{"id":"https://openalex.org/W2107863479","doi":"https://doi.org/10.1109/tcad.2011.2158100","title":"Error Tolerance in Server Class Processors","display_name":"Error Tolerance in Server Class Processors","publication_year":2011,"publication_date":"2011-06-20","ids":{"openalex":"https://openalex.org/W2107863479","doi":"https://doi.org/10.1109/tcad.2011.2158100","mag":"2107863479"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2011.2158100","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2011.2158100","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022486346","display_name":"Jude A. Rivers","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jude A. Rivers","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103096085","display_name":"Meeta S. Gupta","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Meeta S. Gupta","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052489263","display_name":"Jeonghee Shin","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeonghee Shin","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080747890","display_name":"Prabhakar Kudva","orcid":"https://orcid.org/0000-0003-0854-8612"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Prabhakar N. Kudva","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009866527","display_name":"Pradip Bose","orcid":"https://orcid.org/0000-0002-1380-5671"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pradip Bose","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"[IBM Thomas J. Watson Research Center, Yorktown Heights, NY , USA]","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5022486346"],"corresponding_institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"],"apc_list":null,"apc_paid":null,"fwci":2.9146,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.91506532,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"30","issue":"7","first_page":"945","last_page":"959"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6438411474227905},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.5839065313339233},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4762949049472809},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.34362560510635376},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1305561363697052}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6438411474227905},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.5839065313339233},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4762949049472809},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.34362560510635376},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1305561363697052}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2011.2158100","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2011.2158100","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":72,"referenced_works":["https://openalex.org/W1500849457","https://openalex.org/W1864485850","https://openalex.org/W1977958109","https://openalex.org/W1989874002","https://openalex.org/W1998654458","https://openalex.org/W2007325303","https://openalex.org/W2034919323","https://openalex.org/W2036537371","https://openalex.org/W2043340768","https://openalex.org/W2047547373","https://openalex.org/W2056598520","https://openalex.org/W2064957549","https://openalex.org/W2098736822","https://openalex.org/W2098764315","https://openalex.org/W2099746875","https://openalex.org/W2100866260","https://openalex.org/W2100995829","https://openalex.org/W2101554015","https://openalex.org/W2102480715","https://openalex.org/W2102863623","https://openalex.org/W2104086123","https://openalex.org/W2106305072","https://openalex.org/W2113115586","https://openalex.org/W2114052846","https://openalex.org/W2114172921","https://openalex.org/W2115016937","https://openalex.org/W2116015411","https://openalex.org/W2116059696","https://openalex.org/W2117515905","https://openalex.org/W2125169487","https://openalex.org/W2127079764","https://openalex.org/W2132362854","https://openalex.org/W2132781954","https://openalex.org/W2135841506","https://openalex.org/W2136066624","https://openalex.org/W2136444750","https://openalex.org/W2140839100","https://openalex.org/W2141985978","https://openalex.org/W2144034023","https://openalex.org/W2144512449","https://openalex.org/W2146002348","https://openalex.org/W2146743175","https://openalex.org/W2147042877","https://openalex.org/W2148952606","https://openalex.org/W2149959321","https://openalex.org/W2150283124","https://openalex.org/W2151845324","https://openalex.org/W2152165066","https://openalex.org/W2154451732","https://openalex.org/W2154857344","https://openalex.org/W2160841000","https://openalex.org/W2161197576","https://openalex.org/W2165071510","https://openalex.org/W2169180888","https://openalex.org/W2169213530","https://openalex.org/W2224493231","https://openalex.org/W2482449872","https://openalex.org/W4231523873","https://openalex.org/W4238002809","https://openalex.org/W4239625758","https://openalex.org/W4240029073","https://openalex.org/W4240146668","https://openalex.org/W4248445118","https://openalex.org/W4249144718","https://openalex.org/W4253094798","https://openalex.org/W4254048799","https://openalex.org/W4255298641","https://openalex.org/W4255519882","https://openalex.org/W6675837356","https://openalex.org/W6677155578","https://openalex.org/W6680835974","https://openalex.org/W6682624730"],"related_works":["https://openalex.org/W1604898313","https://openalex.org/W2117014006","https://openalex.org/W4233815414","https://openalex.org/W2372170743","https://openalex.org/W1491899005","https://openalex.org/W1558545464","https://openalex.org/W2172791042","https://openalex.org/W2074301136","https://openalex.org/W1502414128","https://openalex.org/W1984303163"],"abstract_inverted_index":{"This":[0],"paper":[1],"provides:":[2],"1)":[3],"a":[4,30,39],"very":[5],"brief":[6,40],"motivation":[7],"and":[8,16,45,52,62],"technological":[9],"trend":[10],"data":[11],"to":[12,21,42],"show":[13],"why":[14],"hard":[15],"soft":[17],"errors":[18],"are":[19],"expected":[20],"be":[22],"of":[23,33,56],"increasing":[24],"concern":[25],"in":[26],"the":[27],"future;":[28],"2)":[29],"summary":[31],"review":[32],"chip-level":[34],"error":[35],"tolerance":[36],"practices":[37],"today-with":[38],"reference":[41],"IBM's":[43],"POWER6":[44],"POWER7":[46],"designs;":[47],"3)":[48],"open":[49],"research":[50],"challenges":[51],"current":[53],"solution":[54],"approaches":[55],"promise,":[57],"based":[58],"on":[59],"published":[60],"literature;":[61],"4)":[63],"concluding":[64],"remarks.":[65]},"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}