{"id":"https://openalex.org/W2129545516","doi":"https://doi.org/10.1109/tcad.2011.2121010","title":"Characterization and Design of Logic Circuits in the Presence of Carbon Nanotube Density Variations","display_name":"Characterization and Design of Logic Circuits in the Presence of Carbon Nanotube Density Variations","publication_year":2011,"publication_date":"2011-07-21","ids":{"openalex":"https://openalex.org/W2129545516","doi":"https://doi.org/10.1109/tcad.2011.2121010","mag":"2129545516"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2011.2121010","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2011.2121010","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023023644","display_name":"Jie Zhang","orcid":"https://orcid.org/0000-0001-7821-4808"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jie Zhang","raw_affiliation_strings":["Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","[Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA]","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037285672","display_name":"Nishant Patil","orcid":"https://orcid.org/0000-0001-6620-0038"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nishant P. Patil","raw_affiliation_strings":["Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","[Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA]","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113534937","display_name":"Arash Hazeghi","orcid":null},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arash Hazeghi","raw_affiliation_strings":["Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","[Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA]","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059975258","display_name":"H.\u2010S. Philip Wong","orcid":"https://orcid.org/0000-0002-0096-1472"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H.-S. Philip Wong","raw_affiliation_strings":["Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","[Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA]","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036312663","display_name":"Subhasish Mitra","orcid":"https://orcid.org/0000-0002-5572-5194"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Subhasish Mitra","raw_affiliation_strings":["Department of Electrical Engineering and the Department of Computer Science, University of Stanford, Stanford, CA, USA","[Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and the Department of Computer Science, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"[Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA]","institution_ids":["https://openalex.org/I97018004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5023023644"],"corresponding_institution_ids":["https://openalex.org/I97018004"],"apc_list":null,"apc_paid":null,"fwci":2.181,"has_fulltext":false,"cited_by_count":49,"citation_normalized_percentile":{"value":0.88174106,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"30","issue":"8","first_page":"1103","last_page":"1113"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10074","display_name":"Carbon Nanotubes in Composites","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10074","display_name":"Carbon Nanotubes in Composites","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/carbon-nanotube","display_name":"Carbon nanotube","score":0.7501031160354614},{"id":"https://openalex.org/keywords/carbon-nanotube-field-effect-transistor","display_name":"Carbon nanotube field-effect transistor","score":0.6924171447753906},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6805567145347595},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5177085399627686},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.4886784851551056},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.465949147939682},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.46533316373825073},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.4570479691028595},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4305632710456848},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.42455923557281494},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.409807026386261},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.367387980222702},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.15273669362068176},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1371496617794037},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10232186317443848},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.06737881898880005}],"concepts":[{"id":"https://openalex.org/C513720949","wikidata":"https://www.wikidata.org/wiki/Q1778729","display_name":"Carbon nanotube","level":2,"score":0.7501031160354614},{"id":"https://openalex.org/C58916441","wikidata":"https://www.wikidata.org/wiki/Q1778563","display_name":"Carbon nanotube field-effect transistor","level":5,"score":0.6924171447753906},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6805567145347595},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5177085399627686},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.4886784851551056},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.465949147939682},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.46533316373825073},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.4570479691028595},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4305632710456848},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.42455923557281494},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.409807026386261},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.367387980222702},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.15273669362068176},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1371496617794037},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10232186317443848},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06737881898880005},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2011.2121010","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2011.2121010","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320307102","display_name":"Intel Corporation","ror":"https://ror.org/01ek73717"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":52,"referenced_works":["https://openalex.org/W72757994","https://openalex.org/W973491057","https://openalex.org/W1481991563","https://openalex.org/W1560640234","https://openalex.org/W1583862312","https://openalex.org/W1667165204","https://openalex.org/W1964189680","https://openalex.org/W1973628995","https://openalex.org/W1991561423","https://openalex.org/W2002453109","https://openalex.org/W2046245205","https://openalex.org/W2052197092","https://openalex.org/W2075966063","https://openalex.org/W2077758015","https://openalex.org/W2089427056","https://openalex.org/W2091844454","https://openalex.org/W2100890870","https://openalex.org/W2103491903","https://openalex.org/W2119092150","https://openalex.org/W2120176508","https://openalex.org/W2120657398","https://openalex.org/W2123128601","https://openalex.org/W2125263803","https://openalex.org/W2128753706","https://openalex.org/W2132729131","https://openalex.org/W2138085193","https://openalex.org/W2151017437","https://openalex.org/W2158118249","https://openalex.org/W2158955861","https://openalex.org/W2159055595","https://openalex.org/W2159568563","https://openalex.org/W2162476901","https://openalex.org/W2163874178","https://openalex.org/W2164362458","https://openalex.org/W2166294424","https://openalex.org/W2166378623","https://openalex.org/W2170655593","https://openalex.org/W2171141565","https://openalex.org/W2172161464","https://openalex.org/W2313745359","https://openalex.org/W2503109220","https://openalex.org/W4205548518","https://openalex.org/W4229725180","https://openalex.org/W4233559368","https://openalex.org/W4239355800","https://openalex.org/W4243164749","https://openalex.org/W4245518849","https://openalex.org/W4250553555","https://openalex.org/W4285719527","https://openalex.org/W4300750760","https://openalex.org/W4302853952","https://openalex.org/W6684228295"],"related_works":["https://openalex.org/W2570275273","https://openalex.org/W2510501537","https://openalex.org/W2321019643","https://openalex.org/W2317479535","https://openalex.org/W2144430137","https://openalex.org/W2143860948","https://openalex.org/W1579695216","https://openalex.org/W1976161475","https://openalex.org/W3124581103","https://openalex.org/W2072424359"],"abstract_inverted_index":{"Variations":[0],"in":[1,60,142],"the":[2,11,27,55,68,71,85,92,111,128,148],"spatial":[3],"density":[4,39,89,106],"of":[5,13,29,63,70,87,94,113,130,135,150,168],"carbon":[6,30],"nanotubes":[7],"(CNTs),":[8],"resulting":[9],"from":[10,77],"lack":[12],"precise":[14],"control":[15],"over":[16],"CNT":[17,38,56,78,88,105,131,136,143],"positioning":[18],"during":[19],"chemical":[20],"synthesis,":[21],"is":[22],"a":[23,50,61,118,151],"major":[24,119],"hurdle":[25],"to":[26,43],"scalability":[28],"nanotube":[31],"field":[32],"effect":[33],"transistor":[34],"(CNFET)":[35],"circuits.":[36,46,99,124],"Such":[37],"variations":[40,90,107],"can":[41,108,116,161],"lead":[42],"non-functional":[44],"CNFET":[45,62,95,123,152],"This":[47],"paper":[48],"presents":[49],"probabilistic":[51],"framework":[52],"for":[53,121],"modeling":[54],"count":[57,137],"distribution":[58],"contained":[59],"given":[64],"width,":[65],"and":[66,115,145],"establishes":[67],"accuracy":[69],"model":[72],"using":[73],"experimental":[74],"data":[75],"obtained":[76],"growth.":[79],"Using":[80],"this":[81],"model,":[82],"we":[83,126],"estimate":[84],"impact":[86,129],"on":[91],"yield":[93,112,149],"very":[96],"large-scale":[97],"integrated":[98],"Our":[100],"estimation":[101],"results":[102],"demonstrate":[103,146],"that":[104,140],"significantly":[109,163],"degrade":[110],"CNFETs,":[114],"be":[117,162],"concern":[120],"scaled":[122],"Finally,":[125],"analyze":[127],"correlation":[132,134],"(i.e.,":[133],"between":[138],"CNFETs)":[139],"exists":[141],"growth,":[144],"how":[147],"storage":[153],"circuit":[154],"(primarily":[155],"limited":[156],"by":[157,165],"its":[158],"noise":[159],"immunity)":[160],"improved":[164],"taking":[166],"advantage":[167],"such":[169],"correlation.":[170]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":5},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":7},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}