{"id":"https://openalex.org/W2107073052","doi":"https://doi.org/10.1109/tcad.2010.2062870","title":"Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis","display_name":"Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis","publication_year":2010,"publication_date":"2010-11-30","ids":{"openalex":"https://openalex.org/W2107073052","doi":"https://doi.org/10.1109/tcad.2010.2062870","mag":"2107073052"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2010.2062870","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2010.2062870","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023516811","display_name":"Elie Maricau","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Elie Maricau","raw_affiliation_strings":["Department of Electrical Engineering, Katholieke Universiteit Leuven, Leuven, Belgium","Dept. of Electr. Eng., Katholieke Univ. Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Katholieke Universiteit Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Katholieke Univ. Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029270525","display_name":"Georges Gielen","orcid":"https://orcid.org/0000-0002-4061-9428"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Georges Gielen","raw_affiliation_strings":["Department of Electrical Engineering, Katholieke Universiteit Leuven, Leuven, Belgium","Dept. of Electr. Eng., Katholieke Univ. Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Katholieke Universiteit Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Katholieke Univ. Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5023516811"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":4.3296,"has_fulltext":false,"cited_by_count":44,"citation_normalized_percentile":{"value":0.94593113,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"29","issue":"12","first_page":"1884","last_page":"1893"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.716905415058136},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.7121080160140991},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.6717368364334106},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.6111956834793091},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.57606041431427},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5578001141548157},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5428348779678345},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.5147033333778381},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.4604538083076477},{"id":"https://openalex.org/keywords/design-of-experiments","display_name":"Design of experiments","score":0.4595017433166504},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.454670786857605},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4416763186454773},{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.43990689516067505},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4243919551372528},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3585592210292816},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17999234795570374},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.16666656732559204},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15416187047958374},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.13381674885749817},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.11048427224159241},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10857582092285156},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.08935010433197021}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.716905415058136},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.7121080160140991},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.6717368364334106},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6111956834793091},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.57606041431427},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5578001141548157},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5428348779678345},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.5147033333778381},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.4604538083076477},{"id":"https://openalex.org/C34559072","wikidata":"https://www.wikidata.org/wiki/Q2334061","display_name":"Design of experiments","level":2,"score":0.4595017433166504},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.454670786857605},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4416763186454773},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.43990689516067505},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4243919551372528},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3585592210292816},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17999234795570374},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.16666656732559204},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15416187047958374},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.13381674885749817},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.11048427224159241},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10857582092285156},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.08935010433197021},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2010.2062870","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2010.2062870","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1562327279","https://openalex.org/W1583499813","https://openalex.org/W1743670555","https://openalex.org/W1967376387","https://openalex.org/W1968809267","https://openalex.org/W1986415905","https://openalex.org/W1990794787","https://openalex.org/W1991891926","https://openalex.org/W1993934821","https://openalex.org/W1999435495","https://openalex.org/W2005854913","https://openalex.org/W2020491095","https://openalex.org/W2024081693","https://openalex.org/W2036537371","https://openalex.org/W2062874667","https://openalex.org/W2076209003","https://openalex.org/W2077651858","https://openalex.org/W2092300218","https://openalex.org/W2102209270","https://openalex.org/W2105854936","https://openalex.org/W2109953360","https://openalex.org/W2114412205","https://openalex.org/W2114599766","https://openalex.org/W2115726748","https://openalex.org/W2122520074","https://openalex.org/W2130688260","https://openalex.org/W2145774126","https://openalex.org/W2152775237","https://openalex.org/W2167369830","https://openalex.org/W2548125287","https://openalex.org/W2566855134","https://openalex.org/W3140200199","https://openalex.org/W3152276207","https://openalex.org/W4230157952","https://openalex.org/W4232569293","https://openalex.org/W4253016408","https://openalex.org/W6634828574","https://openalex.org/W6677446150","https://openalex.org/W6729452756"],"related_works":["https://openalex.org/W1970920853","https://openalex.org/W2037727480","https://openalex.org/W2026623766","https://openalex.org/W2099679924","https://openalex.org/W2296682797","https://openalex.org/W2738622559","https://openalex.org/W2115165828","https://openalex.org/W1977755957","https://openalex.org/W2142908374","https://openalex.org/W2080536441"],"abstract_inverted_index":{"This":[0,59],"paper":[1],"discusses":[2],"an":[3],"efficient":[4],"method":[5,45,60,132],"to":[6,46,152,159],"analyze":[7,47],"the":[8,41,48,95],"spatial":[9],"and":[10,15,33,54,121,142,164],"temporal":[11],"reliability":[12,21,113],"of":[13,73,127,139,155],"analog":[14,141],"digital":[16,143],"circuits.":[17,144],"First,":[18],"a":[19,44,64,71,78,83,98,125,136],"SPICE-based":[20],"simulator":[22],"with":[23,82,150],"automatic":[24],"step-size":[25],"control":[26],"is":[27,57,61,104,108,133,148],"proposed.":[28],"Both":[29],"hot":[30],"carrier":[31],"degradation":[32],"negative":[34],"bias":[35],"temperature":[36],"instability":[37],"are":[38],"included":[39],"in":[40,77],"simulator.":[42],"Next,":[43],"interaction":[49],"between":[50],"process":[51],"variability":[52],"effects":[53],"circuit":[55,99,112,117,128],"aging":[56],"introduced.":[58],"based":[62,93],"on":[63,94],"screening":[65],"experimental":[66],"design":[67],"(DoE)":[68],"succeeded":[69],"by":[70],"set":[72],"regression":[74],"DoEs,":[75],"resulting":[76],"good":[79],"speed-accuracy":[80],"tradeoff":[81],"nearly":[84],"linear":[85],"complexity":[86],"for":[87,110],"all":[88],"circuits":[89],"under":[90],"test.":[91],"Finally,":[92],"DoE":[96],"analysis,":[97],"response":[100],"surface":[101],"model":[102],"(RSM)":[103],"derived.":[105],"The":[106,130],"RSM":[107],"used":[109],"further":[111],"analysis":[114],"such":[115],"as":[116,124],"weak":[118],"spot":[119],"detection":[120],"yield":[122],"calculation":[123],"function":[126],"lifetime.":[129],"proposed":[131],"validated":[134],"over":[135],"broad":[137],"range":[138],"both":[140],"Yield":[145],"simulation":[146,168],"time":[147],"reduced":[149],"up":[151],"three":[153],"orders":[154],"magnitude,":[156],"when":[157],"compared":[158],"standard":[160],"Monte":[161],"Carlo-based":[162],"techniques":[163],"while":[165],"still":[166],"maintaining":[167],"accuracy.":[169]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":6}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}