{"id":"https://openalex.org/W2102719254","doi":"https://doi.org/10.1109/tcad.2010.2048397","title":"Dose Map and Placement Co-Optimization for Improved Timing Yield and Leakage Power","display_name":"Dose Map and Placement Co-Optimization for Improved Timing Yield and Leakage Power","publication_year":2010,"publication_date":"2010-06-24","ids":{"openalex":"https://openalex.org/W2102719254","doi":"https://doi.org/10.1109/tcad.2010.2048397","mag":"2102719254"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2010.2048397","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2010.2048397","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014444815","display_name":"Kwangok Jeong","orcid":"https://orcid.org/0009-0002-6830-9154"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kwangok Jeong","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of California, San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073558386","display_name":"Andrew B. Kahng","orcid":"https://orcid.org/0000-0002-4490-5018"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew B. Kahng","raw_affiliation_strings":["Department of Computer Science and Engineering and the Department of Electrical and Computer Engineering, University of California, San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering and the Department of Electrical and Computer Engineering, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011537016","display_name":"Chul\u2010Hong Park","orcid":"https://orcid.org/0000-0002-0476-8450"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chul-Hong Park","raw_affiliation_strings":["Semiconductor Research and Development Center, Samsung Electronics Company Limited, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Semiconductor Research and Development Center, Samsung Electronics Company Limited, Seoul, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058812423","display_name":"Hailong Yao","orcid":"https://orcid.org/0000-0002-8750-3086"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN","US"],"is_corresponding":false,"raw_author_name":"Hailong Yao","raw_affiliation_strings":["Department of Computer Science and Engineering, University of California, San Diego, CA, USA","Department of Computer Science and Technology, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]},{"raw_affiliation_string":"Department of Computer Science and Technology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5014444815"],"corresponding_institution_ids":["https://openalex.org/I36258959"],"apc_list":null,"apc_paid":null,"fwci":0.2941,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.65375878,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"29","issue":"7","first_page":"1070","last_page":"1082"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.670048713684082},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.6061859130859375},{"id":"https://openalex.org/keywords/leakage-power","display_name":"Leakage power","score":0.5759809613227844},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5722337961196899},{"id":"https://openalex.org/keywords/power-optimization","display_name":"Power optimization","score":0.5701509118080139},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.5071578025817871},{"id":"https://openalex.org/keywords/quadratic-equation","display_name":"Quadratic equation","score":0.4862781763076782},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.48237958550453186},{"id":"https://openalex.org/keywords/heuristic","display_name":"Heuristic","score":0.4452199935913086},{"id":"https://openalex.org/keywords/quadratic-programming","display_name":"Quadratic programming","score":0.43184763193130493},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.43058502674102783},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4267970025539398},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3942822813987732},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.34383687376976013},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.25399670004844666},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2194114625453949},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.19795528054237366},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17479029297828674},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.14653414487838745},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.10989069938659668},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09328833222389221}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.670048713684082},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.6061859130859375},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.5759809613227844},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5722337961196899},{"id":"https://openalex.org/C168292644","wikidata":"https://www.wikidata.org/wiki/Q10860336","display_name":"Power optimization","level":4,"score":0.5701509118080139},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.5071578025817871},{"id":"https://openalex.org/C129844170","wikidata":"https://www.wikidata.org/wiki/Q41299","display_name":"Quadratic equation","level":2,"score":0.4862781763076782},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.48237958550453186},{"id":"https://openalex.org/C173801870","wikidata":"https://www.wikidata.org/wiki/Q201413","display_name":"Heuristic","level":2,"score":0.4452199935913086},{"id":"https://openalex.org/C81845259","wikidata":"https://www.wikidata.org/wiki/Q290117","display_name":"Quadratic programming","level":2,"score":0.43184763193130493},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.43058502674102783},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4267970025539398},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3942822813987732},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.34383687376976013},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.25399670004844666},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2194114625453949},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.19795528054237366},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17479029297828674},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.14653414487838745},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.10989069938659668},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09328833222389221},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcad.2010.2048397","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2010.2048397","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.295.2338","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.295.2338","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://vlsicad.ucsd.edu/Publications/Journals/j99.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7900000214576721,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1966109354","https://openalex.org/W1966631399","https://openalex.org/W1982187497","https://openalex.org/W2003217298","https://openalex.org/W2022917746","https://openalex.org/W2043733717","https://openalex.org/W2097335949","https://openalex.org/W2110170996","https://openalex.org/W2141907973","https://openalex.org/W2151987239","https://openalex.org/W2167566128","https://openalex.org/W3148906726","https://openalex.org/W4231119589","https://openalex.org/W4253623754","https://openalex.org/W4254274752","https://openalex.org/W6641795464","https://openalex.org/W6651183539"],"related_works":["https://openalex.org/W3036464408","https://openalex.org/W2020990755","https://openalex.org/W2377851227","https://openalex.org/W4293088966","https://openalex.org/W2900067469","https://openalex.org/W2130342263","https://openalex.org/W2366868484","https://openalex.org/W2968511773","https://openalex.org/W2917463375","https://openalex.org/W2155219672"],"abstract_inverted_index":{"In":[0,90],"sub-100nm":[1],"CMOS":[2],"processes,":[3],"delay":[4],"and":[5,39,48,53,62,78],"leakage":[6,49,63,134,139],"power":[7,64,135,140],"reduction":[8,141],"continue":[9],"to":[10,20,34],"be":[11],"among":[12],"the":[13,22,31,71,97,104],"most":[14],"critical":[15],"design":[16],"concerns.":[17],"We":[18,69],"propose":[19],"exploit":[21],"recent":[23],"availability":[24],"of":[25,45,65,144],"fine-grain":[26],"exposure":[27],"dose":[28,42,54,73,99,113],"control":[29],"in":[30,103,129,138],"step-and-scan":[32],"tool":[33],"achieve":[35],"both":[36,59],"design-time":[37],"(placement)":[38],"manufacturing-time":[40],"(yield-aware":[41],"mapping)":[43],"optimizations":[44],"timing":[46,60],"yield":[47,61],"power.":[50],"Our":[51],"placement":[52,115],"map":[55,74,100],"co-optimization":[56],"can":[57],"improve":[58],"a":[66,108],"given":[67],"design.":[68],"formulate":[70],"placement-aware":[72,98],"optimization":[75,101,116],"as":[76],"quadratic":[77,79,87],"constraint":[80],"programs":[81],"which":[82],"are":[83],"solved":[84],"using":[85],"efficient":[86,120],"program":[88],"solvers.":[89],"this":[91],"paper,":[92],"we":[93,106],"mainly":[94],"focus":[95],"on":[96,118],"problem;":[102],"Appendix,":[105],"describe":[107],"complementary":[109],"but":[110],"less":[111],"impactful":[112],"map-aware":[114],"based":[117],"an":[119],"cell":[121],"swapping":[122],"heuristic.":[123],"Experimental":[124],"results":[125],"show":[126],"noticeable":[127],"improvements":[128],"minimum":[130],"cycle":[131],"time":[132],"without":[133,142],"increase,":[136],"or":[137],"degradation":[143],"circuit":[145],"performance.":[146]},"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}