{"id":"https://openalex.org/W1988075706","doi":"https://doi.org/10.1109/tcad.2013.2282281","title":"Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing","display_name":"Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W1988075706","doi":"https://doi.org/10.1109/tcad.2013.2282281","mag":"1988075706"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2013.2282281","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2013.2282281","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025728346","display_name":"Yihua Li","orcid":"https://orcid.org/0000-0001-5060-9197"},"institutions":[{"id":"https://openalex.org/I4210105356","display_name":"Nanya Technology (Taiwan)","ror":"https://ror.org/029rcz204","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210105356"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi-Hua Li","raw_affiliation_strings":["Storart Technology Co., Ltd., Taiwan","Storart Technol. Co., Ltd., Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Storart Technology Co., Ltd., Taiwan","institution_ids":["https://openalex.org/I4210105356"]},{"raw_affiliation_string":"Storart Technol. Co., Ltd., Taiwan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057721515","display_name":"Wei-Cheng Lien","orcid":"https://orcid.org/0000-0001-6180-7148"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wei-Cheng Lien","raw_affiliation_strings":["Department of Electronic Engineering, National Cheng Kung University, Tainan, Taiwan","Dept. of Electron. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Dept. of Electron. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101864424","display_name":"Ing-Chao Lin","orcid":"https://orcid.org/0000-0003-1994-7512"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ing-Chao Lin","raw_affiliation_strings":["Department of Computer Science and Information Engineering, National Cheng Kung University, Tainan, Taiwan","Department of Computer Science and Information Engineering, National Cheng Kung University , Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Department of Computer Science and Information Engineering, National Cheng Kung University , Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079657769","display_name":"Kuen-Jong Lee","orcid":"https://orcid.org/0000-0002-6690-0074"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kuen-Jong Lee","raw_affiliation_strings":["Department of Electronic Engineering, National Cheng Kung University, Tainan, Taiwan","Dept. of Electron. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Dept. of Electron. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.3568,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.9579746,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"33","issue":"1","first_page":"127","last_page":"138"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.6502709984779358},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6049323678016663},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5887046456336975},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.580345094203949},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5431046485900879},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.540115475654602},{"id":"https://openalex.org/keywords/power-analysis","display_name":"Power analysis","score":0.49467799067497253},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.4920465648174286},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4542146921157837},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24704763293266296},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.18269222974777222},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.17284393310546875},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1041562557220459}],"concepts":[{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6502709984779358},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6049323678016663},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5887046456336975},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.580345094203949},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5431046485900879},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.540115475654602},{"id":"https://openalex.org/C71743495","wikidata":"https://www.wikidata.org/wiki/Q2845210","display_name":"Power analysis","level":3,"score":0.49467799067497253},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.4920465648174286},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4542146921157837},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24704763293266296},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.18269222974777222},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.17284393310546875},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1041562557220459},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2013.2282281","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2013.2282281","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1557977552","https://openalex.org/W1568407911","https://openalex.org/W1966348745","https://openalex.org/W1968575517","https://openalex.org/W1969254942","https://openalex.org/W2039868523","https://openalex.org/W2051905602","https://openalex.org/W2095853358","https://openalex.org/W2112856691","https://openalex.org/W2125014350","https://openalex.org/W2128426877","https://openalex.org/W2130785299","https://openalex.org/W2131779957","https://openalex.org/W2132565185","https://openalex.org/W2132588260","https://openalex.org/W2132881562","https://openalex.org/W2134293563","https://openalex.org/W2135936250","https://openalex.org/W2145059597","https://openalex.org/W2145554447","https://openalex.org/W2146893269","https://openalex.org/W2154781197","https://openalex.org/W2159934779","https://openalex.org/W2165516518","https://openalex.org/W2166163625","https://openalex.org/W2170506040","https://openalex.org/W2170530584","https://openalex.org/W3141456863","https://openalex.org/W4242107829","https://openalex.org/W6678356202","https://openalex.org/W6682599810","https://openalex.org/W6684123354"],"related_works":["https://openalex.org/W4285708951","https://openalex.org/W2147986372","https://openalex.org/W2786111245","https://openalex.org/W1979305473","https://openalex.org/W3009953521","https://openalex.org/W4234763172","https://openalex.org/W2125317684","https://openalex.org/W2323083271","https://openalex.org/W2992024382","https://openalex.org/W1588361197"],"abstract_inverted_index":{"During":[0],"an":[1,182],"at-speed":[2],"scan-based":[3],"test,":[4],"excessive":[5],"capture":[6,169],"power":[7,147,170],"may":[8,37],"cause":[9],"significant":[10],"current":[11],"demand,":[12],"resulting":[13],"in":[14],"the":[15,29,42,53,97,118,136,145,150,157,163,168,205,212,218],"IR-drop":[16],"problem":[17,26],"and":[18,68,85,176,201],"unnecessary":[19],"yield":[20],"loss.":[21,236],"Many":[22],"methods":[23,36],"address":[24,167],"this":[25,60,116,155],"by":[27,106,191,197,211,226],"reducing":[28],"switching":[30],"activities":[31],"of":[32,44,52,152,184,186,204],"power-risky":[33,45,66,107,192],"patterns.":[34,108],"These":[35],"not":[38],"be":[39,142,195,209,224],"efficient":[40],"when":[41,50],"number":[43],"patterns":[46,54,67,72,99,127,133,165,193,200],"is":[47,93,121,156],"large":[48],"or":[49,232],"some":[51,110],"require":[55],"extremely":[56],"high":[57],"power.":[58],"In":[59],"paper,":[61],"we":[62],"propose":[63],"discarding":[64],"all":[65],"starting":[69],"with":[70,230],"power-safe":[71,98,126,143,164,199],"only.":[73],"Our":[74],"test":[75,82,87,214,220],"generation":[76,215],"procedure":[77,138],"includes":[78],"two":[79],"processes,":[80],"namely,":[81],"pattern":[83,88],"refinement":[84],"low-power":[86,213],"regeneration.":[89],"The":[90,132],"first":[91,158],"process":[92,120],"used":[94],"to":[95,100,123,128,141,166],"refine":[96],"detect":[101,129],"faults":[102,111,187,207],"originally":[103,188],"detected":[104,189,196,210],"only":[105,162,190],"If":[109],"are":[112,139],"still":[113],"undetected":[114],"after":[115],"process,":[117],"second":[119],"applied":[122],"generate":[124],"new":[125],"these":[130],"faults.":[131],"obtained":[134],"using":[135],"proposed":[137],"guaranteed":[140],"for":[144],"given":[146],"constraints.":[148],"To":[149],"best":[151],"our":[153],"knowledge,":[154],"method":[159],"that":[160,181,202],"refines":[161],"problem.":[171],"Experimental":[172],"results":[173],"on":[174,228],"ISCAS'89":[175],"ITC'99":[177],"benchmark":[178],"circuits":[179],"show":[180],"average":[183,229],"75%":[185],"can":[194,208,223],"refining":[198],"most":[203],"remaining":[206],"process.":[216],"Furthermore,":[217],"required":[219],"data":[221],"volume":[222],"reduced":[225],"12.76%":[227],"little":[231],"no":[233],"fault":[234],"coverage":[235]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}