{"id":"https://openalex.org/W2098006234","doi":"https://doi.org/10.1109/tcad.2009.2028165","title":"ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults","display_name":"ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults","publication_year":2009,"publication_date":"2009-08-24","ids":{"openalex":"https://openalex.org/W2098006234","doi":"https://doi.org/10.1109/tcad.2009.2028165","mag":"2098006234"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2009.2028165","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2009.2028165","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102227100","display_name":"Sunghoon Chun","orcid":null},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sunghoon Chun","raw_affiliation_strings":["Department of Computer Science and Engineering, University of California, San Diego, CA, USA","Dept. of Comput. Sci. & Eng., Univ. of California at San Diego, La Jolla, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]},{"raw_affiliation_string":"Dept. of Comput. Sci. & Eng., Univ. of California at San Diego, La Jolla, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100671802","display_name":"Taejin Kim","orcid":"https://orcid.org/0000-0002-7754-2612"},"institutions":[{"id":"https://openalex.org/I206093572","display_name":"Nexen (Canada)","ror":"https://ror.org/04zwxgg32","country_code":"CA","type":"company","lineage":["https://openalex.org/I206093572"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Taejin Kim","raw_affiliation_strings":["Avionics Research and Development Laboratory, LIG Next Company Limited, Daejeon, South Korea","Avionics R&D Laboratory, LIG Nex1 Company, Ltd., Daejeon, Korea#TAB#"],"affiliations":[{"raw_affiliation_string":"Avionics Research and Development Laboratory, LIG Next Company Limited, Daejeon, South Korea","institution_ids":["https://openalex.org/I206093572"]},{"raw_affiliation_string":"Avionics R&D Laboratory, LIG Nex1 Company, Ltd., Daejeon, Korea#TAB#","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108221946","display_name":"Sungho Kang","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","Department of Electrical and Electronic Engineering , Yonsei University , Seoul , Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"Department of Electrical and Electronic Engineering , Yonsei University , Seoul , Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5102227100"],"corresponding_institution_ids":["https://openalex.org/I36258959"],"apc_list":null,"apc_paid":null,"fwci":2.3744,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.89116922,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"28","issue":"9","first_page":"1401","last_page":"1413"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.9168006181716919},{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.7994563579559326},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5895012617111206},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44612449407577515},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3291512131690979},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3237796425819397},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24824312329292297},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.15907979011535645},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09687107801437378}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.9168006181716919},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.7994563579559326},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5895012617111206},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44612449407577515},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3291512131690979},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3237796425819397},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24824312329292297},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.15907979011535645},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09687107801437378}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2009.2028165","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2009.2028165","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.7699999809265137}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W13277579","https://openalex.org/W1482683468","https://openalex.org/W1552534217","https://openalex.org/W1930731203","https://openalex.org/W2056608420","https://openalex.org/W2067495577","https://openalex.org/W2098706146","https://openalex.org/W2099405302","https://openalex.org/W2100089563","https://openalex.org/W2100783269","https://openalex.org/W2102075362","https://openalex.org/W2104564222","https://openalex.org/W2128627202","https://openalex.org/W2133465946","https://openalex.org/W2141450494","https://openalex.org/W2144573344","https://openalex.org/W2146162236","https://openalex.org/W2149107969","https://openalex.org/W2155850829","https://openalex.org/W2160010735","https://openalex.org/W2164152101","https://openalex.org/W2168071696","https://openalex.org/W2293537069","https://openalex.org/W6600530048","https://openalex.org/W6640360771","https://openalex.org/W6680098104","https://openalex.org/W6681579873"],"related_works":["https://openalex.org/W2051487156","https://openalex.org/W2131559056","https://openalex.org/W4254560580","https://openalex.org/W2163047760","https://openalex.org/W2136503711","https://openalex.org/W2955439067","https://openalex.org/W2102054439","https://openalex.org/W4239505785","https://openalex.org/W1519923721","https://openalex.org/W2542800311"],"abstract_inverted_index":{"In":[0,89],"this":[1],"paper,":[2],"we":[3],"propose":[4],"a":[5,18],"new":[6],"test-generation":[7],"method":[8],"for":[9,52,79,99],"delay":[10,14,20,54,102,114],"faults":[11,39,55],"considering":[12],"crosstalk-induced":[13,53],"effects,":[15],"based":[16],"on":[17],"conventional":[19],"automatic-test-pattern-generation":[21],"(ATPG)":[22],"technique":[23,94],"in":[24],"order":[25],"to":[26,35,40,86],"reduce":[27,63],"the":[28,42,45,49,64,68,72,81,92,96,100,105,119,122],"complexity":[29],"of":[30,44,67,71,113,121],"previous":[31,87],"ATPG":[32,51,82],"algorithms":[33],"and":[34,58,75],"consider":[36],"multiple-aggressor":[37],"crosstalk":[38],"maximize":[41],"noise":[43],"victim":[46,106],"line.":[47],"Since":[48],"proposed":[50,93,123],"uses":[56],"physical":[57],"timing":[59],"information,":[60],"it":[61,76,108],"can":[62,109],"search":[65],"space":[66],"backward":[69],"implication":[70],"aggressor's":[73],"constraints,":[74],"is":[77],"helpful":[78],"reducing":[80],"time":[83],"cost":[84],"compared":[85],"works.":[88],"addition,":[90],"since":[91],"targets":[95],"critical":[97],"path":[98],"original":[101],"test":[103,111],"as":[104],"lines,":[107],"improve":[110],"effectiveness":[112,120],"testing.":[115],"Experimental":[116],"results":[117],"demonstrate":[118],"method.":[124]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}