{"id":"https://openalex.org/W2159606689","doi":"https://doi.org/10.1109/tcad.2013.2237946","title":"Compact Test Pattern Selection for Small Delay Defect","display_name":"Compact Test Pattern Selection for Small Delay Defect","publication_year":2013,"publication_date":"2013-05-15","ids":{"openalex":"https://openalex.org/W2159606689","doi":"https://doi.org/10.1109/tcad.2013.2237946","mag":"2159606689"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2013.2237946","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2013.2237946","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101987568","display_name":"Chia\u2010Yuan Chang","orcid":"https://orcid.org/0000-0001-5841-3455"},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chia-Yuan Chang","raw_affiliation_strings":["National Taiwan University, Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072149250","display_name":"Kuan-Yu Liao","orcid":null},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kuan-Yu Liao","raw_affiliation_strings":["National Taiwan University, Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060092027","display_name":"Sheng-Chang Hsu","orcid":null},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Sheng-Chang Hsu","raw_affiliation_strings":["National Taiwan University, Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081083363","display_name":"Jhih\u2010Fong Li","orcid":null},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"J. C. Li","raw_affiliation_strings":["National Taiwan University, Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Taiwan University, Taipei, Taiwan","institution_ids":["https://openalex.org/I16733864"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053876090","display_name":"Jiann-Chyi Rau","orcid":null},"institutions":[{"id":"https://openalex.org/I107470533","display_name":"Tamkang University","ror":"https://ror.org/04tft4718","country_code":"TW","type":"education","lineage":["https://openalex.org/I107470533"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jiann-Chyi Rau","raw_affiliation_strings":["Tamkang University, New Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tamkang University, New Taipei, Taiwan","institution_ids":["https://openalex.org/I107470533"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9515,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.77721323,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"32","issue":"6","first_page":"971","last_page":"975"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8695420026779175},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.798869252204895},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6723008155822754},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.630919873714447},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.6288301944732666},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.598957896232605},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5892294049263},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5874007344245911},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5865129232406616},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5762138962745667},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4977417290210724},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46128717064857483},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.35546720027923584},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.23641514778137207},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1834522783756256},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12022313475608826}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8695420026779175},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.798869252204895},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6723008155822754},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.630919873714447},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.6288301944732666},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.598957896232605},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5892294049263},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5874007344245911},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5865129232406616},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5762138962745667},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4977417290210724},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46128717064857483},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.35546720027923584},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.23641514778137207},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1834522783756256},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12022313475608826},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcad.2013.2237946","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2013.2237946","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},{"id":"pmh:oai:tkuir.lib.tku.edu.tw:987654321/91672","is_oa":false,"landing_page_url":"https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/91672","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1555407400","https://openalex.org/W1575729896","https://openalex.org/W2084000806","https://openalex.org/W2096437225","https://openalex.org/W2101278273","https://openalex.org/W2105017305","https://openalex.org/W2120349980","https://openalex.org/W2127774081","https://openalex.org/W2144898259","https://openalex.org/W2149424544","https://openalex.org/W2151275401","https://openalex.org/W2151628041","https://openalex.org/W2151678113","https://openalex.org/W2157017222","https://openalex.org/W2162139917","https://openalex.org/W3147331103","https://openalex.org/W4242961060","https://openalex.org/W6671659936"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W2021253405","https://openalex.org/W2323083271","https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2408214455","https://openalex.org/W1953724919","https://openalex.org/W2128148266"],"abstract_inverted_index":{"This":[0,23],"letter":[1],"proposes":[2],"an":[3],"algorithm":[4,24],"that":[5,40,101],"selects":[6],"a":[7,18,55,61],"small":[8,14,114],"number":[9],"of":[10,60,102],"test":[11,21,68,88,105,117],"patterns":[12],"for":[13,67],"delay":[15,115],"defects":[16],"from":[17],"large":[19,74],"N-detect":[20],"set.":[22],"uses":[25],"static":[26],"upper":[27],"and":[28,93],"lower":[29],"bound":[30],"analysis":[31],"to":[32,124],"quickly":[33],"estimate":[34],"the":[35,41,86,94,110],"sensitized":[36],"path":[37],"length":[38],"so":[39],"central":[42],"processing":[43],"unit":[44],"(CPU)":[45],"time":[46,96],"can":[47],"be":[48],"reduced.":[49],"By":[50],"ignoring":[51],"easy":[52],"faults,":[53],"only":[54],"partial":[56],"fault":[57,63],"dictionary,":[58,64],"instead":[59],"complete":[62],"is":[65,90,97],"built":[66],"pattern":[69,106],"selection.":[70],"Experimental":[71],"results":[72],"on":[73],"International":[75],"Test":[76],"Conference":[77],"benchmark":[78],"circuits":[79],"show":[80],"that,":[81],"with":[82],"very":[83,122],"similar":[84],"quality,":[85],"selected":[87],"set":[89],"46%":[91],"smaller":[92],"CPU":[95],"42%":[98],"faster":[99],"than":[100],"timing-aware":[103],"automated":[104],"generation":[107],"(ATPG).":[108],"With":[109],"proposed":[111],"selection":[112],"algorithm,":[113],"defect":[116],"sets":[118],"are":[119],"no":[120],"longer":[121],"expensive":[123],"apply.":[125]},"counts_by_year":[{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}