548157},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4993014335632324},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.49717190861701965},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4753294289112091},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47474414110183716},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.4624747037887573},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.43845316767692566},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4303862750530243},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4234147369861603},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.41243264079093933},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34473443031311035},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.339175820350647},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27800196409225464},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12870320677757263},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.10953953862190247}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5903140902519226},{"id":"https://openalex.org/C179499742","wikidata":"https://www.wikidata.org/wiki/Q1324892","display_name":"Noise margin","level":4,"score":0.5340086221694946},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5327283143997192},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5148569941520691},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5079954266548157},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4993014335632324},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.49717190861701965},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4753294289112091},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47474414110183716},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.4624747037887573},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.43845316767692566},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4303862750530243},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4234147369861603},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.41243264079093933},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34473443031311035},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.339175820350647},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27800196409225464},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12870320677757263},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.10953953862190247},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2014.2366876","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2014.2366876","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4699999988079071,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G2904211840","display_name":null,"funder_award_id":"61427803","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5941973013","display_name":null,"funder_award_id":"CCF-1255898","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1583788531","https://openalex.org/W1977755957","https://openalex.org/W1980918745","https://openalex.org/W1985266119","https://openalex.org/W1999919743","https://openalex.org/W2053889244","https://openalex.org/W2066698193","https://openalex.org/W2068397550","https://openalex.org/W2072596411","https://openalex.org/W2074077900","https://openalex.org/W2095823567","https://openalex.org/W2101301454","https://openalex.org/W2102913295","https://openalex.org/W2105619224","https://openalex.org/W2108024876","https://openalex.org/W2120143168","https://openalex.org/W2121319784","https://openalex.org/W2127011511","https://openalex.org/W2135857324","https://openalex.org/W2137213576","https://openalex.org/W2141565132","https://openalex.org/W2144651789","https://openalex.org/W2145238276","https://openalex.org/W2147793529","https://openalex.org/W2147987109","https://openalex.org/W2151958832","https://openalex.org/W2166022257","https://openalex.org/W2170946267","https://openalex.org/W2171532662","https://openalex.org/W2171805009","https://openalex.org/W4234941233","https://openalex.org/W6666855326","https://openalex.org/W6675652504"],"related_works":["https://openalex.org/W2110367374","https://openalex.org/W3151506308","https://openalex.org/W4229446324","https://openalex.org/W2794688131","https://openalex.org/W2130189791","https://openalex.org/W2912670917","https://openalex.org/W2010270881","https://openalex.org/W2766377030","https://openalex.org/W2793069264","https://openalex.org/W744790032"],"abstract_inverted_index":{"As":[0],"process":[1,96],"technology":[2],"further":[3],"scales,":[4],"aging,":[5],"noise":[6],"and":[7,13,23,37,41,52,64,95,102,136,192],"variations":[8],"in":[9,45,83,119],"integrated":[10],"circuits":[11],"(ICs)":[12],"systems":[14],"become":[15],"a":[16,71,145],"major":[17],"challenge":[18],"to":[19,60,85,156],"both":[20],"the":[21,48,62,88,128,137,172],"semiconductor":[22],"electronic":[24],"design":[25],"automation":[26],"(EDA)":[27],"industries,":[28],"which":[29],"may":[30],"cause":[31],"significantly":[32],"increased":[33],"mismatch":[34,63],"between":[35],"modeled":[36],"actual":[38],"silicon":[39,184],"behavior,":[40],"even":[42],"IC":[43],"failure":[44],"field.":[46],"Therefore,":[47],"addition":[49],"of":[50,57,78,90,179],"accurate":[51],"low-cost":[53],"on-chip":[54],"sensors":[55],"is":[56,139,154],"great":[58],"value":[59],"reduce":[61],"perform":[65,103,157],"in-field":[66,104,158],"measurements.":[67,106],"This":[68],"paper":[69],"presents":[70],"novel":[72],"standard-cell-based":[73],"sensor":[74,109,153],"for":[75],"reliability":[76],"analysis":[77],"digital":[79],"ICs":[80],"(called":[81],"Radic),":[82],"order":[84],"better":[86,132],"understand":[87],"characteristics":[89],"gate,":[91],"functional":[92],"path":[93],"aging":[94,105,147,159,170,174,180,194],"variations'":[97],"impact":[98],"on":[99,113,151],"timing":[100,181],"performance,":[101],"The":[107,123],"Radic":[108,152],"has":[110],"been":[111],"fabricated":[112],"two":[114],"floating":[115],"gate":[116],"Freescale":[117],"SoCs":[118],"very":[120],"advanced":[121],"technology.":[122],"measurement":[124],"results":[125,162],"demonstrate":[126],"that":[127],"resolution":[129],"can":[130],"be":[131],"than":[133],"0.1":[134],"ps,":[135],"accuracy":[138],"kept":[140],"throughout":[141],"aging/process":[142],"variation.":[143],"Additionally,":[144],"built-in":[146],"adaption":[148,175],"system":[149,176],"based":[150],"proposed":[155,173],"adaption.":[160],"Simulation":[161],"verify":[163],"that,":[164],"comparing":[165],"with":[166,168],"designs":[167],"fixed":[169],"guardband,":[171],"releases":[177],"80%":[178],"margin,":[182],"saves":[183],"area":[185],"by":[186],"1.02%-3.16%":[187],"at":[188],"most":[189],"targeting":[190],"frequencies,":[191],"prevents":[193],"induced":[195],"failure.":[196]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}