{"id":"https://openalex.org/W2032698581","doi":"https://doi.org/10.1109/tcad.2011.2179036","title":"Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement","display_name":"Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement","publication_year":2012,"publication_date":"2012-04-20","ids":{"openalex":"https://openalex.org/W2032698581","doi":"https://doi.org/10.1109/tcad.2011.2179036","mag":"2032698581"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2011.2179036","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2011.2179036","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079657769","display_name":"Kuen-Jong Lee","orcid":"https://orcid.org/0000-0002-6690-0074"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kuen-Jong Lee","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028476747","display_name":"Tong-Yu Hsieh","orcid":"https://orcid.org/0000-0002-7954-5569"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]},{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tong-Yu Hsieh","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110173607","display_name":"Melvin A. Breuer","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Melvin A. Breuer","raw_affiliation_strings":["Department of Electrical Engineering, University of Southern California, Los Angeles, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Southern California, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I1174212"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4646,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.81652952,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"31","issue":"5","first_page":"754","last_page":"764"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6619864702224731},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6424267292022705},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6304916143417358},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6217860579490662},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.6094226837158203},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5788636803627014},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5712625980377197},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5303735733032227},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.508712112903595},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.4811759889125824},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.45804211497306824},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.4549519419670105},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.4269750416278839},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.4176059067249298},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2929859161376953},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2573414444923401},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17743584513664246},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.16999459266662598},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1530579924583435}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6619864702224731},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6424267292022705},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6304916143417358},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6217860579490662},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.6094226837158203},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5788636803627014},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5712625980377197},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5303735733032227},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.508712112903595},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.4811759889125824},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.45804211497306824},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.4549519419670105},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.4269750416278839},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.4176059067249298},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2929859161376953},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2573414444923401},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17743584513664246},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.16999459266662598},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1530579924583435},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2011.2179036","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2011.2179036","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320323900","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95"},{"id":"https://openalex.org/F4320324663","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W2030803967","https://openalex.org/W2047171058","https://openalex.org/W2047742327","https://openalex.org/W2099971661","https://openalex.org/W2100110579","https://openalex.org/W2108138643","https://openalex.org/W2110346044","https://openalex.org/W2113627024","https://openalex.org/W2117804111","https://openalex.org/W2123785008","https://openalex.org/W2128382539","https://openalex.org/W2135856491","https://openalex.org/W2145118217","https://openalex.org/W2145227850","https://openalex.org/W2147814275","https://openalex.org/W2148042901","https://openalex.org/W2151428711","https://openalex.org/W2153243017","https://openalex.org/W2153841776","https://openalex.org/W2161891759","https://openalex.org/W2163896844","https://openalex.org/W2164241781","https://openalex.org/W3144738651","https://openalex.org/W3149223600","https://openalex.org/W4245420982","https://openalex.org/W4254627859","https://openalex.org/W6678278430","https://openalex.org/W6682840539"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W2021253405","https://openalex.org/W2323083271","https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2408214455","https://openalex.org/W1953724919","https://openalex.org/W2129713538"],"abstract_inverted_index":{"Acceptable":[0],"faults":[1,11,44,73],"in":[2,80,165,170],"a":[3,62,81,93,120],"circuit":[4,26],"under":[5],"test":[6,65,95,99,111,126,135,146,174],"(CUT)":[7],"refer":[8],"to":[9,69,103,123,153],"those":[10],"that":[12,57,138,164],"have":[13,55],"no":[14],"or":[15],"only":[16],"minor":[17],"impacts":[18],"on":[19,84],"the":[20,23,58,142,155,158,171],"performance":[21],"of":[22,145,157,173],"CUT.":[24],"A":[25,109],"with":[27,42,180],"an":[28,133,167],"acceptable":[29,77],"fault":[30],"may":[31],"be":[32,51,177],"marketable":[33],"for":[34,128],"some":[35],"specific":[36],"applications.":[37],"Therefore,":[38],"by":[39,61],"carefully":[40],"dealing":[41],"these":[43],"during":[45],"testing,":[46],"significant":[47],"yield":[48,86],"improvement":[49],"can":[50,139,176],"achieved.":[52],"Previous":[53],"studies":[54],"shown":[56],"patterns":[59,175],"generated":[60],"conventional":[63],"automatic":[64],"pattern":[66],"generation":[67,113,136],"procedure":[68],"detect":[70,75],"all":[71],"unacceptable":[72],"also":[74],"many":[76],"ones,":[78],"resulting":[79],"severe":[82],"loss":[83],"achievable":[85],"improvement.":[87],"In":[88],"this":[89,106,184],"paper,":[90],"we":[91],"present":[92],"novel":[94],"methodology":[96],"called":[97],"multiple":[98],"set":[100,112],"detection":[101],"(MTSD)":[102],"totally":[104],"eliminate":[105],"overdetection":[107],"problem.":[108,185],"basic":[110],"method":[114,137],"is":[115],"first":[116],"presented,":[117],"which":[118],"depicts":[119],"fundamental":[121],"scheme":[122],"generate":[124],"appropriate":[125],"sets":[127],"MTSD.":[129],"We":[130],"then":[131],"describe":[132],"enhanced":[134],"significantly":[140],"reduce":[141],"total":[143],"number":[144,172],"patterns.":[147],"Solid":[148],"theoretical":[149],"derivations":[150],"are":[151],"provided":[152],"validate":[154],"effectiveness":[156],"proposed":[159],"methods.":[160],"Experimental":[161],"results":[162],"show":[163],"general":[166],"80%-99%":[168],"reduction":[169],"achieved":[178],"compared":[179],"previous":[181],"work":[182],"addressing":[183]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}