{"id":"https://openalex.org/W2158712971","doi":"https://doi.org/10.1109/tcad.2011.2179042","title":"Path Criticality Computation in Parameterized Statistical Timing Analysis Using a Novel Operator","display_name":"Path Criticality Computation in Parameterized Statistical Timing Analysis Using a Novel Operator","publication_year":2012,"publication_date":"2012-03-27","ids":{"openalex":"https://openalex.org/W2158712971","doi":"https://doi.org/10.1109/tcad.2011.2179042","mag":"2158712971"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2011.2179042","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2011.2179042","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006563419","display_name":"Jaeyong Chung","orcid":"https://orcid.org/0000-0001-5819-1995"},"institutions":[{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jaeyong Chung","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Texas, Austin, TX, USA","Synopsys, Inc., Mountain View, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Texas, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Synopsys, Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030156276","display_name":"Jinjun Xiong","orcid":"https://orcid.org/0000-0002-2620-4859"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jinjun Xiong","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005648967","display_name":"Vladimir Zolotov","orcid":"https://orcid.org/0000-0002-3971-1163"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vladimir Zolotov","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob A. Abraham","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Texas, Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Texas, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.2098,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.89073629,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"31","issue":"4","first_page":"497","last_page":"508"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parameterized-complexity","display_name":"Parameterized complexity","score":0.7202462553977966},{"id":"https://openalex.org/keywords/criticality","display_name":"Criticality","score":0.712830126285553},{"id":"https://openalex.org/keywords/conditional-probability","display_name":"Conditional probability","score":0.590215802192688},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.5526490807533264},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5299606919288635},{"id":"https://openalex.org/keywords/regular-conditional-probability","display_name":"Regular conditional probability","score":0.5151921510696411},{"id":"https://openalex.org/keywords/joint-probability-distribution","display_name":"Joint probability distribution","score":0.4993767738342285},{"id":"https://openalex.org/keywords/random-variable","display_name":"Random variable","score":0.48947083950042725},{"id":"https://openalex.org/keywords/probability-density-function","display_name":"Probability density function","score":0.4759402275085449},{"id":"https://openalex.org/keywords/probability-mass-function","display_name":"Probability mass function","score":0.40820834040641785},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.390536904335022},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37788254022598267},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.37456414103507996},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.24825873970985413}],"concepts":[{"id":"https://openalex.org/C165464430","wikidata":"https://www.wikidata.org/wiki/Q1570441","display_name":"Parameterized complexity","level":2,"score":0.7202462553977966},{"id":"https://openalex.org/C125611927","wikidata":"https://www.wikidata.org/wiki/Q17008131","display_name":"Criticality","level":2,"score":0.712830126285553},{"id":"https://openalex.org/C44492722","wikidata":"https://www.wikidata.org/wiki/Q327069","display_name":"Conditional probability","level":2,"score":0.590215802192688},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.5526490807533264},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5299606919288635},{"id":"https://openalex.org/C103982235","wikidata":"https://www.wikidata.org/wiki/Q7309594","display_name":"Regular conditional probability","level":4,"score":0.5151921510696411},{"id":"https://openalex.org/C18653775","wikidata":"https://www.wikidata.org/wiki/Q1333358","display_name":"Joint probability distribution","level":2,"score":0.4993767738342285},{"id":"https://openalex.org/C122123141","wikidata":"https://www.wikidata.org/wiki/Q176623","display_name":"Random variable","level":2,"score":0.48947083950042725},{"id":"https://openalex.org/C197055811","wikidata":"https://www.wikidata.org/wiki/Q207522","display_name":"Probability density function","level":2,"score":0.4759402275085449},{"id":"https://openalex.org/C197096303","wikidata":"https://www.wikidata.org/wiki/Q869887","display_name":"Probability mass function","level":3,"score":0.40820834040641785},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.390536904335022},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37788254022598267},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.37456414103507996},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.24825873970985413},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2011.2179042","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2011.2179042","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","score":0.5400000214576721,"display_name":"Reduced inequalities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1966741973","https://openalex.org/W1967709031","https://openalex.org/W2006447899","https://openalex.org/W2067549952","https://openalex.org/W2095804030","https://openalex.org/W2099894450","https://openalex.org/W2104677471","https://openalex.org/W2120566121","https://openalex.org/W2126564504","https://openalex.org/W2127513491","https://openalex.org/W2128932352","https://openalex.org/W2129718992","https://openalex.org/W2143847170","https://openalex.org/W2149447807","https://openalex.org/W2153799652","https://openalex.org/W2158750015","https://openalex.org/W2159004509","https://openalex.org/W2170755326","https://openalex.org/W4236432903","https://openalex.org/W4237955880","https://openalex.org/W4245502288","https://openalex.org/W4246922879","https://openalex.org/W4247497940","https://openalex.org/W4253814782"],"related_works":["https://openalex.org/W2166748330","https://openalex.org/W1523756637","https://openalex.org/W4252552567","https://openalex.org/W4248569664","https://openalex.org/W2885051393","https://openalex.org/W4302438394","https://openalex.org/W2953386691","https://openalex.org/W1578411263","https://openalex.org/W3082035481","https://openalex.org/W2317246346"],"abstract_inverted_index":{"This":[0,99],"paper":[1],"presents":[2],"a":[3,34,110],"method":[4,57,134],"to":[5,61,76,102,121,143],"compute":[6,122],"criticality":[7,32,123],"probabilities":[8,60,124],"of":[9,21,37,68,87,109,125],"paths":[10,24],"in":[11,141],"parameterized":[12],"statistical":[13],"static":[14],"timing":[15],"analysis.":[16],"We":[17],"partition":[18],"the":[19,23,30,41,47,63,80,84,88,104,114,132,144],"set":[20],"all":[22],"into":[25,33,78],"several":[26],"groups":[27],"and":[28,66],"formulate":[29],"path":[31,111,115],"joint":[35,42,64],"probability":[36,43,106],"inequalities.":[38],"Before":[39],"evaluating":[40],"directly,":[44],"we":[45,91],"simplify":[46],"inequalities":[48],"through":[49],"algebraic":[50],"elimination,":[51],"handling":[52],"topological":[53],"correlation.":[54],"Our":[55,127],"proposed":[56,133],"uses":[58],"conditional":[59,85,105],"obtain":[62,103],"probability,":[65],"statistics":[67,86],"random":[69,89],"variables":[70],"representing":[71],"process":[72],"parameters":[73],"are":[74],"changed":[75],"take":[77],"account":[79],"conditions.":[81],"To":[82],"calculate":[83],"variables,":[90],"derive":[92],"analytic":[93],"formulas":[94],"by":[95],"extending":[96],"Clark's":[97],"work.":[98],"allows":[100],"us":[101],"density":[107],"function":[108],"delay,":[112],"given":[113],"is":[116],"critical,":[117],"as":[118,120],"well":[119],"paths.":[126],"experimental":[128],"results":[129],"show":[130],"that":[131],"provides":[135],"4.2X":[136],"better":[137],"accuracy":[138],"on":[139],"average":[140],"comparison":[142],"state-of-art":[145],"method.":[146]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}