{"id":"https://openalex.org/W1973423723","doi":"https://doi.org/10.1109/tcad.2012.2193580","title":"Diagnosis-Assisted Adaptive Test","display_name":"Diagnosis-Assisted Adaptive Test","publication_year":2012,"publication_date":"2012-08-16","ids":{"openalex":"https://openalex.org/W1973423723","doi":"https://doi.org/10.1109/tcad.2012.2193580","mag":"1973423723"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2012.2193580","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2012.2193580","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036938235","display_name":"Xiaochun Yu","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Xiaochun Yu","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR, USA","Intel Corporation, , Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corporation, , Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111967389","display_name":"R.D. Blanton","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ronald DeShawn Blanton","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USA","Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, , USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, , USA","institution_ids":["https://openalex.org/I74973139"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5036938235"],"corresponding_institution_ids":["https://openalex.org/I1343180700"],"apc_list":null,"apc_paid":null,"fwci":1.4503,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.80504028,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"31","issue":"9","first_page":"1405","last_page":"1416"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.6283358931541443},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.6016948223114014},{"id":"https://openalex.org/keywords/computerized-adaptive-testing","display_name":"Computerized adaptive testing","score":0.5645055174827576},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.548701822757721},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4996640682220459},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4816419184207916},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.46760740876197815},{"id":"https://openalex.org/keywords/personalization","display_name":"Personalization","score":0.42919009923934937},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4268779754638672},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.41788449883461},{"id":"https://openalex.org/keywords/population","display_name":"Population","score":0.41089823842048645},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.329886794090271},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2537412643432617},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24613037705421448},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2307528257369995},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10112348198890686},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09884530305862427},{"id":"https://openalex.org/keywords/medicine","display_name":"Medicine","score":0.06461471319198608},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06107163429260254}],"concepts":[{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.6283358931541443},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.6016948223114014},{"id":"https://openalex.org/C144352353","wikidata":"https://www.wikidata.org/wiki/Q2920411","display_name":"Computerized adaptive testing","level":3,"score":0.5645055174827576},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.548701822757721},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4996640682220459},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4816419184207916},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.46760740876197815},{"id":"https://openalex.org/C183003079","wikidata":"https://www.wikidata.org/wiki/Q1000371","display_name":"Personalization","level":2,"score":0.42919009923934937},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4268779754638672},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.41788449883461},{"id":"https://openalex.org/C2908647359","wikidata":"https://www.wikidata.org/wiki/Q2625603","display_name":"Population","level":2,"score":0.41089823842048645},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.329886794090271},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2537412643432617},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24613037705421448},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2307528257369995},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10112348198890686},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09884530305862427},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.06461471319198608},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06107163429260254},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C171606756","wikidata":"https://www.wikidata.org/wiki/Q506132","display_name":"Psychometrics","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C99454951","wikidata":"https://www.wikidata.org/wiki/Q932068","display_name":"Environmental health","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2012.2193580","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2012.2193580","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1531696936","https://openalex.org/W1538481674","https://openalex.org/W1592689466","https://openalex.org/W1690611602","https://openalex.org/W1704018133","https://openalex.org/W1735018384","https://openalex.org/W1951780703","https://openalex.org/W1966913934","https://openalex.org/W1967088554","https://openalex.org/W1968659326","https://openalex.org/W1989728241","https://openalex.org/W2009086942","https://openalex.org/W2102372015","https://openalex.org/W2107568030","https://openalex.org/W2108914014","https://openalex.org/W2112704929","https://openalex.org/W2120412521","https://openalex.org/W2124253308","https://openalex.org/W2126693329","https://openalex.org/W2132424277","https://openalex.org/W2132910120","https://openalex.org/W2137926373","https://openalex.org/W2144310218","https://openalex.org/W2144328631","https://openalex.org/W2152406824","https://openalex.org/W2152489029","https://openalex.org/W2153457918","https://openalex.org/W2156294156","https://openalex.org/W2156955559","https://openalex.org/W2161229078","https://openalex.org/W2165475493","https://openalex.org/W2168209902","https://openalex.org/W4230615976","https://openalex.org/W4249875616","https://openalex.org/W4250556527","https://openalex.org/W6678797189","https://openalex.org/W6679431032","https://openalex.org/W6682357834","https://openalex.org/W6684507495"],"related_works":["https://openalex.org/W2091533492","https://openalex.org/W2082561435","https://openalex.org/W1588361197","https://openalex.org/W1991935474","https://openalex.org/W4319302805","https://openalex.org/W2341817401","https://openalex.org/W2162370517","https://openalex.org/W1953724919","https://openalex.org/W2914961374","https://openalex.org/W2128426877"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3,14,44,50,110],"method":[4],"for":[5,109],"improving":[6],"the":[7,20,31,36,41,47,60,72,78,93,97],"test":[8,32,114],"quality":[9,154],"of":[10,43,62,74,84,96,133],"digital":[11],"circuits":[12],"on":[13,71,113,149],"per-design":[15],"basis":[16],"by:":[17],"1)":[18],"monitoring":[19],"defect":[21,45,51,67,79,89,107,120,137],"behaviors":[22],"that":[23,119,136],"occur":[24],"through":[25],"volume":[26],"diagnosis;":[27],"and":[28],"2)":[29],"changing":[30],"patterns":[33],"to":[34,58,66,82,101,105],"match":[35],"identified":[37],"behaviors.":[38],"To":[39],"characterize":[40],"behavior":[42,86],"(i.e.,":[46],"conditions":[48],"when":[49],"is":[52,56,80],"activated),":[53],"physically-aware":[54],"diagnosis":[55],"employed":[57],"extract":[59],"set":[61,73],"signal":[63,75],"lines":[64,76],"relevant":[65],"activation.":[68],"Then,":[69],"based":[70],"derived,":[77],"attributed":[81],"one":[83],"several":[85],"categories.":[87],"Our":[88],"level":[90,108,121,138],"model":[91],"uses":[92],"behavior-attribution":[94],"results":[95],"current":[98],"failing":[99],"population":[100],"guide":[102],"test-set":[103],"customization":[104],"minimize":[106],"given":[111],"constraint":[112],"costs,":[115],"or":[116],"alternatively,":[117],"ensure":[118],"does":[122],"not":[123],"exceed":[124],"some":[125],"predetermined":[126],"threshold.":[127],"Circuit-level":[128],"simulation":[129],"involving":[130],"various":[131],"types":[132],"defects":[134],"shows":[135],"can":[139],"be":[140],"reduced":[141],"by":[142],"30%":[143],"using":[144],"this":[145],"method.":[146],"Simulation":[147],"experiment":[148],"actual":[150],"chips":[151],"also":[152],"demonstrates":[153],"improvement.":[155]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}